This part of IEC 61189 specifies a test method to monitor the resistance of single plated- through holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.
IEC 61189-3-719-2016由国际电工委员会 IX-IEC 发布于 2016-01。
IEC 61189-3-719-2016 在中国标准分类中归属于: L30 印制电路,在国际标准分类中归属于: 31.180 印制电路和印制电路板。
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