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half wave plate diffusion

half wave plate diffusion, Total:119 items.

In the international standard classification, half wave plate diffusion involves: Semiconductor devices, Packaging and distribution of goods in general, Fibre optic communications, Optics and optical measurements, Glass, Microbiology, Farming and forestry, Veterinary medicine, Products of the textile industry, General methods of tests and analysis for food products, Testing of metals, Acoustics and acoustic measurements, Plastics, Integrated circuits. Microelectronics, Meat, meat products and other animal produce, Printed circuits and boards, Mechanical structures for electronic equipment, Semiconducting materials, Petroleum products in general, Medical equipment, Fishing and fish breeding, Ferroalloys, Materials for aerospace construction, Radiocommunications, Products of the chemical industry.

Group Standards of the People's Republic of China, half wave plate diffusion

T/QDAS 070-2021 Formula of boron diffusion liquid source for diode diffuser
T/QDAS 050-2020 Research and development procedures for diode diffusers
T/QGCML 097-2021 Diode diffuser packaging technical specification
T/QGCML 030-2020 Conventional Electrical Standards for Diode Diffusion Sheets
T/ZZB 042-2015 Characteristics of an extended wavelength band dispersion unshifted single-mode optical fibre
T/ZNZ 099-2021 Method for drug resistance surveillance of zoonotic bacteria -Disk diffusion method
T/ZZB 0182-2017 Extended wavelength band dispersion unshifted single-mode optical fibre preform
T/QGCML 885-2023 Non-dispersion-shifted single-mode fiber with extended wavelength range for communication
T/CVMA 98-2022 Drug sensitivity test disk diffusion of fungi from cats
T/CVMA 99-2022 Drug sensitivity test disks diffusion of bacteria from canine pyoderma

Military Standard of the People's Republic of China-General Armament Department, half wave plate diffusion

GJB 584-1988 Ceramic flake phosphorus and boron diffusion source

Professional Standard - Machinery, half wave plate diffusion

JB/T 5630-1991 Diffusion furnace for semiconductor devices. Grading of energy consumption

Professional Standard - Electron, half wave plate diffusion

SJ 2065-1982 Testing method for diffusion furnace for semiconductor device manufacturing
SJ 1794-1981 General specification for diffusion furnace for semiconductor device manufacturing

American Society for Testing and Materials (ASTM), half wave plate diffusion

ASTM E1172-87(2003) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM E1172-87(2011) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM D3380-90(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
ASTM F391-96 Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

Professional Standard - Building Materials, half wave plate diffusion

JC/T 2066-2011 Quartz glass diffusion tubes for silicon for solar cell

Aerospace Industries Association, half wave plate diffusion

AIA NAS 4122-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Extruded
AIA NAS 4119-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Press-On Type
AIA NAS 4121-1996 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, Formed FSC 5999
AIA NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type

Professional Standard - Forestry, half wave plate diffusion

LY/T 2347-2014 Method of DNA amplification fragment length polymorphism (AFLP) for Phyllostachys bamboo

Association Francaise de Normalisation, half wave plate diffusion

NF EN 62105:2002 Système de radiodiffusion sonore numérique (DAB) - Spécification de l'interface de données du récepteur (RDI)
NF EN 50255:1998 Système de radiodiffusion sonore numérique (DAB). Spécification de l'interface de données du récepteur (RDI)
NF EN 50320:2001 Système de radiodiffusion sonore numérique - Spécifications du jeu de commande DAB pour le récepteur (DCSR)
NF T51-227-3*NF EN ISO 22007-3:2012 Plastics - Determination of thermal conductivity and thermal diffusivity - Part 3 : temperature wave analysis method
NF M07-082:1994 LIQUID PETROLEUM PRODUCTS. DETERMINATION OF LOW LEAD CONCENTRATIONS IN FUELS. METHOD BY WAVELENGTH NON DISPERSIVE X-RAY FLUORESCENCE.
NF C97-913-1/A1*NF EN 61391-1/A1:2017 Ultrasonics - Pulse-echo scanners - Part 1 : techniques for calibrating spatial measurement systems and measurement of system point-spread function response
NF C96-016-10*NF EN 60747-16-10:2005 Semiconductor devices - Part 16-10 : Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
NF C96-022-39*NF EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
NF C96-022-39*NF EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
NF EN 60747-16-10:2005 Dispositifs à semiconducteurs - Partie 16-10 : format-cadre pour agrément de technologie (TAS) pour circuits intégrés monolithiques hyperfréquences
NF EN IEC 60749-39:2022 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39 : mesure de la diffusivité d'humidité et de l'hydrosolubilité dans les matériaux organiques utilisés dans les composants à semiconducteurs
NF B41-214*NF EN 821-2:1997 Advanced technical ceramics. Monolithic ceramics. Thermo-physical properties. Part 2 : determination of thermal diffusivity by the laser flash (or heat pulse) method.

AIA/NAS - Aerospace Industries Association of America Inc., half wave plate diffusion

NAS4118-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Retainer Clip Type
NAS4120-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Encapsulating Type@ TO-5
NAS4121-2012 HEAT SINK@ ELECTRICAL@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ FORMED (Rev 1)

German Institute for Standardization, half wave plate diffusion

DIN EN ISO 20645:2005-02 Textile fabrics - Determination of antibacterial activity - Agar diffusion plate test (ISO 20645:2004); German version EN ISO 20645:2004
DIN EN ISO 22007-3:2012-04 Plastics - Determination of thermal conductivity and thermal diffusivity - Part 3: Temperature wave analysis method (ISO 22007-3:2008); German version EN ISO 22007-3:2012
DIN EN 61391-1:2018-09 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response (IEC 61391-1:2006 + A1:2017); German version EN 61391-1:2006 + A1:2017 / Note: DIN EN 61391-1 (2...
DIN EN 60747-16-10:2005 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
DIN EN 60749-39:2007 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006); German version EN 60749-39:2006
DIN EN 60749-39:2007-01 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006); German version EN 60749-39:2006 / Note: To be r...
DIN EN 60747-16-10:2005-03 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
DIN EN 2004-5:1993-09 Aerospace series; test methods for aluminium and aluminium alloy products; part 5: determination of cladding thickness and copper diffusion of clad semi-finished products; German version EN 2004-5:1993
DIN EN IEC 60749-39:2021-07 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 47/2652/CDV:2020); English version prEN IEC 60749-39:2020 / Not...

British Standards Institution (BSI), half wave plate diffusion

BS EN ISO 20645:2004 Textile fabrics - Determination of antibacterial activity - Agar diffusion plate test
BS EN 61391-1:2006+A1:2017 Ultrasonics. Pulse-echo scanners - Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
BS EN 60747-16-10:2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
BS EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
BS EN IEC 60749-39:2022 Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
BS EN 2004-5:1993 Test methods for aluminium and aluminium alloy products - Determination of cladding thickness and copper diffusion of clad semi-finished products
20/30425840 DC BS EN IEC 60749-39. Semiconductor devices. Mechanical and climatic test methods. Part 39. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
BS ISO 12926:2012 Aluminium fluoride for industrial use. Determination of trace elements. Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets

Aerospace Industries Association/ANSI Aerospace Standards, half wave plate diffusion

AIA/NAS NAS4120-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, ENCAPSULATING TYPE, TO-5
AIA/NAS NAS4121-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, FORMED (Rev 1)

Professional Standard - Commodity Inspection, half wave plate diffusion

SN/T 1944-2007 Detection of antimicrobial resistmceof the bacteria in animal and animal products.Disk diffusion testing

国家质量监督检验检疫总局, half wave plate diffusion

SN/T 1944-2016 Disk diffusion method for determination of bacterial resistance in animals and their products

Xinjiang Provincial Standard of the People's Republic of China, half wave plate diffusion

DB65/T 4666-2023 Differential diagnostic method of Brucella bovis and sheep natural hapten agar diffusion test

GB-REG, half wave plate diffusion

REG NACA-TN-4080-1958 Some effects of vanes and of turbulence in two-dimensional wide-angle subsonic diffusers

European Committee for Standardization (CEN), half wave plate diffusion

EN ISO 20645:2004 Textile fabrics - Determination of antibacterial activity - Agar diffusion plate test
EN ISO 22007-3:2012 Plastics - Determination of thermal conductivity and thermal diffusivity - Part 3: Temperature wave analysis method (ISO 22007-3:2008)

工业和信息化部, half wave plate diffusion

YS/T 679-2018 Surface photovoltage method for measuring minority carrier diffusion length in extrinsic semiconductors
YD/T 2797.1-2015 Technical requirements for optical fiber preforms for communications Part 1: Non-dispersion shifted single-mode optical fiber preform with extended wavelength range
YB/T 4780-2019 Determination of silicon, calcium and aluminum content in calcium silicon alloys by wavelength dispersive X-ray fluorescence spectrometry (cast glass plate method)
YD/T 2797.3-2019 Technical requirements for optical fiber preforms for communications Part 3: Non-dispersion shifted single-mode optical fiber assembly preforms with extended wavelength range

Danish Standards Foundation, half wave plate diffusion

DS/EN ISO 22007-3:2012 Plastics - Determination of thermal conductivity and thermal diffusivity - Part 3: Temperature wave analysis method
DS/EN 61391-1:2007 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
DS/EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, half wave plate diffusion

GB/T 42919.3-2023 Determination of thermal conductivity and thermal diffusivity of plastics - Part 3: Temperature wave analysis
GB/T 9771.3-2008 Single-mode optical fibres for telecommunication.Part 3:Characteristics of an extended wavelength band dispersion unshifted single-mode optical fibre
GB/T 20870.10-2023 Semiconductor Devices Part 16-10: Monolithic Microwave Integrated Circuit Technology Acceptable Procedures
GB/T 9771.3-2000 The series of single-mode optical fibres for telecommunication Part 3:Characteristics of an extended wavelength band dispersion unshifted single-mode optical fibre

Defense Logistics Agency, half wave plate diffusion

DLA SMD-5962-94642-1994 MICROCIRCUIT, DIGITAL, CMOS, ENHANCED MULTI-FUNCTIONAL PERIPHERAL, MONOLITHIC SILICON
DLA SMD-5962-89726 REV D-2006 MICROCIRCUIT, DIGITAL, CMOS, I/O EXPANDED MICROCONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-90504 REV C-1997 MICROCIRCUIT, DIGITAL, CMOS, BINARY FILTER AND TEMPLATE MATCHER, MONOLITHIC SILICON
DLA SMD-5962-89534 REV C-1991 MICROCIRCUITS, DIGITAL, CMOS, 80-BIT NUMERIC PROCESSOR EXTENSION, MONOLITHIC SILICON
DLA SMD-5962-89483 REV D-1996 MICROCIRCUIT, LINEAR, CMOS, QUAD, UNIVERSAL FILTER BUILDING BLOCK, MONOLITHIC SILICON
DLA SMD-5962-96650 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, MULTIFUNCTION EXPANDABLE 8 INPUT GATE, MONOLITHIC SILICON

农业农村部, half wave plate diffusion

NY/T 4144-2022 Technical regulations for antimicrobial susceptibility testing of bacteria of animal origin using disk diffusion method

American National Standards Institute （ANSI), half wave plate diffusion

ANSI/ASTM D3380:2010 Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Plastic-based Microwave Circuit Substrates

International Organization for Standardization (ISO), half wave plate diffusion

ISO 22007-3:2008 Plastics — Determination of thermal conductivity and thermal diffusivity — Part 3: Temperature wave analysis method

Professional Standard - Non-ferrous Metal, half wave plate diffusion

YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage

国家市场监督管理总局、中国国家标准化管理委员会, half wave plate diffusion

GB/T 9771.3-2020 Single-mode optical fibres for telecommunication—Part 3: Characteristics of an extended wavelength band dispersion unshifted single-mode optical fibre
GB/T 40311-2021 Vanadium slag—Determination of multi-element contents—Wavelength dispersive X-ray fluorescence spectrometry(fused cast bead method)
GB/T 40312-2021 Ferrophosphorus—Determination of phosphorus, silicon, manganese and titanium content—Wavelength dispersive X-ray fluorescence spectrometry method (fused cast bead method)
GB/T 5687.13-2021 Ferrochromium—Determination of chromium, silicon, manganese, titanium, vanadium, iron contents—Wavelength dispersive X-ray fluorescence spectrometry (fused cast bead method)

ES-UNE, half wave plate diffusion

UNE-EN 61391-1:2006/A1:2017 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response (Endorsed by Asociación Española de Normalización in January of 2018.)
UNE-EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)
UNE-EN 60747-16-10:2004 Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)
UNE-EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)

Professional Standard - Hygiene , half wave plate diffusion

WS/T 231-2002 Protocols for the evaluation of dehydrated Mueller-Hinton agar in the disk diffusion procedure for antimicrobial susceptibility testing

Indonesia Standards, half wave plate diffusion

SNI 8234-2016 Uji sensitivitas bakteri yang diisolasi dari ikan dan lingkungan terhadap antimikrob dengan menggunakan metode difusi cakram

Institute of Electrical and Electronics Engineers (IEEE), half wave plate diffusion

SMPTE ST 117:2001 ST 117:2001 - SMPTE Standard - For Motion-Picture Film — Photographic Audio Density — Spectral Diffuse Density Measurement

Lithuanian Standards Office , half wave plate diffusion

LST EN ISO 22007-3:2012 Plastics - Determination of thermal conductivity and thermal diffusivity - Part 3: Temperature wave analysis method (ISO 22007-3:2008)
LST EN 61391-1-2007 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response (IEC 61391-1:2006)
LST EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006)
LST EN 2004-5-2001 Aerospace series - Test methods for aluminium alloys products - Part 5: Determination of cladding thickness and copper diffusion of clad semi-finished products

AENOR, half wave plate diffusion

UNE-EN ISO 22007-3:2012 Plastics - Determination of thermal conductivity and thermal diffusivity - Part 3: Temperature wave analysis method (ISO 22007-3:2008)

International Electrotechnical Commission (IEC), half wave plate diffusion

IEC 60749-39:2021 RLV Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
IEC 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Korean Agency for Technology and Standards (KATS), half wave plate diffusion

KS C IEC 60749-39-2006(2021) Semiconductor devices－Mechanical and climatic test methods－Part 39：Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
KS C IEC 60749-39-2006(2016) Semiconductor devices－Mechanical and climatic test methods－Part 39：Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
KS C IEC 60749-39:2006 Semiconductor devices－Mechanical and climatic test methods－Part 39：Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

未注明发布机构, half wave plate diffusion

BS EN 2004-5:1993(2000) Test methods for aluminium and aluminium alloy products — Part 5 : Determination ofcladding thickness and copper diffusion ofclad semi - finished products

European Committee for Electrotechnical Standardization（CENELEC）, half wave plate diffusion

EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
EN 60747-16-10:2004 Semiconductor devices Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

International Telecommunication Union (ITU), half wave plate diffusion

ITU-R S.446-2-1978 Carrier Energy Dispersal for Systems Employing Angle Modulation by Analogue Signals or Digital Modulation in the Fixed-Satellite Service - Section 4C - Earth Station and Baseband Characteristics - Earth Station Antennas - Maintenance of Earth Stations
ITU-R S.446-3-1992 Carrier Energy Dispersal for Systems Employing Angle Modulation by Analogue Signals or Digital Modulation in the Fixed-Satellite Service - Section 4C - Earth Station and Baseband Characteristics - Earth Station Antennas - Maintenance of Earth Stations
ITU-R S.446-1993 Carrier energy dispersal for systems employing angle modulation by analogue signals or digital modulation in the fixed-satellite service

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector, half wave plate diffusion

ITU-R S.446-4-1993 Carrier Energy Dispersal for Systems Employing Angle Modulation by Analogue Signals or Digital Modulation in the Fixed-Satellite Service

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, half wave plate diffusion

GB/T 4333.5-2016 Ferrosillicon—Determination of silicon, manganese, aluminium, calcium, chromium and iron contents—Wavelength dispersive X-ray fluorescence spectrometry (Fused cast bead method)