19.080 电工和电子试验 标准查询与下载

T/ZSA 39-2020 石墨烯测试方法 功函数的测定 紫外光电子能谱法

导电薄膜功函数的确定在显示器件应用时起到至关重要的作用。随着基于石墨烯等新材料技术的柔性显示器的批量应用，准确测定石墨烯柔性导电薄膜功函数在产业化方面的需求越来越大。 目前为止主流的功函数测试方法是开尔文探针力显微镜（KPFM）法。该方法准确，且可同时获得测试范围内的材料形貌等信息，因此被市场广泛采用，用来测试上一代非柔性显示器件中氧化铟锡（ITO）玻璃的功函数。KPFM方法的缺点是测试时间相对较长，且测试范围较小，通常为几十至几百平方微米。 于石墨烯薄膜的缺陷度较高，因此功函数在膜片中的分布均匀性较ITO玻璃低。此时，光电子能谱法（UPS法）测试功函数的优点逐渐显现。首先，UPS法的最大测试范围可至2 mm╳2 mm，一定程度上规避了KPFM过于微观的特性。其次，UPS测试便捷、快速，可以在几分钟内得到测试结果。此外，UPS法还能同时得到样品的能带信息。 因此，UPS法测功函数可作为KPFM方法的有益补充。KPFM方法适用于对于研发等对微观精度要求高的场合，UPS方法可快速准确获得宏观薄膜的整体功函数情况，适用于批量交付产品中的质量控制。 本文件规范了UPS法测功函数的方法，以规范UPS法测功函数的基本操作，使此方法在以柔性显示器件为首的产业化进程中更好地发挥作用。

Characterization of Graphene - Work function - Ultraviolet photoelectron spectroscopy (UPS) method

KS C IEC 62475-2020 大电流测试技术 - 测试电流和测量系统的定义和要求

High-current test techniques — Definitions and requirements for test currents and measuring systems

KS C IEC 62475:2020 大电流测试技术 - 测试电流和测量系统的定义和要求

High-current test techniques — Definitions and requirements for test currents and measuring systems

DS/EN IEC 60112:2020 固体绝缘材料耐火起痕指数和比较漏电起痕指数的测定方法

Method for the determination of the proof and the comparative tracking indices of solid insulating materials

DS/EN 50699:2020 电气设备的定期测试

Recurrent Tests of Electrical Equipment

OVE EN IEC 61010-2-033/AA:2020 测量、控制和实验室用电气设备的安全要求 第 2-033 部分：能够测量电源电压的手持式万用表和其他家用和专业仪表的特殊要求（修正案）

Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 2-033: Particular requirements for hand-held multimeters and other meters for domestic and professional use, capable of measuring mains voltage (Amendment)

KS C IEC 61180:2020 低压设备的高压测试技术 - 定义 测试和程序要求 测试设备

High-voltage test techniques for low-voltage equipment —Definitions, test and procedure requirements, test equipment

KS C IEC 61180-2020 低压设备的高压测试技术 - 定义 测试和程序要求 测试设备

High-voltage test techniques for low-voltage equipment —Definitions, test and procedure requirements, test equipment

T/ZGIA 002-2020 石墨烯测试方法 功函数的测定 紫外光电子能谱法

本文件规定了紫外光电子能谱法测试石墨烯薄膜功函数的术语和定义、原理、试验条件、仪器设备、样品、试验步骤、实验数据处理和试验报告。 本文件适用于石墨烯功函数测定，其他透明导电膜材料功函数的测定可参照执行。

Graphene Test Methods Determination of Work Function Ultraviolet Photoelectron Spectroscopy

T/CIS 03002.1-2020 科学仪器设备电气系统可靠性 强化试验方法

目  录 前  言　1 1 范围　2 2 规范性引用文件　2 3 术语和定义　2 4 通用要求　5 4.1 受试样机　5 4.1.1 技术状态　5 4.1.2 受试样机数量　5 4.1.3 明确样机的信息　5 4.2 试验应力　5 4.3 试验设备　5 4.3.1 可靠性强化试验用设备管理要求　5 4.3.2 可靠性强化设备能力要去　5 4.4 试验准备工作要求　6 4.5 保护与隔离要求　6 5 试验方法　7 5.1 试验分类、选择与流程　7 5.1.1 分类　7 5.1.2 选择　7 5.1.3 流程　8 5.2 A组强化试验　8 5.2.1 低温步进试验　8 5.2.2 高温步进试验　10 5.2.3 快速温变试验　11 5.2.4 振动步进试验　12 5.2.5 快速温变-振动综合应力强化试验　15 5.3 B组强化试验　16 5.3.1 恒定湿热试验　16 5.3.1.1 恒定湿热步进试验　16 5.3.1.2 恒定湿热极限试验　17 5.3.2 交变湿热强化试验　18 5.3.3 温湿度-振动综合应力强化试验　19 5.4 C组强化试验　21 5.4.1 交变湿热耐久强化试验　21 5.4.2 快速温变-振动综合应力耐久强化试验　21 5.4.3 温湿度-振动综合应力耐久强化试验　21 6 故障处理　22 7 试验报告　22 附录A　23 A.1 技术资料要求　23 A.2 受试样机准备　23 A.3 受试样机的外壳（机箱）　23 A.4 保障设备和负载装置　23 A.4.1 保障设备　23 A.4.2 负载装置　23 A.5 工装夹具和测试夹具　23 A.5.1 工装夹具　23 A.5.2 测试夹具及连接线缆　24 A.6 测试和监测用仪器仪表　24 A.7 排故、维修工具和备件　24 A.8 试验设备　24 A.9 试验与技术保障队伍　24 附录B　25 B.1 试验前　25 B.1.1 应力调查　25 B.1.2 试验前样机处置　25 B.1.3 受试样机放置与安装　26 B.1.4 试验前测试　26 B.2 试验实施　26 B.2.1 试验应力施加与控制　26 B.2.2 受试样机运行与加载　26 B.2.3 受试样机测试与监测　26 B.2.4 保护与隔离处理　27 B.3 试验后　27 B.3.1 试验后测试　27 B.3.2 试验后受试样机处置　27 B.3.3 分析改进　27 B.3.4 回归验证　28 B.3.5 纠正措施落实　28 附录C　29 C.1 目的　29 C.2 应力极限　29 C.2.1 低温工作极限和破坏极限　29 C.2.2 高温工作极限和破坏极限　30 C.2.3 振动工作极限和破坏极限　30 C.2.4 快速温变循环试验中高、低温温度值的计算　31 C.2.5 其它极限应力确定　31 附录D　32  

Reliability of electric system in instrument or equipment -- Enhance test method

KS C IEC 60060-2:2019 高电压试验技术 - 第2部分:测量系统

High-voltage test techniques－Part 2：Measuring Systems

KS C IEC 60060-1:2019 高压测试技术 - 第1部分:一般定义和测试要求

High-voltage test techniques -Part 1: General definitions and test requirements

KS C IEC 60060-2-2019 高电压试验技术 - 第2部分:测量系统

High-voltage test techniques－Part 2：Measuring Systems

KS C IEC 60060-1-2019 高压测试技术 - 第1部分:一般定义和测试要求

High-voltage test techniques -Part 1: General definitions and test requirements

KS C IEC 61180-2-2019 低压设备高压试验技术 第2部分：试验设备

High-voltage test techniques for low-voltage equipment — Part 2：Test equipment

KS C IEC 61180-1-2019 低压设备高压试验技术第1部分：定义、试验和程序要求

High-voltage test techniques for low-voltage equipment - Part 1：Definitions, test and procedure requirements

KS C 0304-2019 平面材料电磁屏蔽效能的测量方法

Method of measurement for the electromagnetic shielding effectiveness of planar materials

KS C 0305-2019 平面吸波材料吸波效能的测量试验方法

Test method of measurement for the electromagnetic wave absorbing effectiveness of planar electromagnetic wave absorbing materials

KS C 6021-2019 电子元件耐久性（机械）测试方法

Endurance(mechanical) testing method for electronic components

ASTM E1854-19 确保电子零件中子诱发位移损伤试验一致性的标准实施规程

1.1 This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing. 1.2 Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor sources, accelerator-based neutron sources, such as 14-MeV DT sources, and 252 Cf sources. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered to recognize, minimize or eliminate these problems. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole. Electrical measurements are addressed in other standards, such as Guide F980. Additional information on conducting irradiations can be found in Practices E798 and F1190. This practice also may be of use to test sponsors (organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments). 1.3 Methods for the evaluation and control of undesired contributions to damage are discussed in this practice. References to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations and recommendations are addressed in Appendix X1 (Nonmandatory information). 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts