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Basic method of testing

Basic method of testing, Total:61 items.

In the international standard classification, Basic method of testing involves: Components for electrical equipment, Electromechanical components for electronic and telecommunications equipment, Integrated circuits. Microelectronics, Quality, Metrology and measurement in general, Construction materials, Dentistry, Testing of metals.

FI-SFS, Basic method of testing

SFS 2866-1980

AENOR, Basic method of testing

UNE 33101-1:1973 TEST METHOD OF VINIC VINEGAR. DETERMINATION OF THE FUNDAMENTAL COMPONENTS.

RU-GOST R, Basic method of testing

GOST 28381-1989 Electromechanical components for electronic equipment. Basic testing procedures and measuring methods

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Basic method of testing

GB/T 14030-1992 General principles of measuring methods of timer circuits for semiconductor integrated circuits
GB 14030-1992 Basic principles of semiconductor integrated circuit time-based circuit testing methods
GB/T 14028-1992 General principles of measuring methods of analogue switches for semiconductor integrated circuits
GB 14028-2018 Basic principles of semiconductor integrated circuit analog switch test methods
GB/T 14029-1992 General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
GB 14029-1992 Basic principles of semiconductor integrated circuit analog multiplier testing methods
GB/T 6798-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage comparators
GB/T 4377-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
GB/T 14031-1992 General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
GB/T 14032-1992 General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
GB 14031-1992 Basic principles of semiconductor integrated circuit analog phase-locked loop testing methods
GB 14032-1992 Basic principles of digital phase-locked loop testing methods for semiconductor integrated circuits
GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
GB/T 14115-1993 General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
GB 3442-1986 Basic principles of semiconductor integrated circuit operational (voltage) amplifier testing methods
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semiconductor audio integrated circuits

Association Francaise de Normalisation, Basic method of testing

NF EN 61300-2-21:2010 Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes fondamentales d'essais et de mesures - Partie 2-21 : essais - Essai cyclique composite température/humidité
NF EN 61300-3-34:2009 Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes fondamentales d'essais et de mesures - Partie 3-34 : examens et mesures - Affaiblissement dû à l'accouplement de connecteurs quelconques.

Korean Agency for Technology and Standards (KATS), Basic method of testing

KS A ISO 5725-4:2012 Accuracy(trueness and precision) of measurement methods and results-Part 4:Basic methods for the determination of the trueness of a standard measurement method

International Organization for Standardization (ISO), Basic method of testing

ISO 5725-4:1994 Accuracy (trueness and precision) of measurement methods and results - Part 4: Basic methods for the determination of the trueness of a standard measurement method

Standard Association of Australia （SAA）, Basic method of testing

AS 1141.2:1999 Methods for sampling and testing aggregates - Basic testing equipment

Professional Standard - Electron, Basic method of testing

SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
SJ/T 10804-2000 Semiconductor integrated circuits.General principles of measuring methods for level translator
SJ/T 10805-2000 Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
SJ/T 10882-1996 Semiconductor integrated circuits - General principles of measuring methods for linear amplifiers
SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits
SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
SJ/T 10738-1996 Semiconductor integrated circuits - General principles of measuring methods for operational (voltage) amplifiers
SJ/T 10800-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for sense amplifiers
SJ/T 10802-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
SJ/T 10804-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator
SJ/T 10806-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for display drivers
SJ/T 11005-1996 Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits
SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
SJ/T 10401-1993 General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories
SJ 2480-1984 General principles of static measurement for D/A converters for hybrid integrated circuits
SJ/T 10402-1993 General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
SJ/T 10400-1993 General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
SJ/T 11004-1996 Semiconductor TV integrated circuits - General principles of measuring methods for picture channel circuits
SJ/T 10880-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
SJ 2481-1984 General principles of static measurement for A/D converters for hybrid integrated circuits
SJ/T 10879-1996 Semiconductor integrated audio circuits - General principles of measuring methods for audio preamplifiers
SJ/T 10427.1-1993 Grneral Principles of measuring methods of FM converter for semiconductor audio integrated circuits
SJ/T 10427.2-1993 General principles of measuring methods of intermediate-frequency amplifier for semiconductor audio integrated circuits
SJ/T 10881-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders

SE-SIS, Basic method of testing

SIS SS CECC 00009-1981 Basic specification: Basic testing procedures and measuring methods for electromechanical components

RO-ASRO, Basic method of testing

STAS 12743/6-1989 Electronical components tor electronic equipments PROCEDURES FOR BASIC TESTS AND MEASURING METHODS Climatical and welding tests

British Standards Institution (BSI), Basic method of testing

DD ISO/TS 11080:2009 Dentistry. Essential characteristics of test methods for the evaluation of treatment methods intended to improve or maintain the microbiological quality of dental unit procedural water
BS CWA 17793:2021 Test method for determination of the essential work of fracture of thin ductile metallic sheets

European Committee for Standardization (CEN), Basic method of testing

CWA 17793-2021 Test method for determination of the essential work of fracture of thin ductile metallic sheets
CWA 17793:2021 Test method for determination of the essential work of fracture of thin ductile metallic sheets