ISO 18114 标准查询与下载

ISO 18114:2021 表面化学分析. 次级离子质谱法. 测定离子注入标样中的相对灵敏度系数

This document specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted

Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

ISO 18114:2003 表面化学分析.次级离子质谱法.测定离子注入标样中的相对灵敏度系数

This International Standard specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from

Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

AS ISO 18114:2006 表面化学分析．次级离子质谱法．植入离子的参考材料的相对灵敏系数的测定

Adopts ISO 18114:2003 to specify a method for determining relative sensitivity factors from ion-implanted reference materials

Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

BS ISO 18114:2021 表面化学分析 二次离子质谱 离子注入参考材料的相对灵敏度因子的测定

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

BS ISO 18114:2003 表面化学分析.次级离子质谱法.测定离子注入标样的相对灵敏系数

This International Standard specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from

Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

GSO ISO 18114:2013 表面化学分析 二次离子质谱 离子标准物质相对灵敏度因子的测定

This International Standard specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from

Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

KS D ISO 18114:2005 表面化学分析.次级离子质谱法.测定离子注入标样中的相对灵敏度系数

이 규격은 이온 주입된 기준 물질에서 이차 이온 질량 분광 분석(SIMS)을 위한 상대

Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

BH GSO ISO 18114:2016 表面化学分析 二次离子质谱 离子注入参比材料相对灵敏度因子的测定

Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

AS ISO 18114:2006(R2016) 表面化学分析 次级离子质谱法 植入离子的参考材料的相对灵敏系数的测定

Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

20/30409889 DC BS ISO 18114 表面化学分析 二次离子质谱 离子注入参考材料的相对灵敏度因子的测定

BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

KS D ISO 18114-2020 表面化学分析 二次离子质谱法 离子注入标准物质相对灵敏度因子的测定

Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

KS D ISO 18114-2005(2020) 表面化学分析二次离子质谱法离子注入标准物质相对灵敏度因子的测定

Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

DIN SPEC 18114:2019-04 DIN SPEC 18114:2019-04

ISO/IEC 27035 / ISO/IEC 27031 - Incident Managemen ISO/IEC 27035-1、ISO/IEC 27035-2 和 ISO/IEC 27031

ISO/IEC 27035-1, ISO/IEC 27035-2 and ISO/IEC 27031

KS X ISO 13928:2002 ISO 10755 ISO 10756 ISO 10757 ISO 10758和ISO 10759的应用指南

Application guide for ISO 10755, ISO 10756, ISO 10757,ISO 10758 and ISO 10759