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UV semiconductor

UV semiconductor, Total:500 items.

In the international standard classification, UV semiconductor involves: Optics and optical measurements, Optoelectronics. Laser equipment, Analytical chemistry, Integrated circuits. Microelectronics, Ceramics, Semiconductor devices, Aerospace electric equipment and systems, Semiconducting materials, Medical equipment, Inorganic chemicals, Radiation protection, Fibre optic communications, Mechanical structures for electronic equipment, Rectifiers. Convertors. Stabilized power supply, Products of the chemical industry, Applications of information technology, Technical drawings, Electronic components in general, Seals, glands, Farming and forestry, Graphical symbols, Printed circuits and boards, Vocabularies, Environmental testing, Veterinary medicine, Electrical wires and cables, Industrial automation systems, Physics. Chemistry, Radiation measurements, Electromechanical components for electronic and telecommunications equipment, Fuels.

Association Francaise de Normalisation, UV semiconductor

NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
NF C96-045:1992 Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits
NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
NF S11-698:1998 Ophthalmic optics. Contact lenses. Ageing by exposure to UV and visible radiation (in vitro method).
NF C96-005-5*NF EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5 : optoelectronic devices - Photocouplers
NF EN IEC 60747-5-5:2020 Dispositifs à semiconducteurs - Partie 5-5 : dispositifs optoélectroniques - Photocoupleurs
NF C96-013-4/A2*NF EN 60191-4/A2:2003 Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages.
NF C96-013-4*NF EN 60191-4:2014 Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
NF EN 60191-6:2011 Normalisation mécanique des dispositifs à semiconducteurs - Partie 6 : règles générales pour la préparation des dessins d'encombrement des boîtiers pour dispositifs à semiconducteurs pour montage en surface
NF C93-801-2*NF EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 : measuring methods
NF C96-013-4*NF EN 60191-4:2000 Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages.
NF C96-013-4/A1*NF EN 60191-4/A1:2002 Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages.
NF C96-013-6*NF EN 60191-6:2011 Mechanical standardization of semiconductor devices - Part 6 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages
NF C96-013-4/A1*NF EN 60191-4/A1:2018 Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
NF EN 17178:2019 Produits pétroliers liquides - Détermination de la teneur en soufre volatil dans les gaz de pétrole liquéfiés par spectroscopie de fluorescence ultra-violette
NF C96-005-5/A1*NF EN 60747-5-5/A1:2015 Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers
NF C96-005-5*NF EN 60747-5-5:2012 Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers
NF EN 62007-2:2009 Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 2 : méthodes de mesure
XP CEN/TS 16599:2014 Photocatalyse - Détermination des conditions d'irradiation pour tester les propriétés photocatalytiques de matériaux semi-conducteurs

国家市场监督管理总局、中国国家标准化管理委员会, UV semiconductor

GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits
GB/T 15879.4-2019 Mechanical standardization of semiconductor devices—Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
GB/T 36358-2018 Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
GB/T 39771.2-2021 Optical radiation safety of LEDs—Part 2: Measurement methods
GB/T 21548-2021 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
GB/T 36646-2018 Equipment for preparation of nitride semiconductor materials by hydride vapor phase epitaxy

Professional Standard - Electron, UV semiconductor

SJ/T 11818.1-2022 Semiconductor UV-emitting diodes Part 1: Test methods
SJ/T 11818.2-2022 Semiconductor UV Emitting Diodes Part 2: Chip Specifications
SJ/T 11818.3-2022 Semiconductor UV-emitting diodes Part 3: Device Specifications
SJ 2684-1986 Physical Demensions For Light Emitting Device Of Semiconductor
SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
SJ 2750-1987 Outline dimensions for semiconductor laser diodes
SJ 2658.1-1986 Methods of measurement for semiconductor infrared diodes General rules
SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
SJ 50033/109-1996 Semiconductor optoelectronic devices.Detail specification for types GJ9031T and GJ9032T and GJ9034T semiconductor laser diodes
SJ/T 11397-2009 Phosphors for light emitting diodes
SJ 20642-1997 Semiconductor opto-electronic module General specification for
SJ 20786-2000 General specification for semiconductor opto-electronic assembly
SJ 2218-1982 Semiconductor photocouplers in the diode mode
SJ 2219-1982 Semiconductor photocouplers in the transistor mode
SJ 2658.6-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power
SJ 20072-1992 Detail specification for semiconductor opto-couplers for type GH24,GH25 and GH26
SJ 50033/110-1996 Semiconductor optoelectronic devices.Detail specification for type GR9413 infrared light emitting diode
SJ 53930/1-2002 Semiconductor optoelectronic devices Detail specification for type GR8813 infrared emitting diode
SJ 2658.4-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for capacitance
SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
SJ 2220-1982 Semiconductor photocouplers in the Darlington transistor mode
SJ 2558-1984 Detail specification for semiconductor light emitting numeric displays,Type SM1~18
SJ 2658.2-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for forward voltage drop
SJ 2658.3-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage
SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
SJ 2749-1987 Method of measurement for semiconductor laser diodes
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes
SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
SJ 2658.7-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for radiant flux
SJ 2658.10-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for modulated wideband
SJ/T 11856.3-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 3: Electric Absorption Modulated Semiconductor Laser Chips for Light Sources
SJ 2355.1-1983 General procedures of measurement for light-emitting deivces
SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
SJ/T 11856.2-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 2: Vertical Cavity Surface Emitting Semiconductor Laser Chips for Light Sources
SJ 2658.13-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power temperature coefficient
SJ/T 2658.16-2016 Measuring method for semiconductor infrared-emitting diode.Part 16: Photo-electric conversion efficiency
SJ 50923/2-1995 Detail specification for type G2-01B-M1,G2-01B-Z1 metal case for semiconductor photosensitive devices
SJ 2658.8-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance
SJ 50033.40-1994 Detail specification for type GT11 semiconductor sililcon NPN photo-transistor
SJ 50033/4-1994 Semiconductor discrete device.Detail specification for semiconductor red light emitting diodes for type GF 111 of GP and GT classes
SJ 50033/6-1994 Semiconductor discrete device.Detail specification for semiconductor light green emitting diodes for type GF 411 of GP and GT classes
SJ 50033/5-1994 Semiconductor discrete device.Detail specification for semiconductor yellow light emitting diodes for type GF 311 of GP and GT classes
SJ 50033/3-1994 Semiconductor discrete device.Detail specification for semiconductor opto-couplers for type GH21,GH22 and GH23 of GP,GT and GCT classes
SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors
SJ 20642.5-1998 Semiconductor optoelectronic module Detail specification for type GH82 opto-couplers
SJ 20642.4-1998 Semiconductor optoelectronic module Detail specification for type GH81 opto-couplers
SJ 20642.6-1998 Semiconductor opto-electronic module Detail specification for type GH83 opto-couplers
SJ/T 11402-2009 Technical specification of semiconductor laser chip used in optical fiber communication
SJ 2658.5-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for forward series resistance
SJ 2658.11-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for pulse response characteristics
SJ 50923/1-1995 Detail specification for types A6-02A-M2（Z2）and A6-01B-M1（Z1）metal case for semiconductor photocouplers
SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
SJ/T 11401-2009 Series program for semiconductor light emitting diodes
SJ 50033/111-1996 Semiconductor optoelectronic devices.Delail specification for type GT16 Si.NPN phototransistor
SJ 50033/41-1994 Detail specification for type GR9414 semiconductor infrared light eitting diode
SJ 2658.9-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for the intensity space distribution and half-intensity angle of radiation
SJ/T 11067-1996 Commonly used terminology for semiconductor photoelectric materials and pyroelectric materials in infrared detecting materials
SJ 2355.5-1983 Method of measurement for luminous intensity and half-intensity angle of light-emitting devices
SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
SJ 50033/101-1995 Detail specification for semiconductor laser diode modules for type GJ1325
SJ 50033/35-1994 Detail specification for type GH30 semiconductor high speed optocoupler
SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices
SJ/Z 9021.4-1987 Mechanical standardization of semiconductor components Part 4 Classification and coding system for package outlines of semiconductor components
SJ/T 10308-1992 Detail specification of ceramic flat package for semiconductor integrated circuits
SJ/T 10176-1991 Detail specification of metal rhomb package for semiconductor integrated circuits
SJ/T 11856.1-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 1: Fabry-Perot Type and Distributed Feedback Type Semiconductor Laser Chips for Light Sources
SJ 50033/112-1996 Scmiconductor optoelectronic devices.Detail specification for type GD3251Y photodiodes
SJ 2355.6-1983 Method of measurement for luminous flux of light-emitting devices
SJ 50033/113-1996 Semiconductor optoelectronic devices.Detail specification for type GD3252Y photodiodes
SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes
SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes
SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors
SJ/T 11398-2009 Technical specification for power light-emitting diode chips
SJ 20642.3-1998 Semiconductor opto-electronic module Detail specification for type GD83 PIN-FET opto-receiver module
SJ 20644.1-2001 Semiconductor optoelectronic devices Detail specification for type GD3550Y PIN photodiode
SJ 20644.2-2001 Semiconductor optoelectronic devices Detail specification for type GD101 PIN photodiode
SJ 20642.2-1998 Semiconductor opto-electronic module Detail specification for type GD82 PIN-FET opto-receiver module
SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes
SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors
SJ 20957-2006 General specification for large power semiconductor laser diode array
SJ 20786.1-2002 Semiconductor photoelectric assembly Detail specification for miniature duplex photoelectric localizer for type CBGS 2301
SJ 50033/136-1997 Semiconductor optoelectronic devices.Detail specification for red light emitting diode for type GF116
SJ 50033/143-1999 Semiconductor optoelectronic devices.Detail specification for type GF1120 red emitting diode
SJ 50033/137-1997 Semiconductor optoelectronic devices.Detail specification for orange-red light emitting diode for type GF216
SJ 20642.1-1998 Semiconductor opto-electronic module Detail specification for type GD81 PIN-FET opto-receiver module
SJ/T 11405-2009 Semiconductor optoelectronic devices for fibre optic system applications.Part 2:Measuring methods
SJ 50033/139-1998 Semiconductor optoelectronic devices.Detail specification for green light-emitting diode for type GF4111
SJ 50033/138-1998 Semiconductor optoelectronic devices.Detail specification for yellow light-emitting diode for type GF318
SJ 50033/58-1995 Semiconductor optoelectronic device Detail specification for green light emitting diode for type GF413
SJ/T 11393-2009 Semiconductor optoelectronic devices-Blank detail specification for power light-emitting diodes
SJ 50033/142-1999 Semiconductor optoelectronic devices.Detail specification for type GF4112 green emitting diode
SJ 50033/57-1995 Semiconductor optoelectronic device Detail specification for red light emitting diode for type GF115
SJ/T 10307-1992 Detail specification of frit-seal ceramic flat package for semiconductor integrated circuits
SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
SJ 51420/1-1996 Detail specification of type D ceramic DIP for semiconductor integrated circuits
SJ 51420/2-1998 Detail specification of Type F ceramic FP for semiconductor integrated circuits
SJ 51420/3-2003 Detail specification of ceramic PGA for semiconductor integrated circuits
SJ/T 11866-2022 Semiconductor optoelectronic devices - Detailed specifications for silicon substrate white light power light emitting diodes
SJ/T 11400-2009 Semiconductor optoeletronic devices-Blank detail specification for lower-power light-emitting diodes
SJ 2215.6-1982 Method of measurement for junction capacitance of semiconductor photocouplers (diodes)
SJ 2215.8-1982 Method of measurement for output saturation voltage of semiconductor photocouplers (diodes)
SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode.Part 1: General
SJ 20074-1992 Detailed specifications for Jμ8305 programmable peripheral equipment interface of semiconductor integrated circuit
SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode.Part 12: Peak-emission wavelength and spectral radiant bandwidth
SJ 50033/99-1995 Semiconductor optoelectronic devices.Detail specification for o/G double colour light emitting diode for type GF511
SJ 20642.7-2000 Semiconductor opto-electronic devices Detail specification for type GR1325J light emitting diode module
SJ/T 11817-2022 Blank detailed specification for light-emitting diodes for semiconductor optoelectronic devices, filament lamps
SJ 2215.14-1982 Method of measurement for input-to-output isolation voltage of semiconductor photocouplers
SJ 2215.3-1982 Method of measurement for forward current of semiconductor photocouplers (diodes)
SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes
SJ 2215.4-1982 Method of measurement for reverse current of semiconductor photocouplers (diodes)
SJ 2215.10-1982 Method of measurement for direct current transfer ratio of semiconductor photocouplers
SJ 2215.12-1982 Method of measurement for input-to-output capacitance of semiconductor photocouplers
SJ 50033/114-1996 Semiconductor optoelectronic devices.Detail specification for type GD3283Y position sensitive detector

Korean Agency for Technology and Standards (KATS), UV semiconductor

KS D 2717-2008(2018) Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS－NIR absorption spectroscopy
KS C 6942-1999 General rule of laser diode modules for fiber optic transmission
KS C 6943-1999 Test methods of laser modules for fiber optic transmission
KS C IEC 60748-11:2004 Semiconductor devices－Integrated circuits－Part 11：Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-2-9:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 9：Blank detail specification for MOS ultraviolet light erasable electrically programmable read－only memories
KS C IEC 60748-2-9-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 9：Blank detail specification for MOS ultraviolet light erasable electrically programmable read－only memories
KS C IEC 60748-2-9-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 9：Blank detail specification for MOS ultraviolet light erasable electrically programmable read－only memories
KS C IEC 62007-2:2003 Semiconductor optoelectronic devices for fibre optic system applications － Part 2：Measuring methods
KS C IEC 60748-11-1:2004 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60747-5:2020 Semiconductor devices — Discrete devices —Part 5: Optoelectronic devices
KS C IEC PAS 62240-2008(2018) Use of semiconductor devices outside manufacturers specified temperature range
KS C IEC 62007-2-2003(2018)

KR-KS, UV semiconductor

KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
KS C IEC 60747-5-2020 Semiconductor devices — Discrete devices —Part 5: Optoelectronic devices

British Standards Institution (BSI), UV semiconductor

BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
BS IEC 60747-14-11:2021 Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
19/30390371 DC BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
18/30362458 DC BS IEC 60747-14-11. Semiconductor devices. Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS EN 62007-2:2000 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
BS EN ISO 11985:1998 Ophthalmic optics - Contact lenses - Ageing by exposure to UV and visible radiation (in vitro method)
BS EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
PD IEC TR 61292-9:2023 Tracked Changes. Optical amplifiers. Semiconductor optical amplifiers (SOAs)
BS EN 60191-4:2014 Mechanical standardization of semiconductor devices. Coding system and classification into forms of package outlines for semiconductor device packages
BS EN 60191-4:2014+A1:2018 Mechanical standardization of semiconductor devices - Coding system and classification into forms of package outlines for semiconductor device packages
BS ISO 17915:2018 Optics and photonics. Measurement method of semiconductor lasers for sensing
BS EN 60747-5-5:2011 Semiconductor devices. Discrete devices. Optoelectronic devices. Photocouplers
BS EN 60191-6:2010 Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages
BS EN 60191-6:2005 Mechanical standardization of semiconductor devices - General rules for the preparation of outline drawings of surface mounted semiconductor device packages
BS EN 60191-6:2004 Mechanical standardization of semiconductor devices-Part 6:General rules for the preparation of outline drawings of surface mounted semiconductor device packages
BS EN 60191-6:2009 Mechanical standardization of semiconductor devices - General rules for the preparation of outline drawings of surface mounted semiconductor device packages
BS EN 62007-1:2000 Semiconductor optoelectronic devices for fibre optic system applications - Essential ratings and characteristics
BS QC 790106:1995 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only...
BS IEC 60747-18-4:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
BS EN 60191-6-18:2010 Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for ball grid array (BGA)
BS IEC 60747-18-2:2020 Semiconductor devices. Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
BS IEC 60747-18-5:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61207-7:2013 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 60191-6-21:2010 Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Measuring methods for package dimensions of small outline packages (SOP)
PD IEC TR 60747-5-12:2021 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
BS PD ISO/TS 17466:2015 Use of UV-Vis absorption spectroscopy in the characterization of cadmium chalcogenide colloidal quantum dots
PD ISO/TS 17466:2015 Use of UV-Vis absorption spectroscopy in the characterization of cadmium chalcogenide colloidal quantum dots
BS EN 60191-6-10:2003 Mechanical standardization of semiconductor devices - Part 6-10:General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
BS IEC 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General
BS EN 14255-4:2006 Measurement and assessment of personal exposures to incoherent optical radiation - Terminology and quantities used in UV-, visible and IR-exposure measurements
PD IEC/PAS 62240:2001 Use of semiconductor devices outside manufacturer's specified temperature ranges
BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods - External visual examination
BS IEC 63229:2021 Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
BS IEC 60747-18-3:2019 Semiconductor devices. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
BS IEC 60747-18-1:2019 Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
BS IEC 63068-3:2020 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Test method for defects using photoluminescence
BS EN 17178:2019 Liquid petroleum products. Determination of the total volatile sulfur content in liquefied petroleum gases by ultraviolet fluorescence spectroscopy

Military Standard of the People's Republic of China-General Armament Department, UV semiconductor

GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
GJB 8190-2015 General specification for semiconductor solid-state light sources for aircraft exterior lighting
GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
GJB 1420A-1999 General Specification for Semiconductor Integrated Circuit Enclosures
GJB 8121-2013 General specification for semiconductor optoelectronic assembly
GJB 8120-2013 General specification for semiconductor optoelectronic module
GJB 3519-1999 General Specification for Semiconductor Laser Diodes
GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
GJB 923A-2004 General specification for packages of semiconductor discrete devices
GJB 923B-2021 General Specification for Semiconductor Discrete Device Enclosures
GJB 8119-2013 General specification for semiconductor optoelectronic device
GJB 2146A-2011 General specification for semiconductor light-emitting diode devices
GJB 1934-1994 General specification for semi-rigid coaxial radio frequency cables with wrinkled outer conductors
GJB 1557A-2021 Semiconductor discrete device microwave diode dimensions
GJB 1557-1992 Semiconductor discrete device microwave diode dimensions
GJB 1934A-2009 Cables,raido frequency,coaxial,semirigid,corrugated outer conductor,general specification for
GJB 1420/1-2000 Detailed specification for ceramic dual-row enclosures for semiconductor integrated circuits
GJB 33/20-2011 Semiconductor optoelectronic device.Detail specification for type GH302 photocoupler
GJB 33/22-2011 Semiconductor optoelectronic device.Detail specification for type GO103 photocoupler
GJB 1420B-2011(XG1-2015) Modification sheet of general specifications for semiconductor integrated circuit enclosures 1-2015
GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
GJB 33/23-2011 Semiconductor optoelectronic device.Detail specification for type GH3201Z-4 photocoupler
GJB 33/19-2011 Semiconductor optoelectronic device.Detail specification for type GH302-4 photocoupler
GJB 5018-2001 General requirements for screening and acceptance of semiconductor optoelectronic devices

Society of Automotive Engineers (SAE), UV semiconductor

SAE AIR5468-2000 Ultraviolet (UV) Lasers for Aerospace Wire Marking

International Electrotechnical Commission (IEC), UV semiconductor

IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-14-11:2021 Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
IEC TR 61292-9:2013 Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs)
IEC TR 61292-9:2023 RLV Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs)
IEC TR 61292-9:2023 Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs)
IEC 60191-4:2013+AMD1:2018 CSV Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60191-4:2002 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60191-4:1987 Mechanical standardization of semiconductor devices. Part 4 : Coding system and classification into forms of package outlines for semiconductor devices
IEC 62007-2:1997 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60747-5-6:2021 RLV Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 60191-4:1999 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60191-4:2013 Mechanical Standardization of Semiconductor Devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60191-4:2018 Mechanical Standardization of Semiconductor Devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60191-6:1990 Mechanical standardization of semiconductor devices; part 6: general rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60191-6:2004 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC PAS 62240:2001 Use of semiconductor devices outside manufacturer's specified temperature ranges
IEC 60191-4/AMD1:2001 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages; Amendment 1
IEC 60191-4/AMD2:2002 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages; Amendment 2
IEC 62007-2:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60747-18-2:2020 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
IEC 60191-6/AMD1:1999 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Amendment 1
IEC 60191-4:2013/AMD1:2018 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages; Amendment 1
IEC 60747-5-5:2007/AMD1:2013 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 60747-5-5:2013 Semiconductor devices.Discrete devices.Part 5-5: Optoelectronic devices.Photocouplers

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, UV semiconductor

GB/T 15167-1994 General specification for light source of semiconductor lasers
GB/T 31358-2015 General specification for semiconductor lasers
GB/T 29856-2013 Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
GB/T 7092-1993 Qutline dimensions of semiconductor integrated circuits
GB/T 7581-1987 Dimensions of outlines for semiconductor discrete devices
GB/T 31359-2015 Test methods of semiconductor lasers
GB/T 17574.9-2006 Semiconductor devices.Integrated circuits.Part 2-9:Digital integrated circuits.Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories
GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
GB/T 11417.9-2012 Ophthalmic optics.Contact lenses.Part 9:Ageing by exposure to UV and visible radiation(in vitro method)
GB/T 11493-1989 Blank detail specification of packages for semiconductor integrated circuits
GB/T 15529-1995 Blank detail specification for LED numeric displays
GB/T 15649-1995 Blank detail specification for semiconductor laser diodes
GB/T 29299-2012 General specification of semiconductor laser rangefinder
GB/T 36356-2018 Technical specification for power light-emitting diode chips
GB/T 15878-2015 Semiconductor integrated circuits.Specification of leadframes for small outline package
GB/T 15651.6-2023 Semiconductor Devices Part 5-6: Optoelectronic Devices Light Emitting Diodes
GB/T 36357-2018 Technical specification for middle power light-emitting diode chips
GB/T 21548-2008 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
GB/T 14862-1993 Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits
GB/T 24370-2009 Characterization of CdSe quantum dot nanocrystals.UV-Vis absorption spectroscopy
GB/T 36359-2018 Semiconductor optoelectronic devices.Blank detail specification for lower power light-emitting diodes
GB/T 36360-2018 Semiconductor optoelectronic devices.Blank detail specification for middle power light-emitting diodes
GB/T 12565-1990 Semiconductor devices--Sectional specification for optoelectronic devices

Group Standards of the People's Republic of China, UV semiconductor

T/CASME 698-2023 Semiconductor laser therapy apparatus
T/JGXH 008-2020 Diode pump solid state laser
T/QGCML 2041-2023
T/QGCML 1407-2023 Double sleeve sealing device for semiconductor photovoltaic manufacturing
T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment
T/NAIA 0193-2023 Determination of Concentration and Purity of Single-chain Antibody Eukaryotic Expression Plasmid DNA by UV Spectrophotometry

Jilin Provincial Standard of the People's Republic of China, UV semiconductor

DB22/T 2725-2017 980 nm fiber grating semiconductor laser

RU-GOST R, UV semiconductor

GOST 24458-1980 Semiconductor optoelectronic couplers. Essential parameters
GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
GOST 23900-1987 Power semiconductor devices. Overall and mounting dimensions
GOST 23448-1979 Semiconductor infra-red emitting diodes. Basic dimensions
GOST 27591-1988 Power semiconductor modules. Orerall and mounting dimensions
GOST 19834.4-1979 Semiconductor radiating infra-red diodes. Methods of measurement of radiation power
GOST 27299-1987 Semiconductor optoelectronic devices. Terms, definitions and letter symbols of parameters
GOST R 59605-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Terms and definitions
GOST 17704-1972 Semiconductor devices. Photoelectric receivers of radiant energy. Classification and system designations
GOST 21934-1983 Semiconducting photoelectric detectors and receiving photoelectric devices. Terms and definitions

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, UV semiconductor

GB/T 15651.4-2017 Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers

Professional Standard - Nuclear Industry, UV semiconductor

EJ/T 296.2-2014 Determination of trace uranium in urine liquid fluorometry by ultraviolet
EJ/T 20057-2014 Determination of uranium concentration in atmospheric fallout.Liquid fluorometry by ultraviolet

International Organization for Standardization (ISO), UV semiconductor

ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
ISO/TS 17915:2013 Optics and photonics.Measurement method of semiconductor lasers for sensing
ISO 17915:2018 Optics and photonics - Measurement method of semiconductor lasers for sensing
ISO/TS 17466:2015 Use of UV-Vis absorption spectroscopy in the characterization of cadmium chalcogenide colloidal quantum dots

机械工业部, UV semiconductor

JB/T 6306-1992 Power semiconductor module dimensions

Fujian Provincial Standard of the People's Republic of China, UV semiconductor

DB35/T 1193-2011 Semiconductor LED chip

Defense Logistics Agency, UV semiconductor

DLA SMD-5962-88635 REV A-1993 MICROCIRCUIT, DIGITAL, CMOS UV ERASABLE, PROGRAMMABLE LOGIC DEVICE
DLA MIL-PRF-19500/210 B NOTICE 1-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, PHOTO TYPE 2N986
DLA SMD-5962-94510 REV A-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88549 REV A-1992 MICROCIRCUIT, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-93144 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE, LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-90989 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-91772-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-93248-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88548 REV A-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-88678 REV B-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88724 REV D-2007 MICROCIRCUIT, DIGITAL, MEMORY, CMOS UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88726 REV E-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ULTRAVIOLET ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-85102 REV E-2005 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 8K X 8 UV ERASABLE PROM, MONOLITHIC SILICON
DLA SMD-5962-91584-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-92062 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-89468 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-89469 REV B-1994 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-89476-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-93245-1993 MICROCIRCUITS, DIGITAL, MEMORY, CMOS, EXTENDED VOLTAGE, UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-89817 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 32K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-90658 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 8 UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-86063 REV H-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
DLA MIL-PRF-19500/467 A-2008 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, TYPE 1N5765 JAN AND TX
DLA SMD-5962-87648 REV E-2006 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 64K X 8 UVEPROM, MONOLITHIC SILICON
DLA QPL-28830-QPD-2011 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification For
DLA QPL-28830-2013 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification For
DLA SMD-5962-86805 REV F-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 16 UV EPROM, MONOLITHIC SILICON
DLA SMD-5962-89614 REV F-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-89815 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 REGISTERED UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-93122-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 2K X 16-BIT STATE MACHINE UVEPROM, MONOLITHIC SILICON
DLA MIL-DTL-28830 D-2005 CABLE, RADIO FREQUENCY, COAXIAL, SEMIRIGID, CORRUGATED OUTER CONDUCTOR, GENERAL SPECIFICATION FOR [Use In Lieu Of: DLA MIL-C-0028830 A]
DLA QPL-28830-13 NOTICE 1-2008 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification for
DLA SMD-5962-87529 REV E-2006 MICROCIRCUIT, DIGITAL, CMOS, 2K X 8 REGISTERED UVEPROM, MONOLITHIC SILICON
DLA QPL-28830-13-2007 CABLE, RADIO FREQUENCY, COAXIAL, SEMIRIGID, CORRUGATED OUTER CONDUCTOR, GENERAL SPECIFICATION FOR
DLA SMD-5962-90754 REV A-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-89484 REV A-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, REGISTERED 8K X 8-BIT UVEPROM, MONOLITHIC SILICON

Professional Standard - Machinery, UV semiconductor

JB/T 5631-1991 Epitaxial furnace for semiconductor devices. Energy efficiency standard
JB/T 8175-1999 Outline dimensions of extruded heat sink for power semiconductor devices

IN-BIS, UV semiconductor

IS 5000 OD.15-1973
IS 5000 OD.16-1973
IS 5000 OD.30-1981
IS 5000 OB.1-1969
IS 5000 OB.5-1969
IS 5000 OB.2-1969
IS 5000 OB.6-1969
IS 5000 OB.7-1969
IS 5000 OB.4-1969
IS 5000 OD.4-1969
IS 5000 OD.7-1969
IS 5000 OD.9-1969
IS 5000 OD.1-1969
IS 5000 OD.6-1969
IS 5000 OD.2-1969
IS 5000 OD.5-1969
IS 5000 OD.8-1969
IS 5000 OD.31-1981
IS 5000 OD.13-1971
IS 5000 OD.19-1974
IS 5000 OD.12-1971
IS 5000 OD.18-1974
IS 5000 OD.14-1971
IS 5000 OD.33-1981
IS 5000 OD.10-1971
IS 5000 OD.17-1974
IS 5000 OD.35-1981
IS 5000 OD.11-1971
IS 5000 OD.21-1979
IS 5000 OD.23-1978
IS 5000 OD.28-1978
IS 5000 OD.20-1978
IS 5000 OD.26-1978
IS 5000 OD.27-1978
IS 5000 OD.22-1978
IS 5000 OD.25-1978
IS 5000 OD.24-1979
IS 5000 OD.29-1979
IS 5000 OD.36-1981
IS 5000 OD.37-1982
IS 12737-1988

Taiwan Provincial Standard of the People's Republic of China, UV semiconductor

CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers

RO-ASRO, UV semiconductor

STAS 12258/6-1987 OPTOELECTRONIC SEMICON- DUCTOR DEVICES INFRARED EMM1TING DIODES Terminology and essential characteristics
STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
STAS 12258/7-1987 OPTOELECTRONIC SEMICONDIC- TOH DEVICES PHOTOVOLTAIC CELLS Terminology and essential cliarac! eristics
STAS 12258/2-1984 Optoelectronic semiconductor devices PIIOTODIODES Terminology and essentia] characteristics
STAS 12258/4-1986 Optoelectronic semiconductor devices LIGHT EMITTING DIODES Terminology and main characteristics
STAS 12258/5-1986 OPTOELECTRONIG SEMICONDUCTOR DEVICES DISPLAYS Terminology and essential characteristres
STAS 12258/1-1984 OPTOELECTRONIC SEMICONDUCTOR DEVICES General terminology and nomencla- ture of general basic parameters
SR CEI 748-11-1-1992 Semiconductor devices Integrated circuits Part 11: Section 1: Internai visual examination for semiconductor integrated circuits excluding hybrid circuits

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, UV semiconductor

JEDEC JESD22-B118-2011 Semiconductor Wafer and Die Backside External Visual Inspection
JEDEC JEP78-1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors

HU-MSZT, UV semiconductor

MSZ 700/27.lap-1962

IET - Institution of Engineering and Technology, UV semiconductor

DISTRB FEEDB SEMI LAS-1998 Distributed Feedback Semiconductor Lasers

PL-PKN, UV semiconductor

PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

German Institute for Standardization, UV semiconductor

DIN 41885:1976 Cases type 101 for semiconductor devices; main dimensions
DIN 41877:1971 Case 6 A 3 for semiconductor devices; main dimensions
DIN 41888:1976 Cases type 106 and 107 for semiconductor devices; main dimensions
DIN 41871:1971 Cases 1 A 2 and 1 A 3 for semiconductor devices; main dimensions
DIN 41884:1971 Case 118 A 2 for semiconductor devices; main dimensions
DIN EN 60191-4:2003 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (IEC 60191-4:1999 + A1:2001 + A2:2002); German version EN 60191-4:1999 + A1:2002 + A2:2002
DIN 41814-2:1976 Cases for semiconductor devices; cases type 160 to 168, main dimensions
DIN EN 60191-6:2010-06 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (IEC 60191-6:2009); German version EN 60191-6:2009 / Note: DIN EN 60191-6 (2005-04) rem...
DIN 50449-2:1998 Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide
DIN EN 60191-6-8:2002-05 Mechanical standardization of semiconductor devices - Part 6-8: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Design guide for glass sealed ceramic quad flatpack (G-QFP) (IEC 60191-6-8:2001); Ge...
DIN EN 60191-6-2:2002-09 Mechanical standardization of semiconductor devices - Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal package...
DIN EN 60191-6-6:2002-02 Mechanical standardization of semiconductor devices - Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Design guide for fine pitch land grid array (FLGA) (IEC 60191-6-6:2001); German vers...
DIN EN 60191-6-3:2001-06 Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Measuring methods for package dimensions of quat flat packs (QFP) (IEC 60191-6-3:200...
DIN EN 60191-6-1:2002-08 Mechanical standardization of semiconductor devices - Part 6-1: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Design guide for gull-wing lead terminals (IEC 60191-6-1:2001); German version EN 60...
DIN EN 60191-6-5:2002-05 Mechanical standardization of semiconductor devices - Part 6-5: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Design guide for fine-pitch ball grid array (FBGA) (IEC 60191-6-5:2001); German vers...
DIN IEC/TR 61292-9:2013 Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs) (IEC 86C/1109/CD:2013)
DIN 41867:1972 Cases 50 B3 and 50 B4 for semiconductor devices; main dimensions
DIN 41891:1971 Cases 200 A 3 and 200 B 3 for semiconductor devices; main dimensions
DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
DIN 5032-9:2015-01 Photometry - Part 9: Measurement of the photometric quantities of incoherent emitting semiconductor light sources
DIN EN 60191-6-22:2013-08 Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Sil...
DIN EN 17178:2018 Liquid petroleum products - Determination of the total volatile sulfur content in liquefied petroleum gases by ultraviolet fluorescence spectroscopy; German and English version prEN 17178:2018
DIN EN 17178:2019-12 Liquid petroleum products - Determination of the total volatile sulfur content in liquefied petroleum gases by ultraviolet fluorescence spectroscopy; German version EN 17178:2019
DIN EN 60191-6:2010 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (IEC 60191-6:2009); German version EN 60191-6:2009

Professional Standard - Medicine, UV semiconductor

YY 1289-2016 Laser Therapy Equipment Ophthalmic Diode Laser Photocoagulation Instrument
YY 0845-2011 Laser therapeutic equipment.Diode laser equipment for photodynamic therapy

Professional Standard - Petrochemical Industry, UV semiconductor

SH/T 0409-1992 Determination of Aromatics Content in Liquid Paraffin (UV Spectrophotometry)

CZ-CSN, UV semiconductor

CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current

工业和信息化部, UV semiconductor

SJ/T 2749-2016 Semiconductor Laser Diode Test Methods
SJ/T 11702-2018 Semiconductor integrated circuit serial peripheral interface test method
SJ/T 2658.15-2016 Measurement methods for semiconductor infrared emitting diodes Part 15: Thermal resistance
SJ/T 2658.14-2016 Measurement methods for semiconductor infrared emitting diodes Part 14: Junction temperature

American Society for Testing and Materials (ASTM), UV semiconductor

ASTM G177-03(2020) Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37° Tilted Surface
ASTM G177-03(2012) Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37deg; Tilted Surface
ASTM G177-03 Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37 Tilted Surface
ASTM G177-03e1 Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37 Tilted Surface
ASTM G177-03(2008)e1 Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37x00B0; Tilted Surface
ASTM F584-06 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
ASTM F584-06e1 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire

European Committee for Standardization (CEN), UV semiconductor

CWA 17857:2022 Lens-based adaptor system for coupling fibre optic to infrared semiconductor lasers
EN ISO 24443:2021 Cosmetics - Determination of sunscreen UVA photoprotection in vitro (ISO 24443:2021, Corrected version 2022-02)
EN ISO 24443:2012 Determination of sunscreen UVA photoprotection in vitro

Professional Standard - Post and Telecommunication, UV semiconductor

YD/T 701-1993 Test method for semiconductor laser diode assembly
YD/T 1687.1-2007 Technical Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 1:2.5Gbit/s Cooled Direct Modulation Semiconductor Laser Assembiy
YD/T 1687.2-2007 Technidal Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 2:2.5Gbit/s Uncooled Direct Modulation Semiconductor Laser Assembly
YD/T 2001.2-2011 Semiconductor optoelectronic devices for fibre optic system applications.part 2:measuring methods

JP-JEITA, UV semiconductor

JEITA ED 7300A-2008 Recommended practice on standard for the preparation of outline drawings of semiconductor package

Danish Standards Foundation, UV semiconductor

DS/EN ISO 11985:1998 Ophthalmic optics - Contact lenses - Ageing by exposure to UV and visible radiation (in-vitro method)
DS/EN 60191-4/A2:2002 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
DS/EN 60191-4:2001 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
DS/EN 60191-4/A1:2002 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
DS/EN 60191-6:2010 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
DS/IEC 747-12:1993 Semiconductor devices. Part 12: Sectional specification for optoelectronic devices
DS/EN 60191-6-22:2013 Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silico
DS/IEC 747-5:1986 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic sevices
DS/EN 60747-5-5:2011 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
DS/EN 60191-6-21:2010 Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)

IEC - International Electrotechnical Commission, UV semiconductor

IEC TR 61292-9:2017 Optical amplifiers – Part 9: Semiconductor optical amplifiers (SOAs) (Edition 2.0)

American National Standards Institute （ANSI), UV semiconductor

ANSI/TIA/EIA 455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers

European Committee for Electrotechnical Standardization（CENELEC）, UV semiconductor

EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
EN 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
EN 60191-6-22:2013 Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silico

ES-UNE, UV semiconductor

UNE-EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN 60191-6:2009 Mechanical standardization of semiconductor devices -- Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (Endorsed by AENOR in April of 2010.)
UNE-EN 60191-6-21:2010 Mechanical standardization of semiconductor devices -- Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP) (Endorse...
UNE-EN 60191-6-22:2013 Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Sil...
UNE-EN 17178:2020 Liquid petroleum products - Determination of the total volatile sulfur content in liquefied petroleum gases by ultraviolet fluorescence spectroscopy
UNE-EN 60747-5-5:2011/A1:2015 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by AENOR in May of 2015.)
UNE-EN 60747-5-5:2011 Semiconductor devices - Discrete devices -- Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by AENOR in May of 2011.)

国家药监局, UV semiconductor

YY/T 1751-2020 Laser treatment equipment semiconductor laser intranasal irradiation therapy instrument

Professional Standard - Agriculture, UV semiconductor

NY/T 1860.5-2016 Guidelines on the determination of physico-chemical properties of pesticides.Part 5:Ultraviolet / visibility absorption
NY/T 1860.5-2010 Guidance on the determination of physico-chemical properties of pesticides.Part 5:Ultraviolet/Visibility absorption

CENELEC - European Committee for Electrotechnical Standardization, UV semiconductor

EN 60191-6:2004 Mechanical standardization of semiconductor devices Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
EN 62007-2:2000 Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 2: Measuring Methods
EN 60191-4:2014 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Incorporates Amendment A1: 2018)

SE-SIS, UV semiconductor

SIS SS CECC 20000-1983 Generic specification: Semiconductor optoelectronic and liquid crystal devices

GOSTR, UV semiconductor

GOST ISO 20846-2016 Liquid petroleum products. Determination of sulfur content of automotive fuels. Ultraviolet fluorescence method

Japanese Industrial Standards Committee (JISC), UV semiconductor

JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

(U.S.) Telecommunications Industries Association , UV semiconductor

TIA-455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers
TIA-455-128-1996(2014) Procedures for Determining Threshold Current of Semiconductor Lasers

Lithuanian Standards Office , UV semiconductor

LST EN 60191-4+A1-2002 Mechanical standardization of semiconductor devices -- Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (IEC 60191-4:1999+A1:2001)
LST EN 60191-4+A1-2002/A2-2002 Mechanical standardization of semiconductor devices. Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (IEC 60191-4:1999/A2:2002)
LST EN 60191-6-2010 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (IEC 60191-6:2009)
LST EN 60191-6-22-2013 Mechanical standardization of semiconductor devices -- Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silic
LST EN 60191-4-2014 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (IEC 60191-4:2013)

未注明发布机构, UV semiconductor

BS EN ISO 11985:1998(2008) Ophthalmic optics — Contact lenses — Ageing by exposure to UV and visible radiation (in vitro method)

Hebei Provincial Standard of the People's Republic of China, UV semiconductor

DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication

Government Electronic & Information Technology Association, UV semiconductor

GEIA-4900-2001 Use of Semiconductor Devices Outside Manufacturers?Specified Temperature Ranges
GEIA SP4900-2002 Use of Semiconductor Devices Outside Manufacturers?Specified Temperature Ranges Comment Period Expires: May 27, 2002; ANSI/EIA-4900

SAE - SAE International, UV semiconductor

SAE EIA-4900-2016 Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges

IECQ - IEC: Quality Assessment System for Electronic Components, UV semiconductor

PQC 8 ISSUE 1-1996 Semiconductor Optoelectronic Devices Blank Detail Specification: Ambient or Case-Rated Photocouplers with Phototransistor Output Assessment Level Categories I@ II or III

PH-BPS, UV semiconductor

PNS ISO/TS 17466:2021 Use of UV-Vis absorption spectroscopy in the characterization of cadmium chalcogenide colloidal quantum dots

GM North America, UV semiconductor

GM GMP.E/P.030-1991 Polyolefin Alloy - Blow Molding Grade, 85 MPa Flexural Modulus, Integrally Colored, UV Light Stable

AENOR, UV semiconductor

UNE-EN 60191-6-10:2004 Mechanical standardization of semiconductor devices -- Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON