共找到 227 条与 半导体发光器件 相关的标准,共 16 页
LED modules for general lighting -- Performance requirements
This part of IEC 62341 specifies the standard measurement conditions and measuring methods for determining the image quality of organic light emitting diode (OLED) display panels and modules.
Organic light emitting diode (OLED) displays - Part 6-3: Measuring methods of image quality
本规范规定了LED显示屏的术语和定义、分类、检验方法、检验规则,以及标志、包装、运输和贮存要求。 本规范适用于点间距0.7mm以上的平板LED 显示屏产品。
LED Display Technical Specifications
This part of IEC 62341 specifies the standard measurement conditions and measuring methods for determining optical and electro-optical parameters of organic light-emitting diode (OLED) display modules and, where specified, OLED display panels. These methods are limited to flat displays measured in a dark room.
Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
This document specifies the performance requirements of OLED tiles and panels for use on DC supplies up to 120 V or AC supplies up to 50 V at 50 Hz or 60 Hz for indoor and similar general lighting purposes. NOTE In this current edition, life (life time and maintained values) is not addressed. This is intended to be covered in a future amendment.
Organic light emitting diode (OLED) panels for general lighting - Performance requirements
Semiconductor devices Part 6 : Discrete devices — Thyristors
Backlight components for liquid crystal displays Part 3-3: Blank detailed specification for LED backlight components for television receivers
SJ/T 11394-2009 "Semiconductor Light Emitting Diode Test Methods" Application Guide
Measurement methods for semiconductor infrared emitting diodes Part 14: Junction temperature
Semiconductor Laser Diode Test Methods
本部分规定了半导体红外发射二极管(以下简称器件)光电转换效率的测量原理图、测量步骤以及规定条件。 本部分适用于半导体红外发射二极管。
Measuring method for semiconductor infrared-emitting diode.Part 16: Photo-electric conversion efficiency
Measurement methods for semiconductor infrared emitting diodes Part 15: Thermal resistance
LED module accelerated life test method
Interface rules for LED modules (LED components) for general lighting
本部分规定了半导体红外发射二极管(以下简称器件)辐射功率的测量原理图、测量步骤以及规定条件。 本部分适用于半导体红外发射二极管。
Measuring method for semiconductor infrared-emitting diode.Part 6: Radiant power
本部分规定了半导体红外发射二极管(以下简称器件)峰值发射波长和光谱辐射带宽的测量原理图、测量步骤以及规定条件。 本部分适用于半导体红外发射二极管。
Measuring method for semiconductor infrared-emitting diode.Part 12: Peak-emission wavelength and spectral radiant bandwidth
本部分规定了半导体红外发射二极管(以下简称器件)响应时间的测量原理图、测量步骤以及规定条件。 本部分适用于半导体红外发射二极管。
Measuring method for semiconductor infrared-emitting diode.Part 11: Response time
本部分规定了半导体红外发射二极管(以下简称器件)辐射功率温度系数的测量原理图、测量步骤以及规定条件。 本部分适用于半导体红外发射二极管。
Measuring method for semiconductor infrared-emitting diode.Part 13: Temperature coefficient for radiant power
本部分规定了半导体红外发射二极管(以下简称器件)总电容的测量原理图、测量步骤以及规定条件。 本部分适用于半导体红外发射二极管。
Measuring method for semiconductor infrared-emitting diode.Part 4: Total capacitance
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