N33 电子光学与其他物理光学仪器 标准查询与下载

JJG 635-2011 一氧化碳、二氧化碳红外气体分析器检定规程

本规程适用于一氧化碳、二氧化碳红外气体分析器（以下简称仪器）的首次检定、后续检定和使用中检验。

Verification Regulation of Carbon Monoxide and Carbon Dioxide Infrared Gas Analyzer

JJF 1303-2011 雾度计校准规范

本规范适用于透明材料雾度测量的雾度计的校准。

Calibration Specification for Hazemeter

NF C93-845-2*NF EN 62150-2:2011 光谱分析仪校准.测试和测量规程.第2部分:无源光网络(ATM-PON)收发器

Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.

DIN EN ISO 25178-701:2011 产品几何量技术规范(GPS).表面结构:平面的.第701部分:接触式(触针)仪器的校准和测量标准(ISO 25178-701-2010);德文版本EN ISO 25178-701-2010

Geometrical product specifications (GPS) - Surface texture: Areal - Part 701: Calibration and measurement standards for contact (stylus) instruments (ISO 25178-701:2010); German version EN ISO 25178-701:2010

DIN EN ISO 25178-601:2011 产品几何技术规范(GPS).表面结构:平面的.第601部分:接触式(触针式)仪器的标称特性(ISO 25178-601-2010);德文版本EN ISO 25178-601-2010

This part of ISO 25178 defines the metrological characteristics of contact (stylus) areal surface texture measuring instruments.

Geometrical product specifications (GPS) - Surface texture: Areal - Part 601: Nominal characteristics of contact (stylus) instruments (ISO 25178-601:2010); German version EN ISO 25178-601:2010

ASTM E995-11 在俄歇电子能谱和X射线光电子能谱中应用背景消除技术的标准指南

Background subtraction techniques in AES were originally employed as a method of enhancement of the relatively weak Auger signals to distinguish them from the slowly varying background of secondary and backscattered electrons. Interest in obtaining useful information from the Auger peak line shape, concern for greater quantitative accuracy from Auger spectra, and improvements in data gathering techniques, have led to the development of various background subtraction techniques. Similarly, the use of background subtraction techniques in XPS has evolved mainly from the interest in the determination of chemical states (from the binding-energy values for component peaks that may often overlap), greater quantitative accuracy from the XPS spectra, and improvements in data acquisition. Post-acquisition background subtraction is normally applied to XPS data. The procedures outlined in Section 7 are popular in XPS and AES; less popular procedures and rarely used procedures are described in Sections 8 and 9, respectively. General reviews of background subtraction methods and curve-fitting techniques have been published (1-5). Background subtraction is usually done before peak fitting. Some commercial systems require background removal. Nevertheless, a measured spectral region consisting of one or more peaks and background intensities due to inelastic scattering, Bremsstrahlung (for XPS with unmonochromated X-ray sources), and scattered primary electrons (for AES) can often be satisfactorily represented by choosing functions for each intensity component with parameters for each component determined in a single least-squares fit. The choice of the background to be removed if required or desired before peak fitting is suggested by the experience of the analysts and the peak complexity as noted above.1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation. 1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). 1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

NF E05-031-701*NF EN ISO 25178-701:2010 产品几何技术规范(GPS).表面纹理:平面.第701部分:触点(探针)仪器用测量和校准标准

Geometrical product specifications (GPS) - Surface texture : areal - Part 701 : calibration and measurement standards for contact (stylus) instruments.

BS ISO 29301:2010 微光束分析.分析透射电子显微镜法.利用具有周期性结构的标准物质进行标定图像放大的方法

Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures

ISO 25498:2010 微光束分析.解析电子显微测定法.透射式电子显微镜对选定区域进行电子衍射分析

This International Standard specifies the method of selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse micrometer and sub-micrometer sized areas of thin crystalline specimens. Such specimens can be obtained in the form of thin sections from a variety of metallic and non-metallic materials, as well as fine powders, or alternatively by the use of extraction replicas. The minimum diameter of the selected area in a specimen which can be analysed by this method depends on the spherical aberration coefficient of the objective lens of the microscope and approaches 0,5 μm for a modern TEM. When the diameter of an analysed specimen area is smaller than 0,5 μm, the analysis procedure can also be referred to this International Standard but, because of the effect of spherical aberration, some of the diffraction information in the pattern can be generated from outside of the area defined by the selected-area aperture. In such cases, the use of microdiffraction or convergent beam electron diffraction, where available, might be preferred. The success of the selected-area electron diffraction method relies on the validity of indexing the diffraction patterns arising, irrespective of which axis in the specimen lies parallel to the incident electron beam. Such analysis is therefore aided by specimen tilt and rotation facilities. This International Standard is applicable to acquisition of SAED patterns from crystalline specimens, indexing the patterns and calibration of the diffraction constant.

Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

BS ISO 15472:2010 表面化学分析.X射线光电子分光计.能量等级的校准

Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

JB/T 9400-2010 X射线衍射仪 技术条件

本标准规定了多晶X射线衍射仪的技术要求、检验规则和试验方法等。 本标准适用于多晶X射线衍射仪。

Specification of X-ray diffractometer

JJG 976-2010 透射式烟度计检定规程

本规程适用于分流式透射式烟度计(以下简称烟度计)的首次检定、后续检定和使用中的检验。 型式评价中的主要计量性能的试验，可参照本规程执行。

Verification Regulation of Opacimeters

ASTM D6122-10 多变量联机和实验室基于红外分光光度计的分析仪系统的性能确认的标准实施规程

The primary purpose of this practice is to permit the user to validate numerical values produced by a multivariate, infrared or near-infrared laboratory or process (online or at-line) analyzer calibrated to measure a specific chemical concentration, chemical property, or physical property. The validated analyzer results are expected to be equivalent, over diverse samples whose spectra are neither outliers or nearest neighbor inliers, to those produced by the primary test method to within control limits established by control charts for the prespecified statistical confidence level. Procedures are described for verifying that the instrument, the model, and the analyzer system are stable and properly operating. A multivariate analyzer system inherently utilizes a multivariate calibration model. In practice the model both implicitly and explicitly spans some subset of the population of all possible samples that could be in the complete multivariate sample space. The model is applicable only to samples that fall within the subset population used in the model construction. A sample measurement cannot be validated unless applicability is established. Applicability cannot be assumed. Outlier detection methods are used to demonstrate applicability of the calibration model for the analysis of the process sample spectrum. The outlier detection limits are based on historical as well as theoretical criteria. The outlier detection methods are used to establish whether the results obtained by an analyzer are potentially valid. The validation procedures are based on mathematical test criteria that indicate whether the process sample spectrum is within the range spanned by the analyzer system calibration model. If the sample spectrum is an outlier, the analyzer result is invalid. If the sample spectrum is not an outlier, then the analyzer result is valid providing that all other requirements for validity are met. Additional, optional tests may be performed to determine if the process sample spectrum falls in a sparsely populated region of the multivariate space covered by the calibration set, too far from neighboring calibration spectra to ensure good interpolation. For example, such nearest neighbor tests are recommended if the calibration sample spectra are highly clustered. This practice does not define mathematical criteria to determine from a spectroscopic measurement of a sample whether the sample, the model, or the instrument is the cause of an outlier measurement. Thus the operator who is measuring samples on a routine basis will find criteria in the outlier detection method to determine whether a sample measurement lies within the expected calibration space, but will not have specific information as to the cause of the outlier without additional testing.1.1 This practice covers requirements for the validation of measurements made by laboratory or process (online or at-line) near- or mid-infrared analyzers, or both, used in the calculation of physical, chemical, or quality parameters (that is, properties) of liquid petroleum products. The properties are calculated from spectroscopic data using multivariate modeling methods. The requirements include verification of adequate instrument performance, verification of the applicability of the calibration model to the spectrum of the sample under test, and verification of equivalence between the result calculated from the infrared measurements and the result produced by the primary test method used for the development of the calibration model. When there is adequate variation in property level, the statistical methodology of Practice D6708 is used to provide general validation of this equivalence over the complete operating range of the analyzer. For cases where there is inadequate property variation, methodology for ......

Standard Practice for Validation of the Performance of Multivariate Online, At-Line, and Laboratory Infrared Spectrophotometer Based Analyzer Systems

JJG 939-2009 原子荧光光度计检定规程

本规程适用于用空心阴极灯做光源的非色散原理原子荧光光度计（以下简称仪器）的首次检定、后续检定和使用中检验。

Verification Regulation of Atomic Fluorescence Spectrophotometers

JJG 923-2009 啤酒色度仪检定规程

本规程适用于以EBC为色度单位的啤酒色度仪的首次检定、后续检定和使用中检验。

Verification Regulation of Beer Colorimeters

JJG 941-2009 荧光亮度检定仪检定规程

本规程适用于指针式和数字式荧光光度计检定仪（以下简称仪器）的首次检定、后续检定和使用中的检验。

Verification Regulation of Fluoresent Luminance Meter

JJG 694-2009 原子吸收分光光度计检定规程

本规程适用于锐线光源、原子吸收分光光度计(以下简称仪器)的首次检定、后续检定和使用中检验。仪器的型式评价中有关计量性能试验可参照本规程进行。

Verification Regulation of Atomic Absorption Spectrophotometers

ASTM E2719-09 荧光仪器校准和鉴定标准指南

By following the general guidelines (Section 5) and instrument calibration methods (Sections 6-16) in this guide, users should be able to more easily conform to good laboratory and manufacturing practices (GXP) and comply with regulatory and QA/QC requirements, related to fluorescence measurements. Each instrument parameter needing calibration (for example, wavelength, spectral responsivity) is treated in a separate section. A list of different calibration methods is given for each instrument parameter with a brief usage procedure. Precautions, achievable precision and accuracy, and other useful information are also given for each method to allow users to make a more informed decision as to which method is the best choice for their calibration needs. Additional details for each method can be found in the references given.1.1 This guide (1) lists the available materials and methods for each type of calibration or correction for fluorescence instruments (spectral emission correction, wavelength accuracy, and so forth) with a general description, the level of quality, precision and accuracy attainable, limitations, and useful references given for each entry. 1.2 The listed materials and methods are intended for the qualification of fluorometers as part of complying with regulatory and other quality assurance/quality control (QA/QC) requirements. 1.3 Precision and accuracy or uncertainty are given at a 1 σ confidence level and are approximated in cases where these values have not been well established. 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Fluorescencex2014;Instrument Calibration and Qualification

SANS 62129:2008 光学频谱分析仪的校正

Provides procedures for calibrating an optical spectrum analyzer designed to measure the power distribution of an optical spectrum. Equipped with an input port for use with a fibre-optic connector.

Calibration of optical spectrum analyzers

GJB/J 6221-2008 数字式激光平面干涉仪校准规范

本校准规范规定了数字式激光平面干涉仪的计量特性、校准条件、校准项目、校准项目、校准方法、校准结果的处理和复校时间间隔。 本校准规范适用于新制造（或新购置）、使用中、修理后的数字式激光平面干涉仪的校准。其他数字式激光干涉仪的校准也可参照执行。

Calibration specification for digital laster plane interferometer