H21 金属物理性能试验方法 标准查询与下载
共找到 547 条与 金属物理性能试验方法 相关的标准，共 37 页
Evaluation of near-edge geometry of semiconductor wafers Part 1: Highly radial second derivative method (ZDD)
- ICS
- 77.040
- CCS
- H21
- 发布
- 2024-04-25
- 实施
- 2024-11-01
Testing of surface quality and microtube density of silicon carbide polished wafers using confocal differential interference method
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-11-27
- 实施
- 2024-06-01
Corrosion method for detecting flow pattern defects in silicon wafers
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-11-27
- 实施
- 2024-06-01
Determination of external specific surface area by powder layer permeability test under steady flow conditions of metal powder
- ICS
- 77.160
- CCS
- H21
- 发布
- 2023-09-07
- 实施
- 2024-04-01
High-temperature performance test method for electrochemical performance testing of lithium-ion battery cathode materials
- ICS
- 77.160
- CCS
- H21
- 发布
- 2023-09-07
- 实施
- 2024-04-01
Lithium cobalt oxide electrochemical performance test first discharge specific capacity and first charge and discharge efficiency test method
- ICS
- 77.160
- CCS
- H21
- 发布
- 2023-09-07
- 实施
- 2024-04-01
Lithium nickel manganese oxide electrochemical performance test first discharge specific capacity and first charge and discharge efficiency test method
- ICS
- 77.160
- CCS
- H21
- 发布
- 2023-09-07
- 实施
- 2024-04-01
Laser Scattering Method for Testing Surface Defects of Silicon Carbide Epitaxial Wafers
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Test method for surface gloss of silicon wafer
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Non-contact eddy current induction method for testing non-equilibrium carrier recombination lifetime in silicon ingots, blocks and wafers
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Determination of Minority Carrier Lifetime in Silicon and Germanium by Photoconductivity Decay Method
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Method for Determination of Crystalline Orientation of Semiconductor Single Crystal
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Infrared reflection method for measuring the thickness of silicon carbide epitaxial layer
- ICS
- 77.040
- CCS
- H21
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Corrosion evaluation chart method for aluminum and aluminum alloy anodized film and organic polymer film
- ICS
- 25.220.20
- CCS
- H21
- 发布
- 2023-05-23
- 实施
- 2023-12-01
Corrosion evaluation grid method for aluminum and aluminum alloy anodized film and organic polymer film
- ICS
- 25.220.20
- CCS
- H21
- 发布
- 2023-05-23
- 实施
- 2023-12-01
本文件描述了锂离子电池正极材料磷酸铁锂首次放电比容量及首次充放电效率测试方法。 本文件适用于锂离子电池正极材料磷酸铁锂首次放电比容量及首次充放电效率的测试。
Electrochemical performance test of lithium iron phosphate—Test method for the initial discharge specific capacity and the initial efficiency
- ICS
- 77.160
- CCS
- H21
- 发布
- 2022-12-30
- 实施
- 2023-04-01
本文件描述了半绝缘碳化硅单晶的电阻率非接触测试方法。 本文件适用于测量电阻率范围为1×105 Ω·cm~1×1012 Ω·cm 的半绝缘碳化硅单晶片。
Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement
- ICS
- 77.040
- CCS
- H21
- 发布
- 2022-12-30
- 实施
- 2023-04-01
本文件描述了锂离子电池正极材料磷酸铁锂循环寿命的测试方法。 本文件适用于采用卷绕法进行锂离子电池正极材料磷酸铁锂循环寿命的测试。
Electrochemical performance test of lithium iron phosphate—Test method for cycle life
- ICS
- 77.160
- CCS
- H21
- 发布
- 2022-12-30
- 实施
- 2023-04-01
