L50 光电子器件综合 标准查询与下载

NF C93-801-1:2009 光纤系统用半导体光电器件.第1部分:基本额定值及特性用规范模板

Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics.

BS EN 60904-7:2009 光电器件.第7部分:光电器件测量的光谱失谐修正的估算

This part of IEC 60904 describes the procedure for correcting the bias error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum and by the mismatch between the spectral responses (SR) of the reference cell and of the test specimen. The procedure applies only to photovoltaic devices linear in SR as defined in IEC 60904-10. This procedure is valid for single junction devices but the principle may be extended to cover multijunction devices. The purpose of this standard is to give guidelines for the correction of measurement bias, should there be a mismatch between both the test spectrum and the reference spectrum and between the reference device SR and the test specimen SR. Since a PV device has a wavelength-dependent response, its performance is significantly affected by the spectral distribution of the incident radiation, which in natural sunlight varies with several factors such as location, weather, time of year, time of day, orientation of the receiving surface, etc., and with a simulator varies with its type and conditions. If the irradiance is measured with a thermopile-type radiometer (that is not spectrally selective) or with a reference solar cell, the spectral irradiance distribution of the incoming light must be known to make the necessary corrections to obtain the performance of the PV device under the reference solar spectral distribution defined in IEC 60904-3. If a reference PV device or a thermopile type detector is used to measure the irradiance then, following the procedure given in this standard, it is possible to calculate the spectral mismatch correction necessary to obtain the short-circuit current of the test PV device under the reference solar spectral irradiance distribution included in Table 1 of IEC 60904-3 or any other reference spectrum. If the reference PV device has the same relative spectral response as the test PV device then the reference device automatically takes into account deviations of the real light spectral distribution from the standard spectral distribution, and no further correction of spectral bias errors is necessary. In this case, location and weather conditions are not critical when the reference device method is used for outdoor performance measurements provided both reference cell and test PV device have the same relative spectral response. Also, for identical relative SR’s, the spectral classification of the simulator is not critical for indoor measurements. If the performance of a PV device is measured using a known spectral irradiance distribution, its short-circuit current at any other spectral irradiance distribution can be computed using the spectral response of the PV test device.

Photovoltaic devices — Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices

BS EN 62007-1:2009 光纤系统用半导体光电子器件.基本等级和特性的规范模板

This part of IEC 62007 is a specification template for essential ratings and characteristics of the following categories of semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems: – semiconductor photoemitters; – semiconductor photoelectric detectors; – monolithic or hybrid integrated optoelectronic devices and their modules. The object of this performance specification template is to provide a frame for the preparation of detail specifications for the essential ratings and characteristics. Detail specification writers may add specification parameters and/or groups of specification parameters for particular applications. However, detail specification writers may not remove specification parameters specified in this standard.

Semiconductor optoelectronic devices for fibre optic system applications - Specification template for essential ratings and characteristics

ASTM E1830-09 测定光电压模数的机械一体性的标准试验方法

The useful life of photovoltaic modules may depend on their ability to withstand periodic exposure to high wind forces, cyclic loads induced by specific site conditions or shipment methods, high loads caused by accumulated snow and ice on the module surface, and twisting deflections caused by mounting to non-planar surfaces or structures. The effects on the module may be physical or electrical, or both. Most importantly, the effects may compromise the safety of the module, particularly in high voltage applications, or where the public may be exposed to broken glass or other debris. These test methods describe procedures for mounting the test specimen, conducting the prescribed mechanical tests, and reporting the effects of the testing. The mounting and fastening method shall comply with the manufacturer''s recommendations as closely as possible. If slots or multiple mounting holes are provided on the module frame for optional mounting point capability, the worst-case mounting positions shall be selected in order to subject the module to the maximum stresses. If an unframed module is being tested, the module shall be mounted in strict accordance with the manufacturer''s instructions using the recommended attachment clips, brackets, fasteners or other hardware, and tightened to the specified torque. The test specimen is mounted on a test base in a planar manner (unless specified otherwise), simulating a field mounting arrangement in order to ensure that modules are tested in a configuration that is representative of their use in the field. During the twist test, the module is mounted in a manner simulating a non-planar field mounting where one of the fastening points is displaced to create an intentional twist of 1.2°. Data obtained during testing may be used to evaluate and compare the effects of the simulated environments on the test specimens. These test methods require analysis of both visible effects and electrical performance effects. Effects on modules may vary from no changes to significant changes. Some physical changes in the module may be visible even though there are no apparent electrical performance changes. Conversely, electrical performance changes may occur with no visible change in the module. All conditions of measurement, effects of the test exposure, and any deviations from these test methods must be described in the report so that an assessment of their significance can be made. If these test methods are being performed as part of a combined sequence with other mechanical or nonmechanical tests, the results of the final electrical test (7.2) and visual inspection (7.3) from one test may be used as the initial electrical test and visual inspection for the next test; duplication of these tests is unnecessary unless so specified. Some module designs may not use any external metallic components and thus lack a ground point designation by the module manufacturer. In these cases, the ground path continuity test is not applicable.1.1 These test methods cover procedures for determining the ability of photovoltaic modules to withstand the mechanical loads, stresses and deflections used to simulate, on an accelerated basis, high wind conditions, heavy snow and ice accumulation, and non-planar installation effects. 1.1.1 A static load test to 2400 Pa is used to simulate wind loads on both module surfaces 1.1.2 A static load test to 5400 Pa is used to simulate heavy snow and ice accumulation on the module front surface. 1.1.3 A twist test is used to simulate the non-planar mounting of a photovoltaic module by subjecting it to a twist angle of 1.2

Standard Test Methods for Determining Mechanical Integrity of Photovoltaic Modules

IEC 60904-7:2008 光电器件.第7部分:光电器件的测量用光谱错配修正的计算

This part of IEC 60904 describes the procedure for correcting the bias error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum and by the mismatch between the spectral responses (SR) of the reference cell and of the test specimen. The procedure applies only to photovoltaic devices linear in SR as defined in IEC 60904-10. This procedure is valid for single junction devices but the principle may be extended to cover multijunction devices. The purpose of this standard is to give guidelines for the correction of measurement bias, should there be a mismatch between both the test spectrum and the reference spectrum and between the reference device SR and the test specimen SR. Since a PV device has a wavelength-dependent response, its performance is significantly affected by the spectral distribution of the incident radiation, which in natural sunlight varies with several factors such as location, weather, time of year, time of day, orientation of the receiving surface, etc., and with a simulator varies with its type and conditions. If the irradiance is measured with a thermopile-type radiometer (that is not spectrally selective) or with a reference solar cell, the spectral irradiance distribution of the incoming light must be known to make the necessary corrections to obtain the performance of the PV device under the reference solar spectral distribution defined in IEC 60904-3. If a reference PV device or a thermopile type detector is used to measure the irradiance then, following the procedure given in this standard, it is possible to calculate the spectral mismatch correction necessary to obtain the short-circuit current of the test PV device under the reference solar spectral irradiance distribution included in Table 1 of IEC 60904-3 or any other reference spectrum. If the reference PV device has the same relative spectral response as the test PV device then the reference device automatically takes into account deviations of the real light spectral distribution from the standard spectral distribution, and no further correction of spectral bias errors is necessary. In this case, location and weather conditions are not critical when the reference device method is used for outdoor performance measurements provided both reference cell and test PV device have the same relative spectral response. Also, for identical relative SR's, the spectral classification of the simulator is not critical for indoor measurements. If the performance of a PV device is measured using a known spectral irradiance distribution, its short-circuit current at any other spectral irradiance distribution can be computed using the spectral response of the PV test device.

Photovoltaic devices - Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices

IEC 62007-1:2008 纤维光学系统用半导体光电器件.第1部分:基本额定值及特性用规范模板

This part of IEC 62007 is a specification template for essential ratings and characteristics of the following categories of semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems: - semiconductor photoemitters; - semiconductor photoelectric detectors; - monolithic or hybrid integrated optoelectronic devices and their modules. The object of this performance specification template is to provide a frame for the preparation of detail specifications for the essential ratings and characteristics. Detail specification writers may add specification parameters and/or groups of specification parameters for particular applications. However, detail specification writers may not remove specification parameters specified in this standard.

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

IEC TR 62572-2:2008 纤维光学有源元件和装置.可靠性标准.第2部分:激光模块的衰变

This technical report deals with reliability assessment of laser modules used for telecommunication guidance on testing, use of failure criteria and reliability predictions is provided. This technical report provides guidance on: - the testing that a system supplier should ensure is in a place prior to procurement of a laser module from a laser module manufacturer; - a range of activities expected of a system supplier to verify a laser module manufacturer's reliability claims.

Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation

IEC 103/74/PAS:2008 IEC/PAS 62593:无线通信和广播系统中mach-zehnder光学调节器用半波长电压的测量方法

IEC/PAS 62593: Measurement method of a half-wavelength voltage for mach-zehnder optical modulator in wireless communication and broadcasting systems

GJB 6459-2008 1000nm-1100nm波段光纤器件回波损耗测量方法

本标准规定了1000nm-1100nm波段光纤器件回波损耗测量时所采用的测量方法。 本标准适用于1000nm-1100nm波段非保偏光纤器件回波损耗测量，不适用于该波段的保偏光纤器件的回波损耗测量。 其他波段光纤器件的回波损耗测量方法可参照本标准执行。

Measurement of return loss for 1000-1100 nanometer wavelength fiber devices

KS B ISO 14880-2:2008 光学和光子学.显微物镜系列.第2部分:波像差的试验办法

이 규격은 마이크로렌즈 어레이 내에 위치한 마이크로렌즈의 파면 수차를 측정하기 위한 방법을

Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations

KS B ISO 15902:2008 光学和光子学.衍射光学.词汇

이 규격은 자유공간 전파용 회절광학소자에 관한 기본 용어를 정의한다. 이 정의의 목적은 회

Optics and photonics-Diffractive optics-Vocabulary

ASTM E1799-08 光电模件可视检测的标准实施规程

Environmental stress tests, such as those listed in 1.2, are normally used to evaluate module designs prior to production or purchase. These test methods rely on performing electrical tests and visual inspections of modules before and after stress testing to determine the effects of the exposures. Effects of environmental stress testing may vary from no effects to significant changes. Some physical changes in the module may be visible when there are no measurable electrical changes. Similarly, electrical changes in the module may occur with no visible changes. It is the intent of this practice to provide a recognized procedure for performing visual inspections and to specify effects that should be reported. Many of these effects are subjective. In order to determine if a module has passed a visual inspection, the user of this practice must specify what changes or conditions are acceptable. The user may have to judge whether changes noted during an inspection will limit the useful life of a module design.1.1 This practice covers procedures and criteria for visual inspections of photovoltaic modules. 1.2 Visual inspections of photovoltaic modules are normally performed before and after modules have been subjected to environmental, electrical, or mechanical stress testing, such as thermal cycling, humidity-freeze cycling, damp heat exposure, ultraviolet exposure, mechanical loading, hail impact testing, outdoor exposure, or other stress testing that may be part of photovoltaic module testing sequence. 1.3 This practice does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this practice. 1.4 There is no similar or equivalent ISO standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Visual Inspections of Photovoltaic Modules

DIN EN 61730-2:2007 光电(PV)模件安全合格鉴定.第2部分:测试要求

Photovoltaic (PV) module safety qualification - Part 2: Requirements for testing (IEC 61730-2:2004, modified); German version EN 61730-2:2007

DIN EN 61730-1:2007 光电(PV)模件安全合格鉴定.第1部分:结构要求

Photovoltaic (PV) module safety qualification - Part 1: Requirements for construction (IEC 61730-1:2004, modified); German version EN 61730-1:2007

KS B ISO 11807-2:2007 集成光学.词汇.第2部分:分类用术语

이 규격은 집적광학 소자, 집적광학 칩, 집적광학 기기 등의 분류에서 사용되는 용어에 대하

Integrated optics－Vocabulary－Part 2：Terms used in classification

IEC 60747-5-5:2007 半导体装置.分立装置.第5-5部分:光电子装置.光电耦合器

This part of IEC 60747 gives the terminology，essential ratings，cha racteristics，safety tests as well as the measuring methods for photocouplers(or optocouplers)． NOTE The word“optocoupler”can also be used instead of“photocoupler”

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

NF C57-111-2:2007 光电器件(PV)模件安全合格鉴定.第2部分:测试要求

Photovoltaic (PV) module safety qualification - Part 2 : requirements for testing.

DIN EN 60904-1:2007 光电器件.第1部分:光电器件电流-电压特征测量(IEC 60904-1:2006)

Photovoltaic devices - Part 1: Measurement of photovoltaic current-voltage characteristics (IEC 60904-1:2006); German version EN 60904-1:2006

IEC 86/282/DTS:2007 IEC 62538 TS, Ed. 1.0:光学装置的分类

IEC 62538 TS, Ed. 1.0: Categorization of optical devices

JEDEC JESD79-3-2007 DDR3 SDRAM 标准

This document defines the DDR3 SDRAM specification, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this Specification is to define the minimum set of requirements for JEDEC compliant 512 Mb through 8 Gb for x4, x8, and x16 DDR3 SDRAM devices. This specification was created based on the DDR2 specification (JESD79-2) and some aspects of the DDR specification (JESD79). Each aspect of the changes for DDR3 SDRAM operation were considered and approved by committee ballot(s). The accumulation of these ballots were then incorporated to prepare this JESD79-3 specification, replacing whole sections and incorporating the changes into Functional Description and Operation.

DDR3 SDRAM Standard