BS ISO 17974:2002由英国标准学会 GB-BSI 发布于 2002-11-29，并于 2002-11-29 实施。
BS ISO 17974:2002 在中国标准分类中归属于: G04 基础标准与通用方法，在国际标准分类中归属于: 71.040.40 化学分析。
This International Standard specifies a method for calibrating the kinetic energy scales of Auger electron spectrometers used for elemental and chemical state analysis at surfaces. It also specifies a calibration schedule for testing the kinetic energy scale linearity at one intermediate energy, for confirming the uncertainty of the scale calibration at one low and one high kinetic energy value, for correcting for small drifts of that scale and for defining the expanded uncertainty of the calibration of the kinetic energy scale with a confidence level of 95 % (this uncertainty includes contributions for behaviours observed in interlaboratory studies but does not cover all possible defects). It is applicable only to those instruments incorporating an ion gun for sputter cleaning. It is not applicable to instruments with kinetic energy scale errors significantly non-linear with energy. Neither it is applicable to those instruments operated at relative resolutions poorer than 0,2 % in the constant △EIE mode or 1,5 eV in the constant △E mode, those requiring tolerance limits of ±0,05 eV or less, nor to those with an electron gun that cannot be operated in the energy range 5 keV to 10 keV. It does not provide a full calibration check for confirming the energy measured at each addressable point on the energy scale, this being performed according to the manufacturer's recommendations.
特点：在靠近表面5-20埃范围内化学分析的灵敏度高，很高的空间分辨率，最小可达到6nm；能探测周期表上He以后的所有元素及元素分布；通过成分变化测量超薄膜厚4.X射线光电子能谱（XPS）原理：激发源为X射线，用X射线作用于样品表面，产生光电子。通过分析光电子的能量分布得到光电子能谱研究样品表面组成和结构。...
Siegbahn教授研制出世界上第一台X射线光电子能谱仪（X-ray photoelectron spectroscopy,XPS），并因为对开发高分辨率电子光谱仪的贡献，获得1981年诺贝尔物理学奖。XPS可以通过测定电子结合能来分析化学键成键情况和元素价态等化学信息，是样品表面元素分析的常用表征手段，其在材料研究中的重要地位无需赘述，目前更是有每年超过12000篇包含XPS数据的论文被发表。...
原来将矿浆烘干磨细压片后的压片样和EDX直接分析的矿浆样如下图化学定值后建立工作曲线如下表 铜工作曲线实际样品直接分析比较将矿浆样品取出来将表面的水倒干净后，用玻璃棒将矿浆搅拌均匀，取出搅拌均匀后的矿浆放入样杯中，置样品室中使用上述工作条件直接进行分析。从白夜班化学分析的任意10个样品进行EDX分析。...
大多数分析元素均可用其进行分析，可分析固体、粉末、熔珠、液体等样品，分析范围为Be到U。并且具有分析速度快、测量范围宽、干扰小的特点。X光电子能谱仪X-射线光电子能谱仪，是一种表面分析技术，主要用来表征材料表面元素及其化学状态。...
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