EN 62047-6-2010

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials


 

 

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标准号
EN 62047-6-2010
发布日期
2010年03月01日
实施日期
2010年04月15日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
CENELEC - European Committee for Electrotechnical Standardization
引用标准
20
适用范围
This International Standard specifies the method for axial tensile?Ctensile force fatigue testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0@1 ?? and 10 ?? under constant force range or constant displacement range. Thin films are used as main structural materials for MEMS and micromachines. The main structural materials for MEMS@ micromachines@ etc.@ have special features@ such as typical dimensions of a few microns@ material fabrication by deposition@ and test piece fabrication by means of non-mechanical machining@ including photolithography. This International Standard specifies the axial force fatigue testing methods for micro-sized smooth specimens@ which enables a guarantee of accuracy corresponding to the special features. The tests are carried out at room temperatures@ in air@ with loading applied to the test piece along the longitudinal axis.

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