ZH
RU
ES
semiconductor system
semiconductor system, Total:28 items.
In the international standard classification, semiconductor system involves: Semiconductor devices, Nuclear energy engineering, Integrated circuits. Microelectronics, Optoelectronics. Laser equipment, Fibre optic communications, Quality, Rectifiers. Convertors. Stabilized power supply.
Association Francaise de Normalisation, semiconductor system
- NF EN IEC 63364-1:2023 Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d'essai de détection de variation acoustique
- NF C53-228:1989 Semiconductor convertors. Switches for uninterruptible power systems (vps switches).
- NF C93-801-2*NF EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 : measuring methods
American National Standards Institute （ANSI), semiconductor system
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, semiconductor system
British Standards Institution (BSI), semiconductor system
- BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
- BS EN 62007-2:2000 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
- BS EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
- BS EN 62007-1:2000 Semiconductor optoelectronic devices for fibre optic system applications - Essential ratings and characteristics
- 21/30432536 DC BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system. Part 1. Test method of sound variation detection
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, semiconductor system
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 42835-2023 Semiconductor Integrated Circuit System on Chip (SoC)
- GB/T 10236-2006 Guide for compatibility and protection of interference effects between semiconductor convertors and power supply system
International Electrotechnical Commission (IEC), semiconductor system
- IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
- IEC 62007-2:1997 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
ES-UNE, semiconductor system
- UNE-EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
CH-SNV, semiconductor system
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, semiconductor system
- GB/T 36005-2018 Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
RU-GOST R, semiconductor system
- GOST 4.139-1985 System of product-quality indices. Semiconductor power converters. Nomenclature of indices
Professional Standard - Electron, semiconductor system
- SJ 20233-1993 Verification regulation of model IMPACT-II semiconductor discrete device test sysytem
- SJ/T 11405-2009 Semiconductor optoelectronic devices for fibre optic system applications.Part 2:Measuring methods
ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., semiconductor system
- ASHRAE 4513-2002 Application of 3C Duct Design Method in Semiconductor Factory Process Exhaust Systems
European Committee for Electrotechnical Standardization（CENELEC）, semiconductor system
- EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
CENELEC - European Committee for Electrotechnical Standardization, semiconductor system
- EN 62007-2:2000 Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 2: Measuring Methods
Korean Agency for Technology and Standards (KATS), semiconductor system
- KS C IEC 62007-2:2003 Semiconductor optoelectronic devices for fibre optic system applications － Part 2：Measuring methods