共找到 176 条与 半导体整流器件 相关的标准,共 12 页
Detail specification for 50-1000mA low current thyristors
Detail specification for silicon single phase bridge rectifiers,Type QL1-9 and QL21-28
Method of measurement for overload current multiplication factor of silicon single phase bridge rectifiers,up to 5A
Method of measurement for rated high-frequency on-state mean current Ir of reverse blocking high-frequency thyristors
Detail specification for reverse blocking high-frequency thyristors
Standard List of Values to be Used in Semiconductor Device Specifications and Registration Formats Revision of EIA RS-419-A formerly RS-419)
Standard List of Values to be Used in Semiconductor Device Specifications and Registration Formats Revision of EIA RS-419-A formerly RS-419) [Replaced: JEDEC EIA-419-A]
Detail specification for high-voltage silicon rectifier stacks,Type 2DL51~56 and 2CL51~56
This specification covers the detail requirements for a Silicon Avalenche Rectifier Diode and is in accordance with, K1007. Issue 3. except as otherwise stated.
Detail specification for silicon avalanche rectifier diode
Practices and requirements for thyristor converters and motor drives; part 1: converters for dc motor armature supplies
This specification covers the detail requirements for a Silicon, Stud Mounted, Power Rectifier Diode and is in accordance with Specification K1007, Issue 3 except as otherwise stated.
Detail specifications for silicon stud mounted, power rectifier diodes
This format is intended f o r the registration of semiconductor integrated bistable logic circ-dta including .monolithic, multichip, fihl 0 and hybrid bistable circuits,
Terminology and Methods of Measurement for Bistable Semiconductor Microcircuits
The shaded areas of the following S-curves indicate the range of spectral shapes which may be expeicft ead particular type photodetector is obtained from several different manufacturerIst. should be noted that the spectral responsoef some types of photodetectors (particularly the lead-salt and intrinsic silicon detectors) can be varied during the manufacturing process. The curves shown here are representative of the more common, or "typical," detector types.
Relative Spectral Response Curves for Semiconductor Infrared Detectors
This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a Natural-Air-Cooled environment where most (> 90%) of the power dissipation is obtained by convection and radiation losses from the body of the device.
Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices
Reliability assured reverse blocking triode thyristors (high and medium current)
Reliability assured reverse blocking triode thyristors (low current)
Testing methods for reverse blocking triode thyristors
Detail specification for silicon medium speed switching rectifier diodes,Type 2CZ314
Detail specification for silicon medium speed switching recitifier diodes,Type 2CZ304
Detail specification for silicon high speed switching rectifier diodes,Type 2CZ306
Detail specification for silicon high speed switching rectifier diodes,Type 2CZ307
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