DS/EN 60749-10-2003

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

 

 

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标准号
DS/EN 60749-10-2003
发布日期
2003年01月08日
实施日期
2002年08月30日
废止日期
无
国际标准分类号
31.080.01
发布单位
DK-DS
适用范围
This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating normally applicable to cavity-type packages. In general, this mechanical shock test is in conformity with IEC 60068-2-27 but, due to specific requirements of semiconductors, the clauses of this standard apply.

DS/EN 60749-10-2003系列标准

DS/EN 60749-1-2003 DS/EN 60749-10/Corr.1-2004 DS/EN 60749-11-2003 DS/EN 60749-11/Corr.1-2003 DS/EN 60749-11/Corr.2-2004 DS/EN 60749-12-2003 DS/EN 60749-12/Corr.1-2004 DS/EN 60749-13-2003 DS/EN 60749-13/Corr.1-2004 DS/EN 60749-14-2004 DS/EN 60749-15-2011 DS/EN 60749-15/AC-2011 DS/EN 60749-16-2003 DS/EN 60749-17-2003 DS/EN 60749-18-2003 DS/EN 60749-19-2003 DS/EN 60749-19/A1-2010 DS/EN 60749-2-2003 DS/EN 60749-2/Corr.1-2004 DS/EN 60749-20-1-2009 DS/EN 60749-20-2010 DS/EN 60749-21-2011 DS/EN 60749-22+Corr.1-2004 DS/EN 60749-23-2004 DS/EN 60749-23/A1-2011 DS/EN 60749-24-2004 DS/EN 60749-25-2004 DS/EN 60749-26-2006 DS/EN 60749-27-2006 DS/EN 60749-27/A1-2013 DS/EN 60749-29-2011 DS/EN 60749-3-2003 DS/EN 60749-3/Corr.1-2004 DS/EN 60749-30-2005 DS/EN 60749-30/A1-2011 DS/EN 60749-31+Corr.1-2004 DS/EN 60749-32+Corr.1-2004 DS/EN 60749-32/A1-2010 DS/EN 60749-33-2004 DS/EN 60749-34-2011 DS/EN 60749-35-2007 DS/EN 60749-36-2003 DS/EN 60749-37-2008 DS/EN 60749-38-2008 DS/EN 60749-39-2006 DS/EN 60749-4-2003 DS/EN 60749-4/Corr.1-2004 DS/EN 60749-40-2011 DS/EN 60749-5-2003 DS/EN 60749-6-2003 DS/EN 60749-6/Corr.1-2004 DS/EN 60749-7-2011 DS/EN 60749-8+Corr.2-2004 DS/EN 60749-9-2003 DS/EN 60749-9/Corr.1-2004


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