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Half-wave plate function

Half-wave plate function, Total:367 items.

In the international standard classification, Half-wave plate function involves: Kitchen equipment, Road vehicle systems, Applications of information technology, Integrated circuits. Microelectronics, Electrical engineering in general, Components and accessories for telecommunications equipment, Electricity. Magnetism. Electrical and magnetic measurements, Optoelectronics. Laser equipment, Semiconducting materials, Electrical accessories, Semiconductor devices, Telecommunication systems, Rectifiers. Convertors. Stabilized power supply, Farm buildings, structures and installations, Hydraulic energy engineering, Acoustics and acoustic measurements, Sewing machines and other equipment for the clothing industry, Equipment for the rubber and plastics industries, Fibre optic communications, Electronic tubes, Telecommunications in general, Electrical wires and cables, Manufacturing forming processes, Solar energy engineering, Insulating materials, Piezoelectric and dielectric devices, Ceramics, Testing of metals, Audio, video and audiovisual engineering, Electric road vehicles, Mobile services, Integrated Services Digital Network (ISDN), Electronic components in general, Organic chemicals, Electronic display devices, Analytical chemistry, Domestic safety, Medical equipment, Radiation measurements, Photography, Rotating machinery, Materials for aerospace construction, Construction of railways, Equipment for petroleum and natural gas industries, Optical equipment, Reinforced plastics, Computer graphics, Nuclear energy engineering, Installations in buildings, Valves.

Professional Standard - Business, Half-wave plate function

SB/T 10515-2008 Requirement for the steaming function with microwave oven

Association Francaise de Normalisation, Half-wave plate function

NF R47-102:1987 Road vehicles. Legs for semi-trailers. Functional characteristics.
NF C93-593-8*NF EN 61580-8:2002 Methods of measurement for waveguides - Part 8 : waveguide power holding capability
NF EN 61580-8:2002 Méthodes de mesure appliquées aux guides d'ondes - Partie 8 : aptitude d'un guide d'ondes à la tenue en puissance
NF EN 61249-4-12:2006 Matériaux pour circuits imprimés et autres structures d'interconnexion - Partie 4-12 : série de spécifications intermédiaires pour matériaux préimprégnés, non plaqués - Tissu de verre époxyde préimprégné multifonctionnel de type E non ha...
NF EN 61249-4-2:2006 Matériaux pour circuits imprimés et autres structures d'interconnexion - Partie 4-2 : série de spécifications intermédiaires pour matériaux préimprégnés, non plaqués Tissu de verre époxyde de type E préimprégné multifonctionnel d'inflam...
NF C97-905:2008 Ultrasonics - Power measurement - Radiation force balances and performance requirements.
NF C97-905*NF EN 61161:2013 Ultrasonics - Power measurement - Radiation force balances and performance requirements
NF ISO 16028/A1:2006 Matériaux pour circuits imprimés et autres structures d'interconnexion - Partie 4-2 : série de spécifications intermédiaires pour matériaux préimprégnés, non plaqués Tissu de verre époxyde de type E préimprégné multifonctionnel d'inflammabilité définie
NF C96-016-10*NF EN 60747-16-10:2005 Semiconductor devices - Part 16-10 : Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
NF C96-779-3*NF EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3 : functional type and its operational conditions
NF EN 60747-16-10:2005 Dispositifs à semiconducteurs - Partie 16-10 : format-cadre pour agrément de technologie (TAS) pour circuits intégrés monolithiques hyperfréquences
NF Z83-581-1*NF ETS 300581-1:1998 Digital cellular telecommunications system (phase 2). Half rate speech. . Part 1 : half rate speech processing functions (GSM 06.02).
NF EN 62779-3:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 3 : type fonctionnel et ses conditions d'utilisation
NF ETS 300581-1:1998 Télécommunications - Système de télécommunications cellulaire numérique (phase 2). Parole à demi-débit - Partie 1 : fonctions de traitement de la parole à demi-débit (GSM 06.02).
NF EN 61391-1/A1:2017 Ultrasons - Scanners à impulsion et écho Partie 1 : techniques pour l'étalonnage des systèmes de mesure spatiaux et des mesures de la réponse de la fonction de dispersion ponctuelle du système
NF F62-011-2:1992 Railway rolling stock. Functional general requirements. Transistorized ballasts. Collection of particular leaves.
NF C96-022-19/A1*NF EN 60749-19/A1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 19 : die shear strength
NF C86-413:1987 SEMICONDUCTOR DEVICES. HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM HYBRID INTEGRATED CIRCUITS. CAPABILITY APPROVAL. SECTIONAL SPECIFICATION. (SPECIFICATION CECC 63 200).
NF EN IEC 62053-24:2021 Équipement de comptage de l'électricité - Exigences particulières - Partie 24 : compteurs statiques d'énergie réactive de composante fondamentale (classes 0,5S, 1S, 1, 2 et 3)
NF EN ISO 3745:2013 Acoustique - Détermination des niveaux de puissance acoustique et des niveaux d'énergie acoustique émis par les sources de bruit à partir de la pression acoustique - Méthodes de laboratoire pour les salles anéchoïques et semi-anéchoïques
NF EN ISO 3745/A1:2017 Acoustique - Détermination des niveaux de puissance acoustique et des niveaux d'énergie acoustique émis par les sources de bruit à partir de la pression acoustique - Méthodes de laboratoire pour les salles anéchoïques et les salles semi-anécho...
NF C86-414:1987 SEMICONDUCTOR DEVICES. HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM AND HYBRID INTEGRATED CIRCUITS. CAPABILITY APPROVAL. BLANK DETAIL SPECIFICATION. (SPECIFICATION CECC 63 201).
NF S31-026/A1*NF EN ISO 3745/A1:2017 Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Precision methods for anechoic rooms and hemi-anechoic rooms - Amendment 1

Group Standards of the People's Republic of China, Half-wave plate function

T/QGCML 2041-2023
T/STIC 110082-2022 Multifunctional ultrasonic gas meter
T/CIMA 0021-2020 Harmonic Active Energy Meter Inspection Device
T/SHDSGY 135-2023 New Energy Semiconductor Silicon Wafer Material Technology
T/SDAQI 026-2021 Low-voltage reactive power compensation assemblies—Inrush current,dynamic response,harmonic restraining or filtering function test inspection specification
T/CAB 0259-2023 Microwave ovens - Method for evaluation of special cooking functions of prepared dishes
T/QGCML 1148-2023 Multifunctional semi-automatic large livestock breeding equipment clamping cattle pen
T/CASMES 126-2022 Towel embroidery machine head with sequin embroidery function
T/SDAS 637-2023 Preparation process of micro-laminated gradient functional ceramic composite inserts
T/CSAE 225-2021 Environmental functional test method of battery electric passenger vehicle control integrated circuit
T/CSAE 226-2021 Environmental functional test method of battery electric passenger vehicle communication integrated circuit
T/CSTM 00750-2022 Measurement of dielectric properties of materials in millimeter wave frequency—Hemispherical type open resonator method
T/WNJKCY 001.6-2023 Product classification of health functional daily necessities—standards and writing specifications for semi-solid products
T/WNJKCY 001.6-2021 Product classification of health functional daily necessities—standards and writing specifications for semi-solid products
T/CSAE 224-2021 Functional safety requirement and test specification for communication integrated circuit in battery electric passenger vehicle
T/CSAE 223-2021 Functional safety requirement and test specification for control integrated circuit in battery electric passenger vehicle

Defense Logistics Agency, Half-wave plate function

DLA SMD-5962-94642-1994 MICROCIRCUIT, DIGITAL, CMOS, ENHANCED MULTI-FUNCTIONAL PERIPHERAL, MONOLITHIC SILICON
DLA SMD-5962-96650 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, MULTIFUNCTION EXPANDABLE 8 INPUT GATE, MONOLITHIC SILICON
DLA SMD-5962-88506-1988 MICROCIRCUITS, N-CHANNEL MOS MULTIFUNCTION PERIPHERAL, MONOLITHIC SILICON
DLA SMD-5962-94513 REV C-2006 MICROCIRCUIT, LINEAR, LOW POWER, PULSE WIDTH MODULATOR, MONOLITHIC SILICON
DLA DSCC-VID-V62/03641 REV A-2009 MICROCIRCUIT, DIGITAL, CONFIGURABLE MULTIPLE FUNCTION GATE, MONOLITHIC SILICON
DLA DSCC-VID-V62/03642 REV A-2009 MICROCIRCUIT, DIGITAL, CONFIGURABLE MULTIPLE FUNCTION GATE, MONOLITHIC SILICON
DLA DSCC-DWG-89100 REV B-2002 SEMICONDUCTOR DEVICE, POWER SWITCHING REGULATOR ASSEMBLY
DLA SMD-5962-90504 REV C-1997 MICROCIRCUIT, DIGITAL, CMOS, BINARY FILTER AND TEMPLATE MATCHER, MONOLITHIC SILICON
DLA MIL-PRF-19500/446 E-2008 SEMICONDUCTOR DEVICE, SILICON, HIGH-POWER, SINGLE PHASE, FULL WAVE BRIDGE RECTIFIER, TYPES SPA25, SPB25, SPC25, AND SPD25, JANTX AND JANTXV
DLA SMD-5962-94604 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, DUAL MICROPOWER OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA MIL-F-18327 F-2008 FILTERS, HIGH PASS, LOW PASS, BAND PASS, BAND SUPPRESSION, AND DUAL FUNCTIONING, GENERAL SPECIFICATION FOR
DLA SMD-5962-91533 REV B-2010 MICROCIRCUIT, LINEAR, CMOS, HIGH PERFORMANCE DUAL SWITCHED CAPACITOR FILTER, MONOLITHIC SILICON
DLA MIL-PRF-19500/446 E VALID NOTICE 1-2013 Semiconductor Device, Silicon, High-Power, Single Phase, Full Wave Bridge Rectifier, Types SPA25, SPB25, SPC25, and SPD25 JAN, JANTX, and JANTXV
DLA SMD-5962-96664 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, MICROPOWER PHASE LOCKED LOOP, MONOLITHIC SILICON
DLA SMD-5962-90644 REV A-1996 MICROCIRCUIT, LINEAR, HIGH PERFORMANCE LOW-POWER FM IF SYSTEM, MONOLITHIC SILICON
DLA SMD-5962-89483 REV D-1996 MICROCIRCUIT, LINEAR, CMOS, QUAD, UNIVERSAL FILTER BUILDING BLOCK, MONOLITHIC SILICON
DLA MIL-PRF-19500/469 D-2008 SEMICONDUCTOR DEVICE, SILICON, HIGH-POWER, SINGLE PHASE, FULL WAVE BRIDGE RECTIFIER, TYPES M19500/469-01, -02, -03, -04, -05, JANTX AND JANTXV
DLA SMD-5962-90544 REV A-2003 MICROCIRCUIT, DIGITAL, CMOS, HIGH PERFORMANCE MICROCONTROLLER MONOLITHIC SILICON
DLA SMD-5962-93224 REV A-2009 MICROCIRCUIT, LINEAR, VOLTAGE REGULATOR WITH COMPARATOR AND SHUTDOWN, MONOLITHIC SILICON
DLA MIL-I-7749 A VALID NOTICE 2-2005 INDICATOR, TEMPERATURE, ELECTRICAL RESISTANCE, MULTIFUNCTION, -70 DEG. C TO PLUS 150 DEG. C. SINGLE
DLA MIL-I-7749 A NOTICE 1-1999 INDICATOR, TEMPERATURE, ELECTRICAL RESISTANCE, MULTIFUNCTION, -70 DEG. C TO PLUS 150 DEG. C. SINGLE
DLA MIL-I-7749 A (1)-1962 INDICATOR, TEMPERATURE, ELECTRICAL RESISTANCE, MULTIFUNCTION, -70 DEG. C TO PLUS 150 DEG. C. SINGLE
DLA MIL-I-7749 A-1961 INDICATOR, TEMPERATURE, ELECTRICAL RESISTANCE, MULTIFUNCTION, -70 DEG. C TO PLUS 150 DEG. C. SINGLE
DLA SMD-5962-85153 REV D-2013 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL J-K FLIP-FLOP WITH RESET, MONOLITHIC SILICON
DLA SMD-5962-85154 REV D-2013 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL J-K FLIP-FLOP WITH RESET, MONOLITHIC SILICON
DLA SMD-5962-96839 REV D-2010 MICROCIRCUIT, LINEAR, 160 MHz, RAIL-TO-RAIL AMPLIFIER WITH DISABLE, MONOLITHIC SILICON
DLA SMD-5962-96839 REV E-2011 MICROCIRCUIT, LINEAR, 160 MHz, RAIL-TO-RAIL AMPLIFIER WITH DISABLE, MONOLITHIC SILICON
DLA SMD-5962-05206 REV A-2007 MICROCIRCUIT, DIGITAL-LINEAR, CMOS, LOW POWER, DUAL 8-BIT, 1 GSPS ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88702 REV B-2010 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE FLIP-FLOP WITH CLOCK ENABLE, MONOLITHIC SILICON
DLA SMD-5962-90985 REV D-2013 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT MAGNITUDE COMPARATOR WITH ENABLE, MONOLITHIC SILICON
DLA SMD-5962-89598 REV R-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K X 8 STATIC RANDOM ACCESS MEMORY (SRAM) LOW POWER, MONOLITHIC SILICON
DLA SMD-5962-96635 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, LOW-POWER MONOSTABLE/ASTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-89947 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 12-STAGE RIPPLE-CARRY BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-90864 REV A-1993 MICROCIRCUIT, DIGITAL, HCMOS MULTIFUNCTION PERIPHERAL, MONOLITHIC SILICON
DLA SMD-5962-94664 REV A-2006 MICROCIRCUIT, DIGITAL, CMOS, MICROPOWER PHASE-LOCKED-LOOP, MONOLITHIC SILICON
DLA SMD-5962-88544 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256K X 1 STATIC RAM (SRAM) LOW POWER, MONOLITHIC SILICON
DLA SMD-5962-88545 REV C-2007 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 64K X 4 SRAM (LOW POWER), MONOLITHIC SILICON
DLA SMD-5962-93166 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, POWER SWITCHED, 32K x 8-BIT PROM, MONOLITHIC SILICON
DLA SMD-5962-84150 REV F-2009 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, MONOLITHIC SILICON
DLA DSCC-VID-V62/07624 REV A-2010 MICROCIRCUIT, DIGITAL, DUAL 4-A HIGH-SPEED LOW-SLIDE MOSFET DRIVER WITH ENABLE, MONOLITHIC SILICON
DLA SMD-5962-89971-1992 MICROCIRCUIT, DIGITAL, HMOS, REMOTE UNIVERSAL PERIPHERAL INTERFACE, MONOLITHIC SILICON
DLA SMD-5962-96861 REV B-2008 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-95603 REV C-2003 MICROCIRCUIT, LINEAR, CMOS, PRECISION, DUAL/QUAD, MICROPOWER, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-90512-1992 MICROCIRCUIT, DIGITAL, HMOS, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
DLA SMD-5962-88573 REV C-1992 MICROCIRCUIT, DIGITAL CMOS, HIGH PERFORMANCE PARITY BUS TRANSCEIVERS, MONOLITHIC SILICON
DLA SMD-5962-84056 REV F-2009 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL D-TYPE FLIP-FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
DLA SMD-5962-89925 REV B-2012 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL, HEX D-TYPE FLIP-FLOPS WITH ENABLE, MONOLITHIC SILICON
DLA SMD-5962-95749 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-95514 REV A-2010 MICROCIRCUIT, LINEAR, ANALOG-TO-DIGITAL CONVERTER WITH S/H FUNCTION AND INPUT MULTIPLEXER, MONOLITHIC SILICON
DLA DSCC-VID-V62/10603 REV A-2009 MICROCIRCUIT, DIGITAL, CMOS, 3.0 V TO 5.5 V, 12 BIT, 200 KSPS, 4-/8 CHANNEL, LOW POWER SERIAL ANALOG TO DIGITAL CONVERTER WITH AUTOPOWER DOWN, MONOLITHIC SILICON
DLA SMD-5962-95737 REV A-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, 4-BIT BINARY RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA MIL-PRF-19500/694 A VALID NOTICE 1-2008 Semiconductor Device, Transistor, Plastic, NPN, Silicon, Switching, Type 2N3700UE1, JAN, JANTX, JANJ
DLA SMD-5962-88516 REV D-2002 MICROCIRCUIT, DIGITAL, HIGH PERFORMANCE CMOS 9-WIDE AND 10-WIDE BUS INTERFACE REGISTER, MONOLITHIC SILICON
DLA SMD-5962-90976-1992 MICROCIRCUIT, CHMOS SINGLE-CHIP, 8-BIT MICROCONTROLLER WITH 256 BYTES OF ON CHIP DATA RAM, MONOLITHIC SILICON
DLA SMD-5962-88534 REV C-2008 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL J-K FLIP-FLOP WITH SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89702 REV B-2011 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-90701 REV B-2012 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89735 REV F-2013 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE FLIP-FLOP WITH RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89743 REV B-2012 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX D-TYPE FLIP-FLOP WITH RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-87525 REV G-2013 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE FLIP-FLOP WITH PRESET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-92234-1993 MICROCIRCUIT, DIGITAL, FAST CMOS 8-BIT IDENTITY COMPARATOR WITH CHIP ENABLE, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
DLA SMD-5962-89733 REV B-1992 MICROCIRCUITS, DIGITAL, FAST CMOS, UP/DOWN BINARY COUNTER WITH PRESET AND RIPPLE CLOCK, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-96775 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89538 REV A-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 16K X 8 UV EPROM, POWER DOWN, MONOLITHIC SILICON
DLA DSCC-VID-V62/06602 REV A-2012 MICROCIRCUIT, DIGITAL-LINEAR, 2.7 V TO 5.5 V 12 BIT 3 祍 QUADRUPLE DIGITAL TO ANALOG CONVERTER WITH POWER DOWN, MONOLITHIC SILICON
DLA SMD-5962-89700 REV B-2012 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL RETRIGGERABLE MONOSTABLE MULTIVIBRATOR WITH RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-87808 REV B-2011 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS UP/DOWN DECADE COUNTER WITH ASYCHRONOUS RESET, MONOLITHIC SILICON

Professional Standard - Electricity, Half-wave plate function

DL/T 1369-2014 Reference meter for harmonic active energy

British Standards Institution (BSI), Half-wave plate function

BS EN 61580-8:1997 Methods of measurement for waveguides. Waveguide power holding capability
BS EN 60747-16-10:2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
BS ISO 26262-11:2018 Road vehicles. Functional safety - Guidelines on application of ISO 26262 to semiconductors
BS EN 62779-3:2016 Semiconductor devices. Semiconductor interface for human body communication. Functional type and its operational conditions
BS EN 61161:2007 Ultrasonics - Power measurement - Radiation force balances and performance requirements
BS EN 61161:2013 Ultrasonics. Power measurement. Radiation force balances and performance requirements
23/30472390 DC BS EN 60747-16-11 Semiconductor devices - Part 16-11. Microwave integrated circuits - Power detectors
21/30445919 DC BS EN IEC 55011. Fragment 3. Requirements for radio beam wireless power transfer (WPTAAD) equipment
BS ISO 21202:2020 Intelligent transport systems. Partially automated lane change systems (PALS). Functional / operational requirements and test procedures
19/30370187 DC BS ISO 21202. Intelligent transport systems. Partially automated lane change systems (PALS). Functional / operational requirements and test procedures
PD IEC/TS 62600-102:2016 Marine energy. Wave, tidal and other water current converters. Wave energy converter power performance assessment at a second location using measured assessment data
BS IEC 63068-1:2019 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Classification of defects
BS IEC 62830-5:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Test method for measuring generated power from flexible thermoelectric devices
BS EN 61391-1:2006 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
BS EN 61391-1:2007 Ultrasonics - Pulse-echo scanners - Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
PD IEC TS 62903:2023 Ultrasonics. Measurements of electroacoustical parameters and acoustic output power of spherically curved transducers using the self-reciprocity method
BS EN ISO 19085-13:2020 Woodworking machines. Safety. Multi-blade rip sawing machines with manual loading and/or unloading
PD IEC TS 60747-19-2:2021 Semiconductor devices. Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
BS EN IEC 62053-24:2021+A11:2021 Electricity metering equipment. Particular requirements - Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3)
BS IEC 63068-3:2020 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Test method for defects using photoluminescence
BS IEC 63068-2:2019 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Test method for defects using optical inspection
BS PD IEC TS 60747-19-2:2021 Semiconductor devices. Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
BS 7011-2.1:1989 Consumable accessories for light microscopes - Slides - Specification for dimensions and optical properties
BS 4154-1:1985 Corrugated plastics translucent sheets made from thermo-setting polyester resin (glass fibre reinforced) - Specification for material and performance requirements
BS ISO/IEC 9636-5:1992 Information technology - Computer graphics - Interfacing techniques for dialogues with graphical devices (CGI) - Functional specification - Input and echoing
BS IEC 62830-8:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
BS EN ISO 3745:2012+A1:2017 Acoustics. Determination of sound power levels and sound energy levels of noise sources using sound pressure. Precision methods for anechoic rooms and hemi-anechoic rooms
18/30382424 DC BS IEC 63068-3. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Part 3. Test method for defects using photoluminescence

Professional Standard - Electron, Half-wave plate function

SJ 20514-1995 Specification for silicon epitaxial wafer for microwave power transistor
SJ/T 11398-2009 Technical specification for power light-emitting diode chips
SJ 50033/77-1995 Semiconductor discrete devices.Detail specification for type 3DA331 Silicon microwave power transistor
SJ 50033/74-1995 Semiconductor discrete devices.Detail specification for type 3DA325 silicon microwave power transistor
SJ 50033/170-2007 Semiconductor discrete devices Detail specification for type 3DA516 silicon microwave pulse power transistor
SJ 50033/171-2007 Semiconductor discrete devices Detail specification for type 3DA518 silicon microwave pulse power transistor
SJ 50033/172-2007 Semiconductor discrete devices Detail specification for type 3DA519 silicon microwave pulse power transistor
SJ 50033/173-2007 Semiconductor discrete devices Detail specification for type 3DA520 silicon microwave pulse power transistor
SJ 50033/176-2007 Semiconductor discrete devices Detail specification for type 3DA523 silicon microwave pulse power transistor
SJ 50033/169-2004 Semiconductor discrete devices Detail specification for type 3DA510 silicon microwave polse power transistor
SJ 50033/168-2004 Semiconductor discrete devices Detail specification for type 3DA509 silicon microwave pulse power transistor
SJ 50033/166-2004 Semiconductor discrete devices Detail specification for type 3DA507 silicon microwave pulse power transistor
SJ 50033/174-2007 Semiconductor discrete devices Detail specification for type 3DA521 silicon microwave pulse power transistor
SJ 50033/156-2002 Semiconductor discrete devices Detail specification for type 3DA505 silicon microwave pulse power transistor
SJ 50033/167-2004 Seiconductor discrete devices Detail specification for type 3DA508 silicon microwave pulse power transistor
SJ 50033/175-2007 Semiconductro discrete devices Detail specification for type 3DA522 silicon microwave pulse power transistor
SJ 50033/145-2000 Semiconductor discrete devices.Detail specification for type 3DA503 silicon microwave pulse power transistor
SJ 50033/157-2002 Semiconductor discrete devices Detail specification for type 3DA506 silicon microwave pulse power transistor
SJ 50033/140-1999 Semiconductor discrete devices Detail specification for type 3DA502 silicon microwave pulse power transistor
SJ 50033/146-2000 Semiconductor discrete devices.Detail specification for type 3DA601 C silicon bipolar power transistor
SJ 50033/79-1995 Semiconductor discrete devices.Detail specification for type CS0536 GaAs microwave power FET
SJ 50033/120-1997 Semiconductor discrete devices Detail specification for type CS205 GaAs microwave power field effect transistor
SJ 50033.52-1994 semiconductor discrete device.Detail specification for type CS0529 GaAs microwave Power field effect transistor
SJ 50033.54-1994 Semiconductor discrete device.Detail specification for type CS0532 GaAs microwave power field effect transistor
SJ 50033/119-1997 Semiconductor discrete devices Detail specification for type CS204 GaAs microwave power field effect transistor
SJ 50033/81-1995 Semiconductor discrete devices.Detail specification for type CS0524 GaAs microwave power FET
SJ 50033/80-1995 Semiconductor discrete devices.Detail specification for type CS0513 GaAs microwave power FET
SJ 50033.53-1994 Semiconductor discrete device.Detail specification for type CS0530 and CS0531 GaAs microwave Power field effect transistor
SJ/Z 9008.5-1987 Measurement of electrical properties of microwave tubes--Part 6: High-power klystrons
SJ/Z 9008.4-1987 Measurement of electrical properties of microwave tubes--Part 5: Low-power oscilator klystrons
SJ/T 31165-1994 Requirements of readiness and methods of inspection and assessment for the power source used to test the electrical properties of power TWT
SJ 50597/31-1995 Semiconductor integrated circuits.Detail specification for type JC4007 CMOS dual complementary pair plus inverter and type JC4048 CMOS multi function expandable 8 input gate

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Half-wave plate function

GB/T 36356-2018 Technical specification for power light-emitting diode chips
GB/T 36357-2018 Technical specification for middle power light-emitting diode chips
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits--Letter symbols for function of pins
GB 3431.2-1986 Semiconductor integrated circuit word symbol lead-out function symbol
GB/T 20870.10-2023 Semiconductor Devices Part 16-10: Monolithic Microwave Integrated Circuit Technology Acceptable Procedures
GB/T 34590.11-2022 Road vehicles—Functional safety—Part 11: Guidelines on applications to semiconductors
GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells
GB/T 27582-2011 Optical functional films.Electromagnetic interference shielding film for plasma TV.Determination of shielding effectiveness
GB/T 17215.302-2013 Electricity metering equipment (a.c.).Particular requirements.Part 2:Static harmonic meters for active energy
GB/T 6882-2016 Acoustics.Determination of sound power levels and sound energy levels of noise sources using sound pressure.Precision methods for anechoic rooms and hemi-anechoic rooms
GB/T 15121.1-1994 Information processing systems--Computer graphics--Metafile for storage and transfer of picture description information--Part 1: Functional specification

Military Standard of the People's Republic of China-General Armament Department, Half-wave plate function

GJB 9393-2018 Calibration procedures for high power microwave energy meters
GJB 2076-1994 Functional characteristics of the adaptive controller of short wave adaptive communication system
GJB 3308-1998 Radar feeder subsystem performance test method Voltage standing wave ratio loss Rated power receiver end leakage power transmission phase

Korean Agency for Technology and Standards (KATS), Half-wave plate function

KS C IEC 61580-8-2014(2019) Methods of measurement for waveguides — Part 8: Waveguide power holding capability
KS C IEC 60229-2014(2019) Electric cables — Tests on extruded oversheaths with a special protective function
KS R ISO 26262-11:2021 Road vehicles — Functional Safety — Part 11: Guidelines on application of KS R ISO 26262 to semiconductors
KS C IEC 62053-24-2017(2022) Electricity metering equipment (a.c.) ― Particular requirements ― Part 24 : Static meters for reactive energy at fundamental frequency (classes 0,5 S, 1S and 1)
KS I ISO 3745:2022 Acoustics — Determination of sound power levels and sound energy levels of noise sources using sound pressure —Precision methods for anechoic rooms and hemi-anechoic rooms
KS C IEC 62148-9-2005(2020) Fibre optic active components and devices－Package and interface standards－Part 9：SFF MU duplex 10－pin transceivers
KS X ISO/IEC 8632-1:2007 Information technology-Computer graphics-Metafile for the storage and transfer of picture description information-Part 1:Functional specification
KS X ISO/IEC 8632-1:2013 Information technology－Computer graphics－Metafile for the storage and transfer of picture description information－Part 1：Functional specification

ES-UNE, Half-wave plate function

UNE-EN 61580-8:1996 METHODS OF MEASUREMENT FOR WAVEGUIDES. PART 8: WAVEGUIDE POWER HOLDING CAPABILITY. (Endorsed by AENOR in December of 1996.)
UNE-EN 61161:2013 Ultrasonics - Power measurement - Radiation force balances and performance requirements (Endorsed by AENOR in May of 2013.)
UNE-EN 60747-16-10:2004 Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)
UNE-EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions (Endorsed by AENOR in July of 2016.)
UNE-EN IEC 62053-24:2021/A11:2021 Electricity metering equipment - Particular requirements - Part 24: Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3) (Endorsed by Asociación Española de Normalización in September of 2021.)
UNE-EN IEC 62053-24:2021 Electricity metering equipment - Particular requirements - Part 24: Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3) (Endorsed by Asociación Española de Normalización in May of 2021.)

Professional Standard - Post and Telecommunication, Half-wave plate function

YD/T 4345-2023
YD/T 4344-2023
YD/T 4291-2023 Technical requirements for the interface between 5G network slice management function (NSMF) and bearer network slice subnet management function (TN-NSSMF) based on sliced packet network (SPN)
YD/T 4343-2023
YD/T 4293-2023 Technical Requirements for Transport Network Slicing Subnet Management Function (TN-NSSMF) Based on Sliced Packet Network (SPN)
YD/T 1350.1-2005 Technical specification of Wavelength Division Multiplexing (WDM) system network management interface Part 1:interface function part

TR-TSE, Half-wave plate function

TS 2048-1975 MEASUREMENT OF THE ELECTRICAL PROPERTIES OF MICROWAVE TUBES HIGH — POWER KLYSTRONS
TS 2047-1975 MEASUREMENT OF THE ELECTRICAL PROPERTIES OF MICRO W AVETUBES LOW — POWER OSCILLATOR KLYSTRONS

Association Standard-China Association for Standardization, Half-wave plate function

CAS 150-2007 Household Microwave Ovens.Requirements and Testing Methods for the Steaming Function

German Institute for Standardization, Half-wave plate function

DIN EN 61580-8:1997-05 Methods of measurement for waveguides - Part 8: Waveguide power holding capability (IEC 61580-8:1996); German version EN 61580-8:1996
DIN IEC 60235-6:1978 Measurement of the Electrical Properties of Microwave Tubes; Part 6: High Power Clystrons
DIN EN 60747-16-10:2005 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
DIN IEC 60235-6:1978-02 Measurement of the Electrical Properties of Microwave Tubes; Part 6: High Power Clystrons
DIN ETS 300581-1:1996-07 European digital cellular telecommunications system - Half rate speech - Part 1: Half rate speech processing functions; English version ETS 300581-1:1995
DIN V VDE V 0126-18-2-3:2007 Solar wafers - Part 2-3: Measuring the geometric dimensions of silicon wafers - Waviness and warping
DIN EN 60747-16-10:2005-03 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
DIN EN 61161:2013-11 Ultrasonics - Power measurement - Radiation force balances and performance requirements (IEC 61161:2013); German version EN 61161:2013 / Note: DIN EN 61161 (2007-09) remains valid alongside this standard until 2016-03-06.
DIN EN 61161:2007 Ultrasonics - Power measurement - Radiation force balances and performance requirements (IEC 61161:2006); German version EN 61161:2007
DIN EN 61391-1:2007 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response (IEC 61391-1:2006); German version EN 61391-1:2006
DIN V 6868-55:1996 Image quality assurance in X-ray diagnosis - Part 55 Acceptance testing in direct radiographic and fluoroscopic X-ray-systems including film processing
DIN 6867-2:1992 Image recording system consisting of a radiographic film, intensifying screens and a film cassette for use in medical diagnostics; evaluation of modulation transfer function
DIN ETS 300581-1:1996 European digital cellular telecommunications system - Half rate speech - Part 1: Half rate speech processing functions; English version ETS 300581-1:1995
DIN EN 62779-3:2017 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions (IEC 62779-3:2016); German version EN 62779-3:2016
DIN EN 61161:2013 Ultrasonics - Power measurement - Radiation force balances and performance requirements (IEC 61161:2013); German version EN 61161:2013
DIN 74080:1984 Coupling devices for articulated road trains; 50 semi-trailer fifth wheel coupling pin; functional and mounting dimensions, requirements
DIN 74083:1984 Coupling devices for articulated road trains; 90 semi-trailer fifth wheel coupling pin; functional and mounting dimensions, requirements
DIN EN 62555:2015 Ultrasonics - Power measurement - High intensity therapeutic ultrasound (HITU) transducers and systems (IEC 62555:2013); German version EN 62555:2014
DIN V VDE V 0831-101:2011 Electric signalling systems for railways - Part 101: Semi-quantitative processes for risk analysis of technical functions in railway signalling
DIN 74083:1984-01 Coupling devices for articulated road trains; 90 semi-trailer fifth wheel coupling pin; functional and mounting dimensions, requirements
DIN 74080:1984-01 Coupling devices for articulated road trains; 50 semi-trailer fifth wheel coupling pin; functional and mounting dimensions, requirements
DIN EN ISO 3745:2017-10 Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Precision methods for anechoic rooms and hemi-anechoic rooms (ISO 3745:2012 + Amd 1:2017); German version EN ISO 3745:2012 + A1:2017
DIN V 66291-1:2000 Chipcards with digital signatur application/function according to SigG and SigV - Part 1: Application interface
DIN V 66291-3:2003 Chip cards with digital signature application/function according to SigG and SigV - Part 3: Commands for personalisation
DIN V 66291-4:2002 Chip cards with digital signature application/function according to SigG and SigV - Part 4: Basic security services
DIN V 66291-2:2003 Chip cards with digital signature application/function according to SigG and SigV - Part 2: Personalisation processes

RU-GOST R, Half-wave plate function

GOST 26282-1984 Semiconductor power converters ranging to 5 kV·A. Parameters
GOST 25953-1983 Electric energy semiconductor converters of 5 kV·A power and above. Parameters
GOST 26830-1986 Semiconductor reformers of electroenergy with power including to 5 kV·A. General specifications
GOST 26118-1984 Electric energy semiconductor converters with power 5 kV·A and higher. Marking, packing, transportation and storage
GOST ISO 3745-2014 Acoustics. Determination of sound power levels and sound energy levels of noise sources using sound pressure - Precision methods for anechoic rooms and hemi-anechoic rooms
GOST R 50.05.05-2018 Conformity assessment system for the use of nuclear energy. Conformity assessment in the form of examination. Unified procedures. Ultrasonic examination of base materials (semi-finished products)

US-FCR, Half-wave plate function

FCR COE CERC-90-15 FINAL REPORT-1990 FUNCTIONAL DESIGN OF BREAKWATERS FOR SHORE PROTECTION: EMPIRICAL METHODS

SE-SIS, Half-wave plate function

SIS SEN R 41 03 01 Bilaga 4-1959
SIS SS-ISO 8632-1:1989 Information processing systems — Computer graphics — Metafile for the storage and transfer of picture description information — Part 1: Functional specification

Danish Standards Foundation, Half-wave plate function

DS/IEC/TS 62600-100:2012 Marine energy - Wave, tidal and other water current converters - Part 100: Electricity producing wave energy converters - Power performance assessment
DS/EN 61161:2008 Ultrasonics - Power measurement - Radiation force balances and performance requirements
DS/EN 61161:2013 Ultrasonics - Power measurement - Radiation force balances and performance requirements
DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
DS/ETS 300581-1:1996 European digital cellular telecommunications system - Half rate speech - Part 1: Half rate speech processing functions - (GSM 06.02)
DS/IEC/TS 62600-200:2013 Marine energy - Wave, tidal and other water current converters - Part 200: Electricity producing tidal energy converters - Power performance assessment
DS/EN ISO 3745:2012 Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Precision methods for anechoic rooms and hemi-anechoic rooms
DS/EN IEC 62053-24:2021 Electricity metering equipment – Particular requirements – Part 24: Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3)
DS/EN 28632-1:1994 Information technology. Computer graphics. Metafile for the storage and transfer of picture description information. Part 1: Functional specification
DS/ISO/IEC 8632-1/Corr. 2:2008 Information technology - Computer graphics - Metafile for the storage and transfer of picture description information - Part 1: Functional specification
DS/ISO/IEC 8632-1/Corr. 1:2008 Information technology - Computer graphics - Metafile for the storage and transfer of picture description information - Part 1: Functional specification
DS/ISO/IEC 8632-1:2000 Information technology - Computer graphics - Metafile for the storage and transfer of picture description information - Part 1: Functional specification

National Metrological Verification Regulations of the People's Republic of China, Half-wave plate function

JJG 1106-2015 Static Harmonic Meters of Active Electrical Energy for Working

European Committee for Electrotechnical Standardization（CENELEC）, Half-wave plate function

EN 61161:2007 Ultrasonics - Power measurement - Radiation force balances and performance requirements (Remains Current)
EN 61161:2013 Ultrasonics - Power measurement - Radiation force balances and performance requirements
EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
EN 62555:2014 Ultrasonics - Power measurement - High intensity therapeutic ultrasound (HITU) transducers and systems
EN 60747-16-10:2004 Semiconductor devices Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
EN 61391-1:2006 Ultrasonics - Pulse-echo scanners Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response

CENELEC - European Committee for Electrotechnical Standardization, Half-wave plate function

EN 61161:1998 Ultrasonic Power Measurement in Liquids in the Frequency Range 0.5 MHz to 25 MHz (Incorporates Amendment A1: 1998)
EN 61161:1994 Ultrasonic Power Measurement in Liquids in the Frequency Range 0.5 MHz to 25 MHz (IEC 1161:1992)

U.S. Air Force, Half-wave plate function

AIR FORCE A-A-50743 A VALID NOTICE 1-2012 Cleaner, Ultrasonic, with Rinse and Dry, 5.5 Gallon

Association of German Mechanical Engineers, Half-wave plate function

DVS 2216-1-1992 Ultrasonic joining of moulded parts and semi-finished parts of thermoplastic polymers in mass production - Machines and equipment - Function description and requirements
DVS 2216-1-1991

European Telecommunications Standards Institute (ETSI), Half-wave plate function

ETSI PRETS 300 966-1996 Digital Cellular Telecommunications System; Half Rate Speech; Half Rate Speech Processing Functions (GSM 06.02 Version 5.0.0)
ETSI ETS 300 966-1997 Digital Cellular Telecommunications System; Half Rate Speech; Half Rate Speech Processing Functions GSM 06.02 Version 5.0.1
ETSI PRETS 300 581-1-1995 European Digital Cellular Telecommunications System; Half Rate Speech Part 1: Half Rate Speech Processing Functions (GSM 06.02)
ETSI ETS 300 581-1-1995 European Digital Cellular Telecommunications System; Half Rate Speech Part 1: Half Rate Speech Processsing Functions (GSM 06.02; Version 4.0.2)
ETSI EN 300 966-2000 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech; Half Rate Speech Processing Functions (GSM 06.02 Version 8.0.1 Release 1999)
ETSI EN 300 966-1999 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech; Half Rate Speech Processing Functions GSM 06.02 Version 6.0.1 Release 1997
ETSI TS 146 002-2012 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions V11.0.0; 3GPP TS 46.002 version 11.0.0 Release 11
ETSI TS 146 002-2014 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions (V12.0.0; 3GPP TS 46.002 version 12.0.0 Release 12)
ETSI TS 146 002-2007 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions V7.0.0; 3GPP TS 46.002 version 7.0.0 Release 7
ETSI TS 146 002-2009 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions V8.0.0; 3GPP TS 46.002 version 8.0.0 Release 8
ETSI TS 146 002-2010 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions V9.0.0; 3GPP TS 46.002 version 9.0.0 Release 9
ETSI TS 146 002-2001 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech Processing Functions 3GPP TS 46.002 Version 4.0.0 Release 4
ETSI TS 146 002-2004 Digital cellular telecommunications system (Phase 2+); Half Rate Speech Processing Functions 3GPP TS 46.002 Version 6.0.0 Release 6
ETSI TS 146 002-2002 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech Processing Functions 3GPP TS 46.002 Version 5.0.0 Release 5
ETSI TS 146 002-2017 Digital cellular telecommunications system (Phase 2+) (GSM); Half rate speech; Half rate speech processing functions (V14.0.0; 3GPP TS 46.002 version 14.0.0 Release 14)

American National Standards Institute （ANSI), Half-wave plate function

ANSI C93.5-1997 Requirements for Single Function Power-Line Carrier Transmitter/Receiver Equipment
ANSI/EIA 321-C:1987 Numbering of Like-Named Terminal Functions in Semiconductor Devices and Designation of Units in Multiple-Unit Semiconductor Devices
ANSI N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
ANSI/IEEE 1585:2002 Guide for the Functional Specification of Medium Voltage (1 – 35 kV) Electronic Series Devices for Compensation of Voltage Fluctuations
ANSI/INCITS/ISO/IEC 8632-1:1999 Information Technology - Computer Graphics - Metafile for the Storage and Transfer of Picture Description Information - Part 1: Functional Specification

International Electrotechnical Commission (IEC), Half-wave plate function

IEC 61161:2006 Ultrasonics - Power measurement - Radiation force balances and performance requirements
IEC 61161:2013 Ultrasonics - Power measurement - Radiation force balances and performance requirements
IEC 60235-6:1972 Measurement of the electrical properties of microwave tubes. Part 6 : High-power klystrons
IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
IEC 60235-5:1972 Measurement of the electrical properties of microwave tubes. Part 5 : Low-power oscillator klystrons
IEC 62830-5:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
IEC 114/56/CD:2010 IEC/TS 62600-200: Marine energy - Wave, tidal and other water current converters - Part 200: Power performance assessment of electricity producing tidal energy converters
IEC 114/82/CD:2011 IEC/TS 62600-200, Ed. 1: Marine energy - Wave, tidal and other water current converters - Part 200: Power performance assessment of electricty producing tidal energy converters
IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
IEC TS 60747-19-2:2021 Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
IEC 63068-2:2019 Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
IEC 61391-1:2017 Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
IEC 61391-1:2006 Ultrasonics - Pulse echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
IEC 62830-8:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
IEC 63068-4:2022 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a comb

Lithuanian Standards Office , Half-wave plate function

LST ETS 300 966 Leid.1-2007 Digital cellular telecommunications system;Half rate speech;Half rate speech processing functions (GSM 06.02 version 5.0.1)
LST EN 61161-2007 Ultrasonics - Power measurement - Radiation force balances and performance requirements (IEC 61161:2006)
LST ETS 300 581-1 Leid.1-2007 European digital cellular telecommunications system;Half rate speech;Part 1: Half rate speech processing functions (GSM 06.02)
LST EN 300 966 V8.0.1-2007 Digital cellular telecommunications system (Phase 2+) (GSM);Half rate speech;Half rate speech processing functions (GSM 06.02 version 8.0.1 Release 1999)
LST EN 300 966 V6.0.1-2007 Digital cellular telecommunications system (Phase 2+) (GSM);Half rate speech;Half rate speech processing functions (GSM 06.02 version 6.0.1 Release 1997)
LST EN 60747-16-10-2004 Semiconductor devices. Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004)
LST EN IEC 62053-24/A11:2021 Electricity metering equipment - Particular requirements - Part 24: Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3)
LST EN ISO 3745:2012 Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Precision methods for anechoic rooms and hemi-anechoic rooms (ISO 3745:2012)

ETSI - European Telecommunications Standards Institute, Half-wave plate function

ETS 300 966-1997 Digital Cellular Telecommunications System; Half Rate Speech; Half Rate Speech Processing Functions (GSM 06.02 Version 5.0.1)
TS 146 002-2007 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions (V7.0.0; 3GPP TS 46.002 version 7.0.0 Release 7)
TS 146 002-2009 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions (V8.0.0; 3GPP TS 46.002 version 8.0.0 Release 8)
TS 146 002-2011 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions (V10.0.0; 3GPP TS 46.002 version 10.0.0 Release 10)
TS 146 002-2010 Digital cellular telecommunications system (Phase 2+); Half rate speech; Half rate speech processing functions (V9.0.0; 3GPP TS 46.002 version 9.0.0 Release 9)
ETSI EN 300 966:2000 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech; Half Rate Speech Processing Functions (GSM 06.02 Version 8.0.1 Release 1999)
TS 146 002-2017 Digital cellular telecommunications system (Phase 2+) (GSM); Half rate speech; Half rate speech processing functions (V14.0.0; 3GPP TS 46.002 version 14.0.0 Release 14)
TS 146 002-2018 Digital cellular telecommunications system (Phase 2+) (GSM); Half rate speech; Half rate speech processing functions (V15.0.0; 3GPP TS 46.002 version 15.0.0 Release 15)
TS 146 002-2001 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech Processing Functions (3GPP TS 46.002 Version 4.0.0 Release 4)
TS 146 002-2002 Digital Cellular Telecommunications System (Phase 2+); Half Rate Speech Processing Functions (3GPP TS 46.002 Version 5.0.0 Release 5)
TS 146 002-2004 Digital cellular telecommunications system (Phase 2+); Half Rate Speech Processing Functions (3GPP TS 46.002 Version 6.0.0 Release 6)
GR NFV-REL 010-2019 Network Functions Virtualisation (NFV) Release 3; Reliability; Report on NFV Resiliency for the Support of Network Slicing (V3.1.1)
GR NFV-EVE 012-2017 Network Functions Virtualisation (NFV) Release 3; Evolution and Ecosystem; Report on Network Slicing Support with ETSI NFV Architecture Framework (V3.1.1)

NEMA - National Electrical Manufacturers Association, Half-wave plate function

NEMA C93.5-1997 Requirements for Single Function Power-Line Carrier Transmitter/Receiver Equipment

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Half-wave plate function

JEDEC EIA-323-1966 Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices
JEDEC EIA-321-C-1987 Numbering of Like-Named Terminal Functions in Semiconductor Devices and Designation of Units in Multiple-Unit Semiconductor Devices

Japanese Industrial Standards Committee (JISC), Half-wave plate function

JIS R 1641:2007 Measurement method for dielectric of fine ceramic plates at microwave frequency
JIS C 6181:1995 Power and energy measuring detectors, instruments and equipment for laser radiation
JIS Z 8732:2021 Acoustics -- Determination of sound power levels and sound energy levels of noise sources using sound pressure -- Precision methods for anechoic rooms and hemi-anechoic rooms

Professional Standard - Radio Television Film, Half-wave plate function

GY/T 113-1993 Functional specifications for real-time control of medium wave, frequency modulation, and computers at television transmitting station

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., Half-wave plate function

ASHRAE 4109-1998 Ammonia Spray Evaporation Heat Transfer Performance of Single Low-Fin and Corrugated Tubes (RP-725)
ASHRAE DA-07-040-2007 A Semi-Automated Commissioning Tool for VAV Air-Handling Units: Functional Test Analyzer
ASHRAE 4671-2004 A Comparative Study of the Airside Performance of Winglet Vortex Generator and Wavy Fin-and-Tube Heat Exchangers

BE-NBN, Half-wave plate function

NBN 894-1971
NBN L 01-003-1989 Functional photometric charactéristics of transparent and translucent materials used in glazing and protected cultivation

工业和信息化部, Half-wave plate function

YD/T 2794.2-2015 Wavelength Division Multiplexing (WDM) Network Management Technical Requirements Part 2: NMS System Functions
YD/T 2794.3-2015 Wavelength Division Multiplexing (WDM) Network Management Technical Requirements Part 3: EMS-NMS Interface Function

Hebei Provincial Standard of the People's Republic of China, Half-wave plate function

DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication

International Organization for Standardization (ISO), Half-wave plate function

ISO 26262-11:2018 Road vehicles — Functional safety — Part 11: Guidelines on application of ISO 26262 to semiconductors
ISO/TR 19693:2018 Surface chemical analysis - Characterization of functional glass substrates for biosensing applications
ISO/IEC 8632-1:1999 Information technology - Computer graphics - Metafile for the storage and transfer of picture description information - Part 1: Functional specification
ISO 3745:2012/Amd 1:2017 Acoustics — Determination of sound power levels and sound energy levels of noise sources using sound pressure — Precision methods for anechoic rooms and hemi-anechoic rooms — Amendment 1
ISO/IEC 8632-1:1992 Information technology — Computer graphics — Metafile for the storage and transfer of picture description information — Part 1: Functional specification

Society of Automotive Engineers (SAE), Half-wave plate function

SAE ARINC791P2-1-2014 MARK I AVIATION KU-BAND AND KA-BAND SATELLITE COMMUNICATION SYSTEM PART 2 ELECTRICAL INTERFACES AND FUNCTIONAL EQUIPMENT DESCRIPTION

KR-KS, Half-wave plate function

KS R ISO 26262-11-2021 Road vehicles — Functional Safety — Part 11: Guidelines on application of KS R ISO 26262 to semiconductors
KS I ISO 3745-2016 Acoustics－Determination of sound power levels and sound energy levels of noise sources using sound pressure－Precision methods for anechoic rooms and hemi-anechoic rooms
KS I ISO 3745-2022 Acoustics — Determination of sound power levels and sound energy levels of noise sources using sound pressure —Precision methods for anechoic rooms and hemi-anechoic rooms

Institute of Electrical and Electronics Engineers (IEEE), Half-wave plate function

IEEE/ANSI C93.5-1997 American National Standard Requirements for Single Function Power-Line Carrier Transmitter/Receiver Equipment
IEEE Std C93.5-1997 American National Standard - Requirements for Single Function Power-Line Carrier Transmitter/Receiver Equipment
IEEE Std 1585-2002 IEEE Guide for the Functional Specification of Medium Voltage (1- 35kV) Electronic Series Devices for Compensation of Voltage Fluctuations

Taiwan Provincial Standard of the People's Republic of China, Half-wave plate function

CNS 13935-2-1997 Financial transaction cards-Messages between the integrated circuit card and the card accepting device Part 2:Functions
CNS 13935.2-1997 Financial transaction cards-Messages between the integrated circuit card and the card accepting device Part 2:Functions

ECIA - Electronic Components Industry Association, Half-wave plate function

506-1984 Dimensional and Functional Characteristics Defining Sockets for Leadless Type A Chip Carriers (.050 Spacing)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Half-wave plate function

IEEE 1585-2002 Guide for the Functional Specification of Medium Voltages (1-35 kV) Electronic Series Devices for Compensation of Voltage Fluctuations

IX-IX-IEC, Half-wave plate function

IEC TS 62903:2023 RLV Ultrasonics - Measurements of electroacoustical parameters and acoustic output power of spherically curved transducers using the self-reciprocity method
IEC TS 62903:2023 Ultrasonics - Measurements of electroacoustical parameters and acoustic output power of spherically curved transducers using the self-reciprocity method

IEC - International Electrotechnical Commission, Half-wave plate function

TS 62600-102-2016 Marine energy – Wave@ tidal and other water current converters – Part 102: Wave energy converter power performance assessment at a second location using measured assessment data (Edition 1.0)

国家市场监督管理总局、中国国家标准化管理委员会, Half-wave plate function

GB/T 41066.1-2021 Petroleum drilling and production equipment—Offshore semisubmersible drilling unit—Part 1：Functional configuration and design

ITU-T - International Telecommunication Union/ITU Telcommunication Sector, Half-wave plate function

ITU-T I.357-1996 B-ISDN Semi-Permanent Connection Availability - Series I: Integrated Services Digital Network Overall Network Aspects and Functions - Performance Objectives (Study Group 13)

Standard Association of Australia （SAA）, Half-wave plate function

AS 5336:2019 Acoustics — Determination of sound power levels and sound energy levels of noise sources using sound pressure — Precision methods for anechoic rooms and hemi — anechoic rooms

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Half-wave plate function

GB/T 17215.324-2017 Electricity metering equipment (a.c.)—Particular requirements—Part 24: Static meters for reactive energy at fundamental frequency (classes 0.5S,1S and 1)

International Telecommunication Union (ITU), Half-wave plate function

ITU-R BR.1531 FRENCH-2001 Exchange of Sound Programmes for Broadcast Use Recorded as Broadcast Wave Format Files on Compact and Digital Versatile Recordable Data Disks
ITU-T I.357-2000 B-ISDN semi-permanent connection availability Study Group 13

U.S. Military Regulations and Norms, Half-wave plate function

ARMY MIL-I-48331 A NOTICE 2-1997 INTEGRATED CIRCUIT, DIGITAL, CMOS, TIME BASE AND SPECIAL PURPOSE FUNCTION GENERATOR, MONOLITHIC, SILICON
ARMY MIL-I-48331 A VALID NOTICE 1-1988 INTEGRATED CIRCUIT, DIGITAL, CMOS, TIME BASE AND SPECIAL PURPOSE FUNCTION GENERATOR, MONOLITHIC, SILICON
ARMY MIL-I-48331 A (2)-1982 INTEGRATED CIRCUIT, DIGITAL, CMOS, TIME BASE AND SPECIAL PURPOSE FUNCTION GENERATOR, MONOLITHIC, SILICON
ARMY MIL-I-48331 A-1979 INTEGRATED CIRCUIT, DIGITAL, CMOS, TIME BASE AND SPECIAL PURPOSE FUNCTION GENERATOR, MONOLITHIC, SILICON

AENOR, Half-wave plate function

UNE-EN ISO 3745:2012 Acoustics - Determination of sound power levels and sound energy levels of noise sources using sound pressure - Precision methods for anechoic rooms and hemi-anechoic rooms (ISO 3745:2012)

American Society for Testing and Materials (ASTM), Half-wave plate function

ASTM E2063-00 Standard Practice for Calibration and Functionality Checks Used in Forensic Psychophysiological Detection of Deception (Polygraph) Examinations