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The use of electronic probe instrument

The use of electronic probe instrument, Total:47 items.

In the international standard classification, The use of electronic probe instrument involves: Optics and optical measurements, Analytical chemistry, Thermodynamics and temperature measurements, Radiation measurements, Medical equipment, Domestic safety, Domestic electrical appliances in general, Ceramics, Semiconducting materials.


General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, The use of electronic probe instrument

British Standards Institution (BSI), The use of electronic probe instrument

  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
  • BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
  • BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
  • BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
  • BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
  • BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations — Test 16a: Probe damage
  • BS EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of chemical composition by electron probe microanalysis (EPMA)
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Korean Agency for Technology and Standards (KATS), The use of electronic probe instrument

  • KS C 1611-1982(2017) Electronic Self-Balancing Recorders for Industrial Use
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

International Organization for Standardization (ISO), The use of electronic probe instrument

  • ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
  • ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
  • ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
  • ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

German Institute for Standardization, The use of electronic probe instrument

  • DIN 6800-1:2016-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
  • DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
  • DIN 6800-5:2005 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 5: Thermoluminescence dosimetry
  • DIN ISO 16592:2015 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)

Association Francaise de Normalisation, The use of electronic probe instrument

  • NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
  • NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
  • NF C74-204/A1:2006 Medical electrical equipment - Dosimeters with ionization chambers and/or semi-conductor detectors as used in X-ray diagnostic imaging
  • NF C93-400-16-1*NF EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1 : mechanical tests on contacts and terminations - Test 16a : probe damage

KR-KS, The use of electronic probe instrument

  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

SE-SIS, The use of electronic probe instrument

  • SIS SS 441 01 65-1989 Safety requirements for mains operated electronic and related apparatus for household and similar general use

American Society for Testing and Materials (ASTM), The use of electronic probe instrument

  • ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe

Japanese Industrial Standards Committee (JISC), The use of electronic probe instrument

  • JIS C 9335-2-209:2007 Safety of household and similar electrical appliances -- Part 2-209: Particular requirements for electric therapy apparatus for home use
  • JIS C 9335-2-209:2009 Safety of household and similar electrical appliances -- Part 2-209: Particular requirements for electric therapy apparatus for home use
  • JIS C 9335-2-209:2004 Safety of household and similar electrical appliances -- Part 2-209: Particular requirements for electric therapy apparatus for home use
  • JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
  • JIS C 9335-2-209 AMD 1:2006 Safety of household and similar electrical appliances -- Part 2-209: Particular requirements for electric therapy apparatus for home use (Amendment 1)

US-FCR, The use of electronic probe instrument

  • FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)

PT-IPQ, The use of electronic probe instrument

  The use of thermal dilatometer, Electron Probe Sample Preparation, Sample Preparation Method for Electron Probe Instrument, Sample Preparation for Electron Probe Instruments, The use of ultraviolet crosslinker, What is the main purpose of the monoclonal screener?, The use of density meter, The use of extensometer, The purpose of the grinder, The main purpose of electronic probe electronic probe, Uses of Radon Meters, The use of ultraviolet radiation instrument, The use of particle size analyzer, The use of electronic probes, The main purpose of the thermal dilatometer, The use of potentiometer, The use of true density meter, The main purpose of the density meter, The main purpose of the quality meter, The use of electronic probe instrument.

 



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