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Semiconductor light agent

Semiconductor light agent, Total:499 items.

In the international standard classification, Semiconductor light agent involves: Optoelectronics. Laser equipment, Medical equipment, Semiconductor devices, Integrated circuits. Microelectronics, Optics and optical measurements, Fibre optic communications, Applications of information technology, Electronic components in general, Seals, glands, Semiconducting materials, Electrical accessories, Rectifiers. Convertors. Stabilized power supply, Vocabularies, Analytical chemistry, Environmental testing, Ceramics, Aircraft and space vehicles in general, Insulating fluids, Kitchen equipment, Products of the chemical industry, Inorganic chemicals, Materials for aerospace construction, Measurement of force, weight and pressure, Terminology (principles and coordination), Insulating materials, Radiation measurements, Lamps and related equipment, Graphical symbols, Electromechanical components for electronic and telecommunications equipment, Test conditions and procedures in general, Nuclear energy engineering, Products of non-ferrous metals.

British Standards Institution (BSI), Semiconductor light agent

BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS EN 62007-2:2000 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
BS EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
PD IEC TR 61292-9:2023 Tracked Changes. Optical amplifiers. Semiconductor optical amplifiers (SOAs)
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS ISO 17915:2018 Optics and photonics. Measurement method of semiconductor lasers for sensing
BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS EN 60747-5-5:2011 Semiconductor devices. Discrete devices. Optoelectronic devices. Photocouplers
BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
BS EN 62007-1:2000 Semiconductor optoelectronic devices for fibre optic system applications - Essential ratings and characteristics
BS IEC 60747-18-4:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
BS IEC 60747-18-2:2020 Semiconductor devices. Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
BS IEC 60747-18-5:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61207-7:2013 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
BS IEC 60747-1:2006+A1:2010 Semiconductor devices - General
PD IEC TR 60747-5-12:2021 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
BS IEC 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General
BS EN 62779-3:2016 Semiconductor devices. Semiconductor interface for human body communication. Functional type and its operational conditions
18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication
BS IEC 60747-18-3:2019 Semiconductor devices. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
BS IEC 60747-18-1:2019 Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
BS IEC 60747-5-8:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
13/30264596 DC BS EN 60747-14-7. Semiconductor devices. Part 14-7. Semiconductor sensor. Flow meter
18/30350443 DC BS EN 60747-5-5. Semiconductor devices. Part 5-5. Optoelectronic devices. Photocouplers
19/30392174 DC BS EN 60747-5-6. Semiconductor devices. Part 5-6. Optoelectronic devices. Light emitting diodes
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
BS EN IEC 62969-1:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
PD IEC TR 63378-1:2021 Thermal standardization on semiconductor packages. Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
BS IEC 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS EN 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods
BS EN 60749-18:2003 Semiconductor devices - Mechanical and climatic test methods - Ionizing radiation (total dose)
BS EN 62007-1:2009 Semiconductor optoelectronic devices for fibre optic system applications - Specification template for essential ratings and characteristics
BS EN 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications. Specification template for essential ratings and characteristics
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS 3934-1:1992 Mechanical standardization of semiconductor devices - Recommendations for the preparation of drawings of semiconductor devices
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
13/30264591 DC BS EN 60747-14-6. Semiconductor devices. Part 14-6. Semiconductor sensor. Humidity sensor
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films

Military Standard of the People's Republic of China-General Armament Department, Semiconductor light agent

GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
GJB 8121-2013 General specification for semiconductor optoelectronic assembly
GJB 8120-2013 General specification for semiconductor optoelectronic module
GJB 3519-1999 General Specification for Semiconductor Laser Diodes
GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
GJB 8119-2013 General specification for semiconductor optoelectronic device
GJB 2146A-2011 General specification for semiconductor light-emitting diode devices
GJB 8190-2015 General specification for semiconductor solid-state light sources for aircraft exterior lighting
GJB 33/20-2011 Semiconductor optoelectronic device.Detail specification for type GH302 photocoupler
GJB 33/22-2011 Semiconductor optoelectronic device.Detail specification for type GO103 photocoupler
GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
GJB 33/23-2011 Semiconductor optoelectronic device.Detail specification for type GH3201Z-4 photocoupler
GJB 33/19-2011 Semiconductor optoelectronic device.Detail specification for type GH302-4 photocoupler
GJB 5018-2001 General requirements for screening and acceptance of semiconductor optoelectronic devices
GJB 762.2-1989 Semiconductor device radiation hardening test method gamma total dose irradiation test

International Electrotechnical Commission (IEC), Semiconductor light agent

IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC TR 61292-9:2013 Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs)
IEC TR 61292-9:2023 RLV Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs)
IEC TR 61292-9:2023 Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs)
IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
IEC 62007-2:1997 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60747-5-6:2021 RLV Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
IEC 60747-14-3:2001 Semiconductor devices - Part 14-3: Semiconductor sensors; Pressure sensors
IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
IEC 62007-2:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60747-18-2:2020 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
IEC 60747-5-5:2007/AMD1:2013 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 60747-5-5:2013 Semiconductor devices.Discrete devices.Part 5-5: Optoelectronic devices.Photocouplers
IEC 60191-1:1966 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices
IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
IEC 60747-18-4:2023 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
IEC 60747-18-5:2023 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of lig
IEC 62007-2/AMD1:1998 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods; Amendment 1
IEC 62007-1:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
IEC 60747-5-5:2007+AMD1:2013 CSV Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
IEC 60747-18-3:2019 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor light agent

GB/T 15167-1994 General specification for light source of semiconductor lasers
GB/T 31358-2015 General specification for semiconductor lasers
GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
GB/T 31359-2015 Test methods of semiconductor lasers
GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
GB/T 15529-1995 Blank detail specification for LED numeric displays
GB/T 15649-1995 Blank detail specification for semiconductor laser diodes
GB/T 29299-2012 General specification of semiconductor laser rangefinder
GB/T 36356-2018 Technical specification for power light-emitting diode chips
GB/T 15651.6-2023 Semiconductor Devices Part 5-6: Optoelectronic Devices Light Emitting Diodes
GB/T 3859.2-1993 Semiconductor convertors.Application guide
GB/T 14264-1993 Semiconductor materials-Terms and definitions
GB/T 14264-2009 Semiconductor materials-Terms and definitions
GB/T 36357-2018 Technical specification for middle power light-emitting diode chips
GB/T 21548-2008 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
GB/T 20522-2006 Semiconductor devices. Part 14-3: Semiconductor sensors. Pressure sensors
GB/T 20521-2006 Semiconductor devices. Part 14-1: Semiconductor sensors. General and classification
GB/T 29856-2013 Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
GB/T 36359-2018 Semiconductor optoelectronic devices.Blank detail specification for lower power light-emitting diodes
GB/T 36360-2018 Semiconductor optoelectronic devices.Blank detail specification for middle power light-emitting diodes
GB/T 12565-1990 Semiconductor devices--Sectional specification for optoelectronic devices
GB/T 31469-2015 Semiconductor materials cutting fluid
GB/T 8750-1997 Gold wire for semiconductor devices lead bonding
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 7678-1987 Semiconductor self-commutated convertors
GB/T 15872-2013 Power supply interface for semiconductor equipment
GB/T 3859.4-2004 Semiconductor converter-Self-commutated semiconductor converters including direct d.c.converters
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 8750-2014 Gold bonding wire for semiconductor package
GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions

Group Standards of the People's Republic of China, Semiconductor light agent

T/CASME 698-2023 Semiconductor laser therapy apparatus
T/JGXH 008-2020 Diode pump solid state laser
T/QGCML 2041-2023
T/QGCML 1407-2023 Double sleeve sealing device for semiconductor photovoltaic manufacturing
T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment
T/JSXH 0002-2020 Regeneration solution for semiconductor
T/CASAS 002-2021 Terminology for wide bandgap semiconductors
T/CEMIA 030-2022 Positive Resist Developer for Semiconductors

Jilin Provincial Standard of the People's Republic of China, Semiconductor light agent

DB22/T 2725-2017 980 nm fiber grating semiconductor laser

RU-GOST R, Semiconductor light agent

GOST 24458-1980 Semiconductor optoelectronic couplers. Essential parameters
GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
GOST 27299-1987 Semiconductor optoelectronic devices. Terms, definitions and letter symbols of parameters
GOST R 59605-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Terms and definitions
GOST 17704-1972 Semiconductor devices. Photoelectric receivers of radiant energy. Classification and system designations
GOST 21934-1983 Semiconducting photoelectric detectors and receiving photoelectric devices. Terms and definitions
GOST 20766-1975 Ionizing radiation semiconductor spectrometer detectors. Types and basic parameters
GOST R 57439-2017 Semiconductor devices. Basic dimensions
GOST 11630-1984 Semiconductor devices. General specification
GOST 18472-1988 Semiconductor devices. Basic dimensions
GOST R IEC 61674-2006 Medical electrical equipment. Dosimeters with ionization chambers and/or semi-conductor detectors as used in X-ray diagnostic imaging
GOST 17772-1988 Semiconducting photoelectric detectors and receiving photoelectric devices. Methods of measuring photoelectric parameters and determining characteristics

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Semiconductor light agent

GB/T 15651.4-2017 Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers
GB/T 34971-2017 Guide for gaseous effluent handling in semiconductor industry
GB/T 36005-2018 Measuring methods of optical radiation safety for semiconductor lighting equipments and systems

Professional Standard - Electron, Semiconductor light agent

SJ 50033/109-1996 Semiconductor optoelectronic devices.Detail specification for types GJ9031T and GJ9032T and GJ9034T semiconductor laser diodes
SJ/T 11397-2009 Phosphors for light emitting diodes
SJ 20642-1997 Semiconductor opto-electronic module General specification for
SJ 20786-2000 General specification for semiconductor opto-electronic assembly
SJ 2218-1982 Semiconductor photocouplers in the diode mode
SJ 2219-1982 Semiconductor photocouplers in the transistor mode
SJ 20072-1992 Detail specification for semiconductor opto-couplers for type GH24,GH25 and GH26
SJ 2220-1982 Semiconductor photocouplers in the Darlington transistor mode
SJ 2558-1984 Detail specification for semiconductor light emitting numeric displays,Type SM1~18
SJ 2684-1986 Physical Demensions For Light Emitting Device Of Semiconductor
SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
SJ 2749-1987 Method of measurement for semiconductor laser diodes
SJ 2750-1987 Outline dimensions for semiconductor laser diodes
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors
SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes
SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
SJ/T 11856.3-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 3: Electric Absorption Modulated Semiconductor Laser Chips for Light Sources
SJ 2355.1-1983 General procedures of measurement for light-emitting deivces
SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
SJ/T 11856.2-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 2: Vertical Cavity Surface Emitting Semiconductor Laser Chips for Light Sources
SJ 50033.40-1994 Detail specification for type GT11 semiconductor sililcon NPN photo-transistor
SJ 50033/4-1994 Semiconductor discrete device.Detail specification for semiconductor red light emitting diodes for type GF 111 of GP and GT classes
SJ 50033/6-1994 Semiconductor discrete device.Detail specification for semiconductor light green emitting diodes for type GF 411 of GP and GT classes
SJ 50033/5-1994 Semiconductor discrete device.Detail specification for semiconductor yellow light emitting diodes for type GF 311 of GP and GT classes
SJ 50033/3-1994 Semiconductor discrete device.Detail specification for semiconductor opto-couplers for type GH21,GH22 and GH23 of GP,GT and GCT classes
SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors
SJ 20642.5-1998 Semiconductor optoelectronic module Detail specification for type GH82 opto-couplers
SJ 20642.4-1998 Semiconductor optoelectronic module Detail specification for type GH81 opto-couplers
SJ 20642.6-1998 Semiconductor opto-electronic module Detail specification for type GH83 opto-couplers
SJ/T 11402-2009 Technical specification of semiconductor laser chip used in optical fiber communication
SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
SJ/T 11401-2009 Series program for semiconductor light emitting diodes
SJ 50033/111-1996 Semiconductor optoelectronic devices.Delail specification for type GT16 Si.NPN phototransistor
SJ 2355.5-1983 Method of measurement for luminous intensity and half-intensity angle of light-emitting devices
SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
SJ 50033/101-1995 Detail specification for semiconductor laser diode modules for type GJ1325
SJ 50033/35-1994 Detail specification for type GH30 semiconductor high speed optocoupler
SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices
SJ/T 11856.1-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 1: Fabry-Perot Type and Distributed Feedback Type Semiconductor Laser Chips for Light Sources
SJ 50033/112-1996 Scmiconductor optoelectronic devices.Detail specification for type GD3251Y photodiodes
SJ 2355.6-1983 Method of measurement for luminous flux of light-emitting devices
SJ 50033/113-1996 Semiconductor optoelectronic devices.Detail specification for type GD3252Y photodiodes
SJ 2433-1984 Bonding sheet for semiconductor tubes
SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes
SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes
SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors
SJ 2658.1-1986 Methods of measurement for semiconductor infrared diodes General rules
SJ/T 11398-2009 Technical specification for power light-emitting diode chips
SJ 20642.3-1998 Semiconductor opto-electronic module Detail specification for type GD83 PIN-FET opto-receiver module
SJ 20644.1-2001 Semiconductor optoelectronic devices Detail specification for type GD3550Y PIN photodiode
SJ 20644.2-2001 Semiconductor optoelectronic devices Detail specification for type GD101 PIN photodiode
SJ 20642.2-1998 Semiconductor opto-electronic module Detail specification for type GD82 PIN-FET opto-receiver module
SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
SJ/T 11395-2009 Semiconductor lighting terminology
SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes
SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors
SJ 20957-2006 General specification for large power semiconductor laser diode array
SJ 20786.1-2002 Semiconductor photoelectric assembly Detail specification for miniature duplex photoelectric localizer for type CBGS 2301
SJ 50033/136-1997 Semiconductor optoelectronic devices.Detail specification for red light emitting diode for type GF116
SJ 50033/143-1999 Semiconductor optoelectronic devices.Detail specification for type GF1120 red emitting diode
SJ 50033/137-1997 Semiconductor optoelectronic devices.Detail specification for orange-red light emitting diode for type GF216
SJ 20642.1-1998 Semiconductor opto-electronic module Detail specification for type GD81 PIN-FET opto-receiver module
SJ/T 11405-2009 Semiconductor optoelectronic devices for fibre optic system applications.Part 2:Measuring methods
SJ 50033/139-1998 Semiconductor optoelectronic devices.Detail specification for green light-emitting diode for type GF4111
SJ 50033/138-1998 Semiconductor optoelectronic devices.Detail specification for yellow light-emitting diode for type GF318
SJ 50033/58-1995 Semiconductor optoelectronic device Detail specification for green light emitting diode for type GF413
SJ/T 11393-2009 Semiconductor optoelectronic devices-Blank detail specification for power light-emitting diodes
SJ 50033/142-1999 Semiconductor optoelectronic devices.Detail specification for type GF4112 green emitting diode
SJ 50033/57-1995 Semiconductor optoelectronic device Detail specification for red light emitting diode for type GF115
SJ/T 11866-2022 Semiconductor optoelectronic devices - Detailed specifications for silicon substrate white light power light emitting diodes
SJ/T 11400-2009 Semiconductor optoeletronic devices-Blank detail specification for lower-power light-emitting diodes
SJ 2215.6-1982 Method of measurement for junction capacitance of semiconductor photocouplers (diodes)
SJ 2215.8-1982 Method of measurement for output saturation voltage of semiconductor photocouplers (diodes)
SJ/T 10414-2015 Solder for semiconductor device
SJ/T 10414-1993 Solder for semicoductor device
SJ/T 10535-1994 Tungsten boat for semiconductor devices
SJ 50033/99-1995 Semiconductor optoelectronic devices.Detail specification for o/G double colour light emitting diode for type GF511
SJ 20642.7-2000 Semiconductor opto-electronic devices Detail specification for type GR1325J light emitting diode module
SJ/T 11817-2022 Blank detailed specification for light-emitting diodes for semiconductor optoelectronic devices, filament lamps
SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
SJ 2215.14-1982 Method of measurement for input-to-output isolation voltage of semiconductor photocouplers
SJ 2215.3-1982 Method of measurement for forward current of semiconductor photocouplers (diodes)
SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes
SJ 2215.4-1982 Method of measurement for reverse current of semiconductor photocouplers (diodes)
SJ 2215.10-1982 Method of measurement for direct current transfer ratio of semiconductor photocouplers
SJ 2215.12-1982 Method of measurement for input-to-output capacitance of semiconductor photocouplers
SJ 50033/114-1996 Semiconductor optoelectronic devices.Detail specification for type GD3283Y position sensitive detector
SJ 2215.2-1982 Method of measurement for forward voltage of semiconductor photocouplers (diodes)
SJ 2215.13-1982 Method of measurement for input-to-output isolation resistance of semiconductor photocouplers
SJ 2355.4-1983 Methods of measurement for junction capacitance of light-emitting devices
SJ/Z 9021.1-1987 Mechanical standardization of semiconductor components Part 1 Preparation of drawings of semiconductor components
SJ 2658.6-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power
SJ 2355.3-1983 Method of measurement for reverse current of light-emitting devices
SJ 2355.2-1983 Method of measurement for forward voltage drop of light-emitting devices
SJ 50033/140-1999 Semiconductor discrete devices Detail specification for type 3DA502 silicon microwave pulse power transistor

Fujian Provincial Standard of the People's Republic of China, Semiconductor light agent

DB35/T 1193-2011 Semiconductor LED chip

Taiwan Provincial Standard of the People's Republic of China, Semiconductor light agent

CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
CNS 7011-1981 Numbering of Electrodes in Multiple Electrode Semiconductor Devices and Designation of Units in Multiple Unit Semiconductor Devices

HU-MSZT, Semiconductor light agent

IET - Institution of Engineering and Technology, Semiconductor light agent

DISTRB FEEDB SEMI LAS-1998 Distributed Feedback Semiconductor Lasers
HIST WLD SEMI IND-1990 A History of the World Semiconductor Industry

Korean Agency for Technology and Standards (KATS), Semiconductor light agent

KS C 6942-1999 General rule of laser diode modules for fiber optic transmission
KS C 6943-1999 Test methods of laser modules for fiber optic transmission
KS C IEC 62007-2:2003 Semiconductor optoelectronic devices for fibre optic system applications － Part 2：Measuring methods
KS C IEC 60747-5:2020 Semiconductor devices — Discrete devices —Part 5: Optoelectronic devices
KS C IEC 60747-14-1:2003 Semiconductor devices－Part 14－1：Semiconductor sensors－General and classification
KS C IEC 60747-14-1:2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors
KS C IEC 62007-2-2003(2018)
KS C IEC 60747-14-1:2019 Semiconductor devices — Part 14-1: Semiconductor sensors —Generic specification for sensors
KS C 7013-1971(2000) TYPE DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
KS C 7013-1985 TYPE DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
KS C IEC 62007-1:2003 Semiconduct optoelectronic devices for fibre optic system applications ? Part 1：Essential ratings and characteristics

Professional Standard - Medicine, Semiconductor light agent

YY 1289-2016 Laser Therapy Equipment Ophthalmic Diode Laser Photocoagulation Instrument
YY 0845-2011 Laser therapeutic equipment.Diode laser equipment for photodynamic therapy
YY/T 0998-2015 Semiconductor heating and/or cooling therapy equipment

CZ-CSN, Semiconductor light agent

CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
CSN 35 8701 Z1-1997
CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
CSN 35 1531-1973 Silicon semiconductor rectifiers
CSN 35 1530-1979 Power semiconductor converters
CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance
CSN 01 3347-1989 Graphical symbols for semiconductor devices
CSN 34 5910-1986 Gold bonding wire for semiconductor devices
CSN 01 3368-1990 Graphical symbols for semiconductor devices
CSN 35 8851-1987 Semiconductor optoelectronic devices. Nomenclature, definition and letter symbols of parameters
CSN 35 8804-1985 Semiconductor optoelectronic devices for widely u?ed equipments. General specifications
CSN 35 1540-1979 Tests of power semiconductor converters
CSN 35 8710-1975 Letter symbols for semiconductor devices
CSN 35 1560-1969 Power semiconductor Rectifiers

Defense Logistics Agency, Semiconductor light agent

DLA MIL-PRF-19500/210 B NOTICE 1-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, PHOTO TYPE 2N986
DLA MIL-PRF-19500/467 A-2008 SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING, TYPE 1N5765 JAN AND TX
DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
DLA DESC-DWG-84002-1984 HEAT SINKS FOR SEMICONDUCTOR DEVICES
DLA MIL-PRF-19500 N-2005 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
DLA MIL-S-19500/529 VALID NOTICE 4-2011 Semiconductor Device, Transistor, Silicon Type 2N3904
DLA QML-19500-31-2007 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
DLA QML-19500-QPD-2010 Semiconductor Devices, General Specification for
DLA QML-19500-QPD-2011 Semiconductor Devices, General Specification for
DLA QML-19500-2011 Semiconductor Devices, General Specification for
DLA QML-19500-QPD-2012 Semiconductor Devices, General Specification for
DLA QML-19500-2012 Semiconductor Devices, General Specification for
DLA QML-19500-2013 Semiconductor Devices, General Specification for
DLA MIL-S-19500/216 A VALID NOTICE 3-2004 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON TYPE 2N1051
DLA MIL-S-19500/273 A VALID NOTICE 3-2011 Semiconductor Device, Transistor Type Type 2N744
DLA MIL-S-19500/303 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
DLA DSCC-DWG-91011 REV B-2003 SEMICONDUCTOR DEVICE, DIODE, ULTRA FAST

工业和信息化部, Semiconductor light agent

SJ/T 2749-2016 Semiconductor Laser Diode Test Methods
QB/T 5369-2019 Semiconductor refrigeration equipment
SJ/T 11586-2016 Test method for 10KeV low-energy X-ray total dose irradiation of semiconductor devices
SJ/T 11577-2016 SJ/T 11394-2009 "Semiconductor Light Emitting Diode Test Methods" Application Guide

RO-ASRO, Semiconductor light agent

STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
STAS 12258/7-1987 OPTOELECTRONIC SEMICONDIC- TOH DEVICES PHOTOVOLTAIC CELLS Terminology and essential cliarac! eristics
STAS 12258/2-1984 Optoelectronic semiconductor devices PIIOTODIODES Terminology and essentia] characteristics
STAS 12258/4-1986 Optoelectronic semiconductor devices LIGHT EMITTING DIODES Terminology and main characteristics
STAS 12258/5-1986 OPTOELECTRONIG SEMICONDUCTOR DEVICES DISPLAYS Terminology and essential characteristres
STAS 12258/1-1984 OPTOELECTRONIC SEMICONDUCTOR DEVICES General terminology and nomencla- ture of general basic parameters
STAS 1590/10-1974 SEMICONDUCTOR DEVICES Graphical symbols
STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology

International Organization for Standardization (ISO), Semiconductor light agent

ISO/TS 17915:2013 Optics and photonics.Measurement method of semiconductor lasers for sensing
ISO 17915:2018 Optics and photonics - Measurement method of semiconductor lasers for sensing

Association Francaise de Normalisation, Semiconductor light agent

NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
NF C96-005-5*NF EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5 : optoelectronic devices - Photocouplers
NF EN IEC 60747-5-5:2020 Dispositifs à semiconducteurs - Partie 5-5 : dispositifs optoélectroniques - Photocoupleurs
NF C93-801-2*NF EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 : measuring methods
NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements
NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF EN 60747-15:2013 Dispositifs à semiconducteurs - Dispositifs discrets - Partie 15 : dispositifs de puissance à semiconducteurs isolés
NF C53-221:1980 Semiconductor self-commutated convertors.
NF C96-015*NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices
NF C96-005-5/A1*NF EN 60747-5-5/A1:2015 Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers
NF C96-005-5*NF EN 60747-5-5:2012 Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers
NF EN 62007-2:2009 Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 2 : méthodes de mesure
XP CEN/TS 16599:2014 Photocatalyse - Détermination des conditions d'irradiation pour tester les propriétés photocatalytiques de matériaux semi-conducteurs
NF EN 62417:2010 Dispositifs à semiconducteurs - Essais d'ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFET)
NF EN 62779-1:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1 : exigences générales
NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
NF C96-779-3*NF EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3 : functional type and its operational conditions
NF EN 62779-2:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage
NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
NF C96-287-1*NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : guidelines for IC reliability qualification
NF EN 61207-7:2014 Expression des performances des analyseurs de gaz - Partie 7 : analyseurs de gaz laser à semiconducteurs accordables

Professional Standard - Post and Telecommunication, Semiconductor light agent

YD/T 701-1993 Test method for semiconductor laser diode assembly
YD/T 1687.1-2007 Technical Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 1:2.5Gbit/s Cooled Direct Modulation Semiconductor Laser Assembiy
YD/T 1687.2-2007 Technidal Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 2:2.5Gbit/s Uncooled Direct Modulation Semiconductor Laser Assembly
YD/T 2001.2-2011 Semiconductor optoelectronic devices for fibre optic system applications.part 2:measuring methods

NEMA - National Electrical Manufacturers Association, Semiconductor light agent

NEMA CB-4:1989 Semiconductor Graphite

National Fire Protection Association (NFPA), Semiconductor light agent

NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

IEC - International Electrotechnical Commission, Semiconductor light agent

IEC TR 61292-9:2017 Optical amplifiers – Part 9: Semiconductor optical amplifiers (SOAs) (Edition 2.0)
IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)
IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devices (Edition 1.0)

YU-JUS, Semiconductor light agent

JUS N.R1.322-1979 Terms and definitions for semiconductor ?evices. Thyristors
JUS N.R1.520-1988 Seml?ouductor devices. Preparat ion of draurings
JUS N.A3.500-1980 Semiconductor devices. Graphical symbols
JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes

German Institute for Standardization, Semiconductor light agent

DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN 50455-2:1999 Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
DIN 50455-1:2009 Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods
DIN IEC/TR 61292-9:2013 Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs) (IEC 86C/1109/CD:2013)
DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.
DIN 5032-9:2015-01 Photometry - Part 9: Measurement of the photometric quantities of incoherent emitting semiconductor light sources
DIN 5032-9:2015 Photometry - Part 9: Measurement of the photometric quantities of incoherent emitting semiconductor light sources
DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
DIN EN 62007-2:2009-09 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods (IEC 62007-2:2009); German version EN 62007-2:2009 / Note: DIN EN 62007-2 (2001-06) remains valid alongside this standard until 2012-02-01.
DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).
DIN EN IEC 63287-1:2020-06 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020 / Note: Date of issue 2020-05-08*Intended as replacem...

JP-JEITA, Semiconductor light agent

JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

American National Standards Institute （ANSI), Semiconductor light agent

ANSI/TIA/EIA 455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers
ANSI/EIA 370-B:1992 Semiconductor Devices, Designation System for

European Committee for Electrotechnical Standardization（CENELEC）, Semiconductor light agent

EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers

ES-UNE, Semiconductor light agent

UNE-EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)
UNE-EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
UNE-EN 60747-5-5:2011/A1:2015 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by AENOR in May of 2015.)
UNE-EN 60747-5-5:2011 Semiconductor devices - Discrete devices -- Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by AENOR in May of 2011.)
UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
UNE-EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
UNE-EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)

国家药监局, Semiconductor light agent

YY/T 1751-2020 Laser treatment equipment semiconductor laser intranasal irradiation therapy instrument

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Semiconductor light agent

IEEE 256-1963 SEMICONDUCTOR DIODES
IEEE 59-1962 SEMICONDUCTOR RECTIFIER COMPONENTS

SE-SIS, Semiconductor light agent

SIS SS CECC 20000-1983 Generic specification: Semiconductor optoelectronic and liquid crystal devices
SIS SEN 01 03 51-1966 Semiconductor devices Terminology
SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SIS SEN 01 26 51-1969 Symbols for electrical diagrams Semi-conductors

CENELEC - European Committee for Electrotechnical Standardization, Semiconductor light agent

EN 62007-2:2000 Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 2: Measuring Methods
EN 60747-15:2004 Discrete semiconductor devices Part 15: Isolated power semiconductor devices

American Society for Testing and Materials (ASTM), Semiconductor light agent

ASTM F1893-98(2003) Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
ASTM F1893-98 Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
ASTM F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
ASTM F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM F1892-06 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM F1892-04 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM F1892-98 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
ASTM F1892-12 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

Professional Standard - Aerospace, Semiconductor light agent

QJ 10004-2008 Total dose radiation testing method of semiconductor devices for space applications
QJ 2225-1992 Semiconductor Device Usage Rules

Japanese Industrial Standards Committee (JISC), Semiconductor light agent

JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

国家市场监督管理总局、中国国家标准化管理委员会, Semiconductor light agent

GB/T 37031-2018 Semiconductor lighting terminology
GB/T 36358-2018 Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
GB/T 39771.2-2021 Optical radiation safety of LEDs—Part 2: Measurement methods
GB/T 21548-2021 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems

BE-NBN, Semiconductor light agent

US-Unspecified Preparing Activity, Semiconductor light agent

DI-QCIC-80924 A-2006 SEMICONDUCTOR PROCESS SPECIFICATION

Guangdong Provincial Standard of the People's Republic of China, Semiconductor light agent

DB44/T 1873-2016 semiconductor refrigeration wine cabinet
DB44/T 1639.1-2015 General Rules for Semiconductor Lighting Standard Optical Components Part 1 Hierarchical Division

Danish Standards Foundation, Semiconductor light agent

DS/IEC 747-12:1993 Semiconductor devices. Part 12: Sectional specification for optoelectronic devices
DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
DS/IEC 747-5:1986 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic sevices
DS/EN 60747-5-5:2011 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
DS/EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification

(U.S.) Telecommunications Industries Association , Semiconductor light agent

TIA-455-128-1996 Procedures for Determining Threshold Current of Semiconductor Lasers
TIA-455-128-1996(2014) Procedures for Determining Threshold Current of Semiconductor Lasers

KR-KS, Semiconductor light agent

KS C IEC 60747-5-2020 Semiconductor devices — Discrete devices —Part 5: Optoelectronic devices
KS C IEC 60747-14-1-2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors
KS C IEC 60747-14-1-2019 Semiconductor devices — Part 14-1: Semiconductor sensors —Generic specification for sensors

Hebei Provincial Standard of the People's Republic of China, Semiconductor light agent

DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication

IN-BIS, Semiconductor light agent

Underwriters Laboratories (UL), Semiconductor light agent

UL 1557-1993 Electrically isolated semiconductor devices
UL 1557-1997 Electrically isolated semiconductor devices
UL 1557-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices Fourth Edition; Reprint with Revisions through and Including 6/26/2006
UL 1557-2011 Electrically isolated semiconductor devices

Professional Standard - Machinery, Semiconductor light agent

JB/T 5537-2006 Semiconductor pressure sensors
JB/T 4277-1996 Packing of power semiconductor parts
JB/T 7059-1993 Guide for preparation of standard for power semiconductor modules
JB/T 10096-2000 Selection guidance of case for power semiconductor device
JB/T 10097-2000 Case for power semiconductor device

ESD - ESD ASSOCIATION, Semiconductor light agent

EP118-2007 Physics of Semiconductor Devices

Guizhou Provincial Standard of the People's Republic of China, Semiconductor light agent

DB52/T 796-2013 Industrial semiconductor electric detonator
DB52/T 844-2013 Semiconductor Current Regulator

Association of German Mechanical Engineers, Semiconductor light agent

VDI/VDE 3713 Blatt 8-1995 Technical procurement specification - Epoxy encapsulants for semiconductor chips

Standard Association of Australia （SAA）, Semiconductor light agent

TH-TISI, Semiconductor light agent

TIS 1863-2009 Semiconductor devices.discrete devices

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Semiconductor light agent

JEDEC JESD14-1986 Semiconductor Power Control Modules
JEDEC JEP140-2002 Beaded Thermocouple Temperature Measurement of Semiconductor Packages
JEDEC JESD77C-2009 Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices
JEDEC JESD77D-2012 Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices

PL-PKN, Semiconductor light agent

PN T01503 ArkusZ50-1973 Semiconductor devicesDimensions Case C9
PN-EN IEC 60747-5-5-2021-04 E Semiconductor devices--Part 5-5: Optoelectronic devices--Photocouplers (IEC 60747-5-5:2020)
PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

JP-JEC, Semiconductor light agent

JEC 2440-2005 SEMICONDUCTOR SELF-COMMUTATED CONVERTERS

Lithuanian Standards Office , Semiconductor light agent

LST EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2020)
LST EN 60747-15-2012 Semiconductor devices - Discrete devices -- Part 15: Isolated power semiconductor devices (IEC 60747-15:2010)

Indonesia Standards, Semiconductor light agent

SNI 19-0429-1989 Guide for sampling of liquid and semi solid materials

未注明发布机构, Semiconductor light agent

BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers

ZA-SANS, Semiconductor light agent

SANS 60146-2:1999 Semiconductor converters Part 2: Self-commutated semiconductor converters including direct d.c. converters

IECQ - IEC: Quality Assessment System for Electronic Components, Semiconductor light agent

PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits

Professional Standard - Non-ferrous Metal, Semiconductor light agent

YS/T 678-2008 Copper wire for semiconductor lead bonding

National Metrological Verification Regulations of the People's Republic of China, Semiconductor light agent

JJG 363-1984 Verification Regulation of Semiconductor Themistor Themometer