L05 可靠性和可维护性 标准查询与下载

IEC 61164:2004 可靠性增长.统计试验和评估方法

Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and good

Reliability growth - Statistical test and estimation methods

IEC 60300-2:2004 可信性管理.第2部分:可信性管理指南

Provides guidelines for dependability management of product design, development, evaluation and process enhancements. Life cycle models are used to describe product development or project phases. Applicable for detailed planning and implementation of a d

Dependability management - Part 2: Guidelines for dependability management

DIN EN 60300-1:2004 可靠性管理.第1部分:可靠性管理系统

Dependability management - Part 1: Dependability management systems (IEC 60300-1:2003); German version EN 60300-1:2003

ASTM F2446-04 可靠性、有效性和可维护性数据交换用设备识别符和边界的分级结构的标准分类

1.1 This classification is to serve as an international standard for marine equipment nomenclature, taxonomy, hierarchical data structure, unique identifiers, and boundary definition for the consistent acquisition and exchange of equipment RAM performance data. The standard addresses the classification of mechanical and software products.1.2 RAM in an acronym for Reliability, Availability, Maintainability where:1.2.1 Reliability is the probability that an item can perform a required function under given conditions for a given time interval (t1, t2). It is generally assumed that the item is in a state to perform this required function at the beginning of the time interval.1.2.2 Availability is the probability that an item is in a state to perform a required function under given conditions at a given instant of time, assuming that the required external resources are provided.1.2.3 Maintainability is the probability that a given active maintenance action, for an item under given conditions of use can be carried out within a stated time interval, when the maintenance is performed under stated conditions and using stated procedures and resources.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

Standard Classification for Hierarchy of Equipment Identifiers and Boundaries for Reliability, Availability, and Maintainability (RAM) Performance Data Exchange

ASTM F2446-04(2010) 可靠性、有效性和可维护性数据交换用设备识别符和边界的分级结构的标准分类

Capturing high quality Reliability, Availability, and Maintainability (RAM) performance data requires careful and consistent collection of equipment failure and repair data, operating hours, and repair time. A standard hierarchy of equipment boundaries has been needed for machinery data exchange among the stakeholders in shipbuilding, ship classification, and ship operations. Industry and government will use a world standard method for setting the hierarchy of indentures and boundaries required for assigning failure and repair events to equipment for the tracking and calculation of equipment RAM performance. Agreed boundaries and equipment identifiers make it possible to share equipment data among organizations, benchmark equipment performance, perform modeling and simulation of current and proposed systems, or use performance data to improve operations of commercial and Naval vessels. RAM analysis is primarily based on the observation of individual components among which identical items contribute to the same data sample. This classification is designed to be used for the identification of individual (unique) components in such a way that identical components can be identified within a given data sample.1.1 This classification is to serve as an international standard for marine equipment nomenclature, taxonomy, hierarchical data structure, unique identifiers, and boundary definition for the consistent acquisition and exchange of equipment RAM performance data. The standard addresses the classification of mechanical and software products. 1.2 RAM in an acronym for Reliability, Availability, & Maintainability where: 1.2.1 Reliability is the probability that an item can perform a required function under given conditions for a given time interval (t1, t2). It is generally assumed that the item is in a state to perform this required function at the beginning of the time interval. 1.2.2 Availability is the probability that an item is in a state to perform a required function under given conditions at a given instant of time, assuming that the required external resources are provided. 1.2.3 Maintainability is the probability that a given active maintenance action, for an item under given conditions of use can be carried out within a stated time interval, when the maintenance is performed under stated conditions and using stated procedures and resources. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

Standard Classification for Hierarchy of Equipment Identifiers and Boundaries for Reliability, Availability, and Maintainability (RAM) Performance Data Exchange

JEDEC JESD90-2004 为测量P路 MOSFET负偏压温度不稳定性的规程

Negative Bias Temperature Instabilities (NBTI) experienced by p-channel MOSFETs over time are an important reliability concern in modern microcircuits. The physical nature of the NBTI damage is not completely understood. It is believed that the NBTI damage is controlled by an electro-chemical reaction where holes in the P-MOSFET inverted channel interact with Si compounds (Si-H, Si-D, etc) at the Si- SiO2 interface to produce donor type interface states and possibly positive fixed charge. The relative contribution of interface states generation and positive fixed charge formation is very sensitive to the gate oxide process used in the technology. The electro-chemical reaction is strongly dependent on the gate vertical electric field and the temperature at stress. For this reason it is necessary to use the minimum oxide thickness allowed in the technology. The interface states generation and positive fixed charge formation may lead to substantial P-MOSFET parameter changes, in particular to an increase of threshold voltage (VT). VT is the most commonly used device parameter (as compared to transconductance or any drain current) to track the P-MOSFET degradation. This failure mechanism, which is found to be strongly thermally activated, may seriously affect the PMOS device reliability, particularly for analog blocks/designs where matching issues can be critical.

A Procedure for Measuring P-Channel MOSFET Negative Bias Temperature Instabilities

KS A IEC 61137:2003 放射线防护检测装置.安装型个人表面污染监控装置.地能量X线和γ放射体

이 규격은 의복의 착용 여부와는 관계없이 인체 표면의 방사능 알파와 베타 오염을 감시하

Radiation protection instrumentation-Installed personnel surface contamination monitoring assembly-Low energy X and gamma emitters

BS EN 62315-1:2003 含可再用部件的产品的可靠性.功能和试验的要求

This part of IEC 62315 specifies requirements for digital television (DTV) monitors that use an uncompressed, baseband, digital video interface. These requirements apply to baseband, digital, video interfaces that use the VESA E-EDID Standard for the discovery of supported video formats. This standard also specifies the video formats to be supported by a DTV monitor. The timing requirements for 14 video formats are specified along with requirements for video format discovery. A mechanism allowing a video source to discover the preferred format of a DTV monitor is also described. A digital video interface is not specified in this part; however, it is envisaged that such interfaces will appear in future parts of IEC 62315. NOTE 1 It is recommended that devices using the DTV profiles defined in this document, incorporate a digital content protection system on such interfaces in order to ensure interoperability between devices.

DTV profiles for uncompressed digital video interfaces-Part 1:General

KS A IEC 61650:2003 可靠性数据分析技法.两衡量故障率和故障强度比较步骤

이 규격은 다음과 같은 2개의 관측된 값을 비교하기 위한 방법을 정한다.

Reliability data analysis techniques-Procedures for comparison of two constant failure rates and two constant failure(event) intensities

KS A IEC 61123:2003 可靠性测试.成功率的符合测试计划

이 국제 규격은 성공비(success ratio) 또는 실패비(failure ratio

Reliability testing-Compliance test plans for success ratio

KS A IEC 60863:2003 可靠性、维护性和可用性预测值的介绍

이 규격은 하드웨어, 소프트웨어 및 인적 요인을 포함하는 시스템이나 장비의 신뢰성, 보

Presentation of reliability, maintainability and availability predictions

KS A IEC 60812:2003 故障模式及影响分析程序(FMEA)

이 규격은 고장 모드 영향 분석(FMEA)과 고장 모드, 영향 및 치명도 분석(FMECA)

Failure Mode and Effects Analysis(FMEA)

KS A IEC 61163-2:2003 可靠性应力筛分.第2部分:电子构件

이 규격은 전자 부품의 신뢰성 스트레스 스크리닝 기술과 순서에 대한 지침서이다. 이 규

Reliability stress screening-Part 2:Electronic components

BS EN 61014:2003 可靠性增长用程序

This International Standard specifies requirements and gives guidelines for the exposure and removal of weaknesses in hardware and software items for the purpose of reliability growth. It applies when the product specification calls for a reliability growth programme of equipment (electronic, electromechanical and mechanical hardware as well as software) or when it is known that the design is unlikely to meet the requirements without improvement. A statement of the basic concepts is followed by descriptions of the management, planning, testing (laboratory or field), failure analysis and corrective techniques required. Mathematical modelling, to estimate the level of reliability achieved, is outlined briefly.

Programmes for reliability growth

IEC 61014:2003 可靠性增长大纲

Specifies requirements and gives guidelines for the exposure and removal of weaknesses in hardware and software items for the purpose of reliability growth. Applies when the product specification calls for a reliability growth programme of equipment (ele

Programmes for reliability growth

BS CWA 14167-1:2003 电子签名用可靠系统管理认证的安全要求.系统安全要求

Security requirements for trustworthy systems managing certificates for electronic signatures - System security requirements

IEC 60300-1:2003 可靠性管理.第1部分:可靠性管理系统

Describes the concepts and principles of dependability management systems. Identifies the generic processes in dependability for planning, resource allocation, control, and tailoring necessary to meet dependability objectives. Deals with the dependabilit

Dependability management - Part 1: Dependability management systems

BS IEC 60300-3-1:2003 可靠性管理.应用指南.可靠性分析技术:方法学指南

Gives a general overview of commonly used dependability analysis techniques. It describes the usual methodologies, their advantages and disadvantages, data input and other conditions for using various techniques. It is an introduction to selected methodologies and is intended to provide the necessary information for choosing the most appropriate analysis methods.

Dependability management - Application guide - Analysis techniques for dependability - Guide on methodology

BS EN 60300-3-1:2003 可靠性管理.应用指南.可靠性分析技术.方法指南

Dependability management - Application guide - Analysis techniques for dependability - Guide on methodology

DIN IEC 60319:2003 电子元器件可靠性数据的表示和规范 (IEC 60319:1999)

The document provides gives guidance for the collection and presentation of data necessary to understand the reliability characteristics of a component. It also gives guidance to component users as to how they should specify their reliability requirements to component manufacturers. It makes no distinction between data on failures or operation without failures or faults.

Presentation and specification of reliability data for electronic components (IEC 60319:1999)