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Secondary Diffraction Analysis

Secondary Diffraction Analysis, Total:222 items.

In the international standard classification, Secondary Diffraction Analysis involves: Analytical chemistry, Particle size analysis. Sieving, Non-ferrous metals, Refractories, Air quality, Semiconducting materials, Products of the chemical industry, Vocabularies, Radiation protection, Inorganic chemicals, Optical equipment, Optics and optical measurements, Testing of metals, Occupational safety. Industrial hygiene, Ceramics, Construction materials, Paints and varnishes, Non-destructive testing, Power stations in general, Non-metalliferous minerals, Organic chemicals, Education, Paint ingredients, Raw materials for rubber and plastics, Television and radio broadcasting, Audio, video and audiovisual engineering, Radiocommunications.

PT-IPQ, Secondary Diffraction Analysis

E E 14-1971

Korean Agency for Technology and Standards (KATS), Secondary Diffraction Analysis

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
KS A ISO 13320:2014 Particle size analysis — Laser diffraction methods
KS A ISO 13320-1-2004(2009) Particle size analysis Laser diffraction methods - Part 1 General principles
KS M ISO 8130-13:2008 Coating powders－Part 13：Particle size analysis by laser diffraction
KS M ISO 8130-13:2019 Coating Powders — Part 13: Particle size analysis by laser diffraction
KS A ISO 13320-1:2004 Particle size analysis Laser diffraction methods - Part 1 General principles
KS A ISO 13320-1:2014 Particle size analysis Laser diffraction methods - Part 1 General principles
KS D ISO 17560-2003(2018)
KS E 3076-2002 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 14237-2003(2018)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Secondary Diffraction Analysis

GB/T 19077.1-2003 Particle size analysis--Laser diffraction method
GB/T 19077-2016 Particle size analysis.Laser diffraction methods
GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
GB/T 19077.1-2008 Particle size analysis.Laser diffraction methods.Part 1:General principles
GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
GB/T 21782.13-2009 Coating powders.Part 13:Particle size analysis by laser diffraction
GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 6609.32-2009 Chemical analysis methods and determination of physical performance of alumina.Part 32:Determination of а-alumina content by X-ray diffraction
GB/T 32495-2016 Surface chemical analysis.Secondary-ion mass spectrometry.Method for depth profiling of arsenic in silicon
GB/T 32698-2016 Rubber compounding ingredients.Determination of particle size distribution for silica, precipitated, hydrated.Laser diffraction
GB/T 26019-2010 Methods for chemical analysis of high impurity tungsten mineral.Determination of tungsten trioxide content.Twice separation and igniting gravimetric method

KR-KS, Secondary Diffraction Analysis

KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
KS M ISO 8130-13-2019 Coating Powders — Part 13: Particle size analysis by laser diffraction
KS D ISO 17560-2003(2023)
KS D ISO 14237-2003(2023)

Japanese Industrial Standards Committee (JISC), Secondary Diffraction Analysis

JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS K 0131:1996 General rules for X-ray diffractometric analysis
JIS Z 8825-1:2001 Particle size analysis -- Laser diffraction methods -- Part 1: General principles
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS A 1481-3:2014 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
JIS K 5600-9-3:2006 Testing methods for paints -- Part 9: Coating powders -- Section 3: Particle size analysis by laser diffraction
JIS A 1481-3 AMD 1:2022 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method (Amendment 1)
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers

Danish Standards Foundation, Secondary Diffraction Analysis

DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods
DS/EN ISO 8130-13:2011 Coating powders - Part 13: Particle size analysis by laser diffraction
DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

British Standards Institution (BSI), Secondary Diffraction Analysis

BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
19/30333249 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
BS ISO 13320-1:2000 Particle size analysis - Laser diffraction methods - General principles
BS EN ISO 8130-13:2010 Coating powders. Particle size analysis by laser diffraction
BS EN ISO 8130-13:2001 Coating powders. Particle size analysis by laser diffraction
BS ISO 16258-2:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Method by indirect analysis
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS ISO 13084:2018 Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS EN ISO 8130-13:2019 Tracked Changes. Coating powders. Particle size analysis by laser diffraction
BS EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - XRD methods
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 23703:2022 Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
BS ISO 16258-1:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Direct-on-filter method
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS 3900-J13:2001 Methods of test for paints - Testing of coating powders - Particle size analysis by laser diffraction
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
21/30395106 DC BS ISO 23703. Microbeam analysis. Guideline for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

German Institute for Standardization, Secondary Diffraction Analysis

DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN ISO 13320:2022 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN EN ISO 8130-13:2019-08 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2019); German version EN ISO 8130-13:2019
DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN 55912-2 Bb.1:1999 Pigments - Titanium dioxide pigments; methods of analysis - Examples using the X-ray fluorescence analysis to determine minor constituents
DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN ISO 8130-13:2019 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2019)
DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN 55912-2 Bb.2:1999 Pigments - Titanium dioxide pigments - Methods of analysis; establishing a calibration graph using the X-ray fluorescence analysis
DIN EN ISO 8130-13:2011 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2001); German version EN ISO 8130-13:2010

工业和信息化部, Secondary Diffraction Analysis

YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method
YS/T 1344.3-2020 Chemical analysis method of tin-doped indium oxide powder Part 3: Phase analysis X-ray diffraction analysis method

International Organization for Standardization (ISO), Secondary Diffraction Analysis

ISO 13320:2020 Particle size analysis — Laser diffraction methods
ISO 13320:2009 Particle size analysis - Laser diffraction methods
ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 13320-1:1999 Particle size analysis - Laser diffraction methods - Part 1: General principles
ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 8130-13:2001 Coating powders - Part 13: Particle size analysis by laser diffraction
ISO 8130-13:2019 Coating powders — Part 13: Particle size analysis by laser diffraction
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 22415:2019 Surface chemical analysis — Secondary ion mass spectrometry — Method for determining yield volume in argon cluster sputter depth profiling of organic materials
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers

Professional Standard - Ferrous Metallurgy, Secondary Diffraction Analysis

YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method

Association Francaise de Normalisation, Secondary Diffraction Analysis

NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
NF X11-666:1984 PARTICLE SIZE ANALYSIS OF POWDERS. DIFFRACTION METHOD.
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF T30-499-13*NF EN ISO 8130-13:2019 Coating powders - Part 13 : particle size analysis by laser diffraction
NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
NF EN ISO 8130-13:2019 Poudres pour revêtement - Partie 13 : analyse granulométrique par diffraction laser
NF T25-111-6:1991 Carbon fibres- Texture and structure- Part 6: Analysis of the selected area diffraction
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF ISO 16258-2:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 2 : méthode indirecte d'analyse
NF T25-111-3:1991 Carbon fibres- Texture and structure- Part 3: Azimutal analysis of the diffraction of the X-rays
NF T30-499-13:2011 Coating powders - Part 13 : particle size analysis by laser diffraction.
NF ISO 16258-1:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 1: méthode directe d'analyse sur filtre
NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
NF A09-285:1999 Non destructive testing - Test methods for residual stress analysis by X-ray diffraction
NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.
NF ISO 17560:2006 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage du bore dans le silicium par profilage d'épaisseur
NF ISO 23830:2009 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Répétabilité et constance de l'échelle des intensités relatives en spectrométrie statique de masse des ions secondaires
NF ISO 14237:2010 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément

American National Standards Institute （ANSI), Secondary Diffraction Analysis

ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment

国家市场监督管理总局、中国国家标准化管理委员会, Secondary Diffraction Analysis

GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 40109-2021 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Secondary Diffraction Analysis

GB/T 34172-2017 Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy

Standard Association of Australia （SAA）, Secondary Diffraction Analysis

AS 4863.1:2000 Particle size analysis - Laser diffraction methods - General Principles

Occupational Health Standard of the People's Republic of China, Secondary Diffraction Analysis

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

Guangdong Provincial Standard of the People's Republic of China, Secondary Diffraction Analysis

DB44/T 1078-2012 Laser Diffraction Method for Particle Size Analysis of Ceramic Raw Materials

ES-UNE, Secondary Diffraction Analysis

UNE-EN ISO 8130-13:2020 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2019)

CEN - European Committee for Standardization, Secondary Diffraction Analysis

EN ISO 8130-13:2019 Coating powders - Part 13: Particle size analysis by laser diffraction

European Committee for Standardization (CEN), Secondary Diffraction Analysis

EN ISO 8130-13:2010 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2001)
EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

RU-GOST R, Secondary Diffraction Analysis

GOST R ISO 16258-1-2017 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Part 1. Direct-on-filter method
GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Professional Standard - Petroleum, Secondary Diffraction Analysis

SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
SY/T 5163-2010 Analysis method for clay minerals and ordinary non-clay minerals in sedimentary rocks by the X-ray diffraction
SY/T 6210-1996 X-ray Diffraction Quantitative Analysis Method of Total Clay Minerals and Common Non-clay Minerals in Sedimentary Rocks

未注明发布机构, Secondary Diffraction Analysis

BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry

Lithuanian Standards Office , Secondary Diffraction Analysis

LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN ISO 8130-13:2011 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2001)

AENOR, Secondary Diffraction Analysis

UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
UNE-EN ISO 8130-13:2011 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2001)

Professional Standard - Electricity, Secondary Diffraction Analysis

DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction

Professional Standard - Customs, Secondary Diffraction Analysis

HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., Secondary Diffraction Analysis

ASHRAE CI-01-2-1-2001 Analysis of a Medium-Temperature Secondary Loop Refrigerating System

American Society for Testing and Materials (ASTM), Secondary Diffraction Analysis

ASTM E3294-22 Standard Guide for Forensic Analysis of Geological Materials by Powder X-Ray Diffraction
ASTM E3340-22 Standard Guide for Development of Laser Diffraction Particle Size Analysis Methods for Powder Materials
ASTM UOP709-70 Gas Analysis by Gas Chromatography Using a Two - Injection Technique
ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM C1365-06 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
ASTM C1365-06(2011) Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
ASTM C1365-98 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
ASTM C1365-98(2004) Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
ASTM C1365-18 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis

国家能源局, Secondary Diffraction Analysis

SY/T 5163-2018 X-ray diffraction analysis method of clay minerals and common non-clay minerals in sedimentary rocks

Professional Standard - Petrochemical Industry, Secondary Diffraction Analysis

SH/T 1612.8-2005 Purified terephthalic acid for industrial use - Determination of partical size distribution - Laser diffraction method

Professional Standard - Education, Secondary Diffraction Analysis

JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

International Telecommunication Union (ITU), Secondary Diffraction Analysis

ITU-R BT.1122-2011 User requirements for codecs for emission and secondary distribution systems for SDTV and HDTV
ITU-R BT.1122-1 FRENCH-1995 User Requirements for Emission and Secondary Distribution Systems for SDTV, HDTV and Hierarchical Coding Schemes Besoins des usagers pour les syst鑝es d'閙ission et de distribution secondaire de TVDN, TVHD et les sch閙as de codage hi閞archique
ITU-R BT.1122-1-1995 User Requirements for Emission and Secondary Distribution Systems for SDTV, HDTV and Hierarchical Coding Schemes

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector, Secondary Diffraction Analysis

ITU-R BT.1122-1994 User Requirements for Emission and Secondary Distribution Systems for SDTV@ HDTV and Hierarchical Coding Schemes
ITU-R BT.1122-3-2019 User requirements for codecs for emission and secondary distribution systems for SDTV@ HDTV@ UHDTV and HDR-TV

AIAG - Automotive Industry Action Group, Secondary Diffraction Analysis

MSA ERTA-2010 Measurement Systems Analysis (MSA) - Errata Sheet (Fourth Edition; Second Printing; Errata Sheet to MSA-4)

国家广播电影电视总局, Secondary Diffraction Analysis

GY/T 287-2014 Coding and decoding technical requirements for digital television signals during transmission and secondary distribution

Professional Standard - Aerospace, Secondary Diffraction Analysis

QJ 962-1986 材料测试

Professional Standard - Electron, Secondary Diffraction Analysis

SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
SJ/T 10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics
SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics