L50 光电子器件综合 标准查询与下载

KS B ISO 14137:2012 机床.焊丝发电加工机的检查条件.术语及准确精密度的检查

이 표준은 KS B ISO 230-1과 KS B ISO 230-2, KS B ISO 230

Machine tools-Test conditions for wire electrical-discharge machines(wire EDM)-Terminology and testing of the accuracy

ASTM E1462-12 光电器件模块的完整性绝缘和连续地面路径的标准试验方法

The design of a photovoltaic module or system intended to provide safe conversion of the sun's radiant energy into useful electricity must take into consideration the possibility of hazard should the user come into contact with the electrical potential of the module. These test methods describe procedures for verifying that the design and construction of the module or system are capable of providing protection from shock through normal installation and use. At no location on the module should this electrical potential be accessible, with the obvious exception of the intended output leads. These test methods describe procedures for determining the ability of the module to provide protection from electrical hazards. These procedures may be specified as part of a series of qualification tests involving environmental exposure, mechanical stress, electrical overload, or accelerated life testing. These procedures are normally intended for use on dry modules; however, the test modules may be either wet or dry, as indicated by the appropriate protocol. These procedures may be used to verify module assembly on a production line. Insulation resistance and leakage current are strong functions of module dimensions, ambient relative humidity and absorbed water vapor, and the ground path continuity procedure is strongly affected by the location of contacts and test leads to the module frame and grounding points. For these reasons, it is the responsibility of the user of these test methods to specify the maximum acceptable leakage current for the dielectric voltage withstand test, and the maximum acceptable resistance for the ground path continuity procedure. Fifty μA has been commonly used as the maximum acceptable leakage current (see ANSI/UL 1703, Section 26.1), and 0.1 Ω has been commonly used as the maximum acceptable resistance. Some module designs may not use any external metallic components and thus lack a ground point designated by the module manufacturer. In these cases, the ground path continuity test is not applicable.1.1 These test methods cover procedures for (1) testing for current leakage between the electrical circuit of a photovoltaic module and its external components while a user-specified voltage is applied and (2) for testing for possible module insulation breakdown (dielectric voltage withstand test). 1.2 A procedure is described for measuring the insulation resistance between the electrical circuit of a photovoltaic module and its external components (insulation resistance test). 1.3 A procedure is provided for verifying that electrical continuity exists between the exposed external conductive surfaces of the module, such as the frame, structural members, or edge closures, and its grounding point (ground path continuity test). 1.4 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method. 1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Methods for Insulation Integrity and Ground Path Continuity of Photovoltaic Modules

ANSI/UL 48-2012 电光标志

Electric Signs

KS B ISO 15795:2011 光学和光子学.光学系统质量评定.彩色相差引起的图像质量下降的评定

이 표준은 색수차에 관련한 용어를 정의하고 용어 간 수학적인 관계를 규정한다.이 표

Optics and photonics-Quality evaluation of optical systems-Assessing the image quality degradation due to chromatic aberrations

KS B ISO 15529:2011 光学和光子学.光学转移函数.取样成像系统的调制传递函数(MTF)的测量原理

이 표준은 샘플링된 결상계와 관련한 주요 변조 전달 함수(MTF) 및 관련 용어를 규정하며

Optics and photonics-Optical transfer function-Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

KS B ISO 11810-2:2011 激光及激光相关装备.患者保护罩及手术帷帐的激光损害耐损性试验方法及分类.第2部分:2次点火

ISO 11810에서 이 표준은 직물 또는 직물이 아닌 물질로 레이저 빔에 대해 내성이 있

Lasers and laser-related equipment-Test method and classification for the laser-resistance of surgical drapes and/or patient-protective covers-Part 2:Secondary ignition

YD/T 2001.2-2011 用于光纤系统的半导体光电子器件 第2部分：测试方法

本部分规定了用于光纤系统或子系统的半导体光电子器件的测试方法。本部分适用于半导体光电子器件。

Semiconductor optoelectronic devices for fibre optic system applications.part 2:measuring methods

DIN EN 60747-5-5:2011 半导体设备.分离式元件.第5-5部分:光电元件.光融合元件(IEC 60747-5-5-2007);德文版本EN 60747-5-5-2011

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2007); German version EN 60747-5-5:2011

BS EN 60747-5-5:2011 半导体器件.分立器件.光电器件.光电耦合器

This part of IEC 60747 gives the terminology, essential ratings, characteristics, safety tests as well as the measuring methods for photocouplers (or optocouplers). NOTE The word “optocoupler” can also be used instead of “photocoupler”.

Semiconductor devices. Discrete devices. Optoelectronic devices. Photocouplers

KS B ISO 11884-2:2011 光学和光子学.立体显微镜的最低要求.第2部分:高性能显微镜

이 표준은 고성능 입체 현미경에 대한 최소 요구사항을 규정한다. 이 표준은 수술용 현미경에

Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes

KS B ISO 10934-2:2011 光学和光学仪器.显微镜学词汇.第2部分:光显微镜学的先进技术

이 표준은 고급 광현미경학 분야에서 사용하는 용어와 정의를 규정한다.

Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy

KS B ISO 14999-4:2011 光学和光子学.光学元件和光学系统的干涉仪测量.第4部分:KS B ISO 10110中指定公差的注释和评定

KS B ISO 14999 시리즈에서 이 표준은 광학 요소 측정과 관련된 간섭 데이터의 해

Optics and photonics-Interferometric measurement of optical elements and optical systems-Part 4:Interpretation and evaluation of tolerances specified in KS B ISO 10110

KS C IEC 60904-7:2010 光伏器件.第7部分:光电器件的测量用光谱错配修正的计算

이 표준은 시험 스펙트럼과 기준 스펙트럼 간의 불일치와, 기준 셀의 스펙트럼 응답(SR)과

Photovoltaic devices－Part 7：Computation of the spectral mismatch correction for measurements of photovoltaic devices

BS EN 60904-10:2010 光电设备.线性测量法

This part of IEC 60904 describes procedures used to determine the degree of linearity of any photovoltaic device parameter with respect to a test parameter. It is primarily intended for use by calibration laboratories, module manufacturers and system designers. Photovoltaic (PV) module and system performance evaluations, and performance translations from one set of temperature and irradiance conditions to another frequently rely on the use of linear equations (see IEC 60891 and IEC 61829). This standard lays down the linearity requirements and test methods to ensure that these linear equations will give satisfactory results. Indirectly, these requirements dictate the range of the temperature and irradiance variables over which the equations can be used. The methods of measurement described in this standard apply to all PV devices and are intended to be carried out on a sample or on a comparable device of identical technology. They should be performed prior to all measurement and correction procedures that require a linear device. The methodology used in this standard is similar to that specified in IEC 60891 in which a linear (straight-line) function is fitted to a set of data points using a least-squares fit calculation routine. The variation of the data from this function is also calculated, and the definition of linearity is expressed as an allowable variation percentage. A device is considered linear when it meets the requirements of 7.3. General procedures for determining the degree of linearity for these and any other performance parameter are described in Clauses 5 and 6.

Photovoltaic devices - Methods of linearity measurement

ASTM E1362-10 非集中光电二次标准电池校准的标准试验方法

The electrical output of photovoltaic devices is dependent on the spectral content of the source illumination and its intensity. To make accurate measurements of the performance of photovoltaic devices under a variety of light sources, it is necessary to account for the error in the short-circuit current that occurs if the relative spectral response of the primary reference cell is not identical to the spectral response of the cell to be calibrated. A similar error occurs if the spectral irradiance distribution of the test light source is not identical to the desired reference spectral irradiance distribution. These errors are accounted for by the spectral mismatch parameter M (Test Method E973), a quantitative measure of the error in the short-circuit current measurement. It is the intent of this test method to provide a recognized procedure for calibrating, characterizing, and reporting the calibration data for secondary photovoltaic reference cells. A secondary reference cell is calibrated to the same reference spectral irradiance distribution as the primary reference cell used during the calibration. Primary reference cells can be calibrated by use of Test Method E1125 or Test Method E1039. Note 18212;No standards for calibration of reference cells to the extraterrestrial spectral irradiance distribution presently exist. A secondary reference cell should be recalibrated yearly, or every six months if the cell is in continuous use outdoors. Recommended physical characteristics of reference cells are provided in Specification E1040. Because silicon solar cells made on p-type substrates are susceptible to a loss of Isc upon initial exposure to light, it is required that newly manufactured reference cells be light soaked at an irradiance level greater than 850 W/m2 for 2 h prior to initial charcterization in Section 7.1.1 This test method covers calibration and characterization of secondary terrestrial photovoltaic reference cells to a desired reference spectral irradiance distribution. The recommended physical requirements for these reference cells are described in Specification E1040. Reference cells are principally used in the determination of the electrical performance of a photovoltaic device. 1.2 Secondary reference cells are calibrated indoors using simulated sunlight or outdoors in natural sunlight by reference to a primary reference cell previously calibrated to the same desired reference spectral irradiance distribution. 1.3 Secondary reference cells calibrated according to this test method will have the same radiometric traceability as the of the primary reference cell used for the calibration. Therefore, if the primary reference cell is traceable to the World Radiometric Reference (WRR, see Test Method E816), the resulting secondary reference cell will also be traceable to the WRR. 1.4 This test method applies only to the calibration of a photovoltaic cell that demonstrates a linear short-circuit current versus irradiance characteristic over its intended range of use, as defined in Test Method E1143. 1.5 This te......

Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells

JIS C 5921:2009 单模尾光纤型固定衰减器

Single-mode fiber, pigtailed-style fixed optical attenuators

JIS C 5915:2009 单模尾光纤型光陀螺

Single-mode fiber, pigtailed-style optical circulators

DIN EN 60904-7:2009 光电设备.第7部分:光电器件测量的光谱失谐修正的估算(IEC 60904-7:2008),德文版本EN 60904-7:2009

Photovoltaic devices - Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices (IEC 60904-7:2008); German version EN 60904-7:2009

SJ/T 11405-2009 光纤系统用半导体光电子器件.第2部分:测量方法

本部分规定了用于光纤系统/子系统的半导体光电子器件的测量方法。

Semiconductor optoelectronic devices for fibre optic system applications.Part 2:Measuring methods

DIN EN 62007-1:2009 光纤系统应用的半导体光电装置.第1部分:基本速率和特性用规范模板(IEC 62007-1-2008).德文版本EN 62007-1-2009

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (IEC 62007-1:2008); German version EN 62007-1:2009