SiBrickScan 是傅立叶红外谱仪系统 英文介绍
SiBrickScan 是唯一一款专用于定量分析硅锭的氧填隙原子从而得出浓度分布的傅立叶红外谱仪系统
SiBrickScan (SBS) Silicon Ingot Analyzer
SiBrickScan (SBS) is a dedicated at-line system for the FTIR quantification of interstitial Oxygen in complete Silicon ingots, resulting in a concentration profile along the longitudinal axis. Accessing this information without sawing wafers or test samples is a major and cost saving advantage.
Get Valuable Information to Check and Optimize Product Quality
Knowing the Oxygen gradient of Si ingots enables important conclusions helping e.g. to control and optimize the Silicon crystallization process or to identify batches of bad raw material. Therefore SBS will help to save costs by optimizing product quality and reducing the amount of defective wafers. The random sampling of individual ingots does strongly reduce sample preparation efforts and provides relevant information much earlier.
Highest Sensitivity by State-of-the-Art FTIR Spectroscopy
Interstitial Oxygen quantification by FTIR spectroscopy (ASTM/SEMI 1188) is a well-known and important analysis method, but limited to thin Si samples in the low mm range. SiBrickScan (SBS) overcomes this limitation and is the first commercially available completely dedicated system to determine the Oxygen gradient in complete ingots along their major axis without the need of time-consuming and destructive thin sample preparation. SBS makes smart use of a related infrared overtone absorption band combined with reliable and state-of-the-art Bruker FTIR technology.
To send a SBS online inquiry, please click here.
-
焦点事件
-
标准
-
招标采购
-
标准
-
综述
-
投融资
-
企业风采
-
市场商机
-
企业风采
-
焦点事件
-
精英视角
-
精英视角
-
投融资
-
精英视角
-
企业风采
-
精英视角
-
会议会展
-
焦点事件
-
科技前沿
-
企业风采
-
企业风采
-
企业风采
-
企业风采
-
企业风采
-
企业风采
-
企业风采
-
产品技术
-
企业风采
-
科技前沿
-
产品技术
-
精英视角
-
产品技术
-
会议会展
-
焦点事件
-
焦点事件
-
焦点事件
-
焦点事件
-
企业风采
-
招标采购
-
焦点事件
-
产品技术
-
焦点事件
-
焦点事件
-
焦点事件
-
焦点事件
-
焦点事件
-
焦点事件
-
焦点事件
